_ŒË‘åŠw ‘åŠw‰@—ŠwŒ¤‹†‰È –Ø‘ºŒšŽŸ˜Y Œ¤‹†Žº

 

Basic Concept of  Dr. K.Kimura Group Research

 

*_ŒËŽs‚ÌŽæÞ

 

* Research

1, Noninvasive breast imaging

Advertisement for human subjects about next-generation scattering field

mammography (2016 fall~) (English version)

 

Advertisement for human subjects about next-generation scattering field

mammography (2016 fall~) (Japanese version)

 

2, Nondestructive subsurface electric current imaging

 

–“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€

 

*High spatial resolution imaging using magnetic field reconstruction based on the mathematics – Integral Geometry -.

 

*Electric current distribution imaging inside rechargeable battery.

 

*High-speed imaging for observing time-dependance phenomeana.

 

*DIGITIZED INFORMATION, INC‚ÌŽæÞ

 

*‘åŠwî•ñƒZƒ“ƒ^[‚ÌŽæÞ

 

3, Nondestructive subsurface imaging for Concrete Infrastructure Sustainability

 

*‘—§Œ¤‹†ŠJ”­–@l‰ÈŠw‹ZpU‹»‹@\‚ÌŽæÞ

 

 

Catalog and paper of magntici field imaging (in Japanese) (pass)

Catalog and paper of magntici field imaging (in English) (pass)

                                                                                                                                     

* Core member of K. Kimura Group

Kenjiro Kimura (PI)

Akari Inagaki

Seijyu Matsuda

Shogo Suzuki

Yoshinobu Yasui

Yoshiki Hidaka

Mai Ishida

Ryuichi Taguchi

Shiori Maezawa

 

*Cooperation company for measurement and analysis system research

Integral Geometry Science inc.: JST & AMED member

Noriaki Kimura

Kyoji Doi

Akane Uoi

Yuki Mima

Miho samejima

 

*Member of cooperation company

Takeshi Inao

Kazuki Hoshijima

 

Ex-member of Kimura research group

Baku Kohden

Hiroyuiki kataoka

Kazuya Nishikawa

Kazunori Nomoto

Keiko Kobata

Akari Masuda

Tomoko Suzuki

Rina Nishioka

Satoshi Seike

Tomoki Sugihara

Ryusuke Ban

Yuichi Higashi

Yusuke Ikeda

Moyuko Hosokawa

 

Œ¤‹†‹ÆÑ

˜_•¶

[1] K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige

"Two-dimensional dopant profiling by scanning capacitance force microscopy"

Applied Surface Science 2003”N 210Šª 93-98.

 

[2] T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige,

"Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method"

Applied Physics Letter 2004”N 25Šª 6287-6289.

 

[3] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

"Scanning capacitance force microscopy imaging of metal-oxide-semiconductor field effect transistors"

Journal of Vacuum Science and Technology B 2005”N 23Šª 1454-1458.

 

[4 ] T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige

gFrequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection methodh

Review of Scientific Instruments 2005”N76Šª 126110(1-3).

 

[5] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

" TWO-DIMENSIONAL CARRIER PROFILING ON OPERATING SIMOSFET BY SCANNING CAPACITANCE MICROSCOPY"

Proceedings of the 8th International Workshop on the Fabrication, Characterization and Modeling of Ultra Shallow Junctions in Semiconductors 2005”N 127.

 

 

[6] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

"Two-dimensional carrier profiling on operating Si-MOSFET by scanning capacitance microscopy"

Journal of Vacuum Science and Technology B 2006”N 24Šª 1371-1376.

 

[7] K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige

"Improving sensitivity in electrostatic force detection utilizing cantilever with tailored resonance modes"

Applied Physics Letter 2007”N 90Šª 053113(1-3).

 

[8] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

"Noncontact-mode scanning capacitance force microscopy towards quantitative tow-dimensional carrier profiling on semiconductor devices"

Applied Physics Letter 2007”N 90Šª 083101(1-3).

 

[9] T. Hiasa, K. Kimura, H. Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K.  Kobayashi, H. Yamada,

gSolution-TiO2 Interface Probed by Frequency-Modulation Atomic Force Microscopyh

Japanese Journal of Applied Physics 2009”N 48Šª, 08JB19 (1-3).

 

[10] K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, Y. Hirata, T. Imai, H. Yamada

gVisualizing water molecule distribution by atomic force microscopy"

Journal of Chemical Physics 2010”N 132Šª, 194705(1-5).

 

[11] T. Hiasa, K. Kimura, H. Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada

gAqueous Solution Structure over ƒ¿-Al2O3(01-12) Probed by Frequency-Modulation Atomic Force Microscopyh@Journal of Physical Chemistry C 2010”N 114Šª, 21423-21426.

 

[12] K. Fujio, K. Kimura, N. Koide, H. Katayama, H. Onishi.

gBlack-Dye-Adsorbed TiO2 (110) Electrodes Studied by Frequency-Modulation Atomic Force Microscopyh Japanese Journal of Applied Physics 2010”N49Šª, 08LB06(1-3).

 

[13] Y. Ando, T. Sugihara, K. Kimura, A. Tsuda.

A Self-Assembled Helical Anthracene Nanofibre Whose P- and M-Isomers Show Unequal Linear Dichroism in a Vortex, Chemical Communications 47 (2011) 11748-11750,

 

[14] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

"Hydration of hydrophilic thiolate monolayers visualized by atomic force microscopy" 

    Phys. Chem. Chem. Phys.  14(2012)8419-8424

 

[15] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi

"Two-dimensional distribution of liquid hydrocarbons facing alkanethiol monolayers visualized by frequency modulation atomic force microscopy" , Colloids Surf. A  396 (2012) 203-207.

     

 [16] Takumi Hiasa, Tomoki Sugihara, Kenjiro Kimura, Hiroshi Onishi

"FM-AFM imaging of a commercial polyethylene film immersed in n-dodecane" 

   J. Phys.; Condens. Matter 24 (2012) 084011 (4 pages).

 

[17] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi

 "Minitips in Frequency-Modulation Atomic Force Microscopy at Solid-Liquid Interface" 

 Jpn. J. Appl. Phys. 51 (2012) 025703 (4 pages).

 

[18]@–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”͏º, ˆî’jŒ’,

g“dŽ¥êÄ\¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“dŽq•”•iŒÌá‰ðÍ‚ւ̉ž—ph, ƒGƒŒƒNƒgƒƒjƒNƒXŽÀ‘•‹Zp 28, 16 (2012).(Invited)

 

[19] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi

gCross-Sectional Structure of Liquid 1-Decanol over Graphiteh

Journal of Physical Chemistry C 116 (2012) 26475–26479

 

[20] Shinichiro Ido, Kenjiro Kimura, Noriaki Oyabu, Kei Kobayashi, Masaru Tsukuda, Kazumi Matushige, Hirofumi Yamada

gBeyond the Helix Pitch: Direct Visualization of Native DNA in Aqueous Solutionh

ACS Nano 2013 7(2) 1817-1822

 

[21] Sugihara Tomoki, ituho Hyashi, Hiroshi Onishi, Kenjiro Kimura, Atsuo Tamura

gSub-nanometer-resolution imaging of peptide nanotubes in water using frequency modulation atomic force microscopyh

Chemical Physics 419(2013)74-77

 

[22] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

gInterfacial Structure of Primary and Tertiary Alcohol Liquids over Hhydrophilic Thiolate Monolayersh

Journal of Physical Chemistry C 117 (2013) 5730-5735

 

[23] Rina Nishioka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

gSpecific Hydration on p-Nitroaniline Crystal Studied by Atomic Force Microscopyh

Journal of Physical Chemistry C 117 (2013) 2939-2943

 

[24] Kei Kobayashi, Noriaki Oyabu, Kenjiro Kimura, Shinichiro Ido, Kazuhiro Suzuki, Takashi Imai,  Katsunori Tagami, Masaru Tsukada, and Hirofumi Yamada

gVisualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopyh

Journal of Chemical Physics 138 (2013) 184704.

 

[25] H. Imada, K. Kimura, H. Onishi.

gWater and 2-Propanol Structured on Calcite (104) Probed by Frequency-Modulation Atomic Force Microscopyh, Langmuir 29 (2013) 10744-10751,

 

[26] H. Imada, K. Kimura, H. Onishi.

gAtom-Resolved AFM Imaging of Calcite Nanoparticles in Waterh, Chemical Physics 419 (2013) 193-195,

 

[27]–Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA‘ååM”͏ºAˆî’jŒ’A–Ø‘ºŒ›–¾

g‚Š´“xŽ¥‹C’ïRŒø‰Ê‘fŽq‚É‚æ‚鎥ê‚ÌŒv‘ª‚Æ“dŽ¥êÄ\¬–@‚ð—p‚¢‚½‚•ª‰ð”\ƒRƒ“ƒNƒŠ[ƒg“à•”“S‹ØŒŸ¸‹Zp‚ÉŠÖ‚·‚錤‹†h, ”ñ”j‰óŒŸ¸Vol.62 (2013) No.10 Oct.527-528. (Invited)

 

[28] ”ü”n—E‹PA‘ååM”͏ºCˆî’jŒ’A–Ø‘ºŒ›–¾A–Ø‘ºŒšŽŸ˜Y

g“d—¬Œo˜H‚Ì”ñ”j‰ó‰f‘œ‰»‘•’u‚ÌŽÀ—p‰»]“dŽq•”•iAƒvƒŠƒ“ƒgŠî”A“d’r‚Ì•s—ljðÍ‚ւ̉ž—p]h‘æ43‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-34(2013).

 

[29] Y. Mima, N. Oyabu, T. Inao, N. Kimura, K. Kimura

"Failure analysis of electric circuit board by high resolution magnetic field microscopy"

Proceedings of IEEE CPMT Symposium Japan (2013) 257-260.

 

[30] –Ø‘º ŒšŽŸ˜YA–ì–{ ˜a½A¬”¨ ŒbŽqA—é–Ø ’qŽqA”ü”n —E‹P, ‘ååM”͏ºCˆî’jŒ’A–Ø‘ºŒ›–¾ g•¨Ž¿ŠE–ʂ̍\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­]h‘æ44‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-17(2014). (ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUÜ)

 

[31] –Ø‘ºŒšŽŸ˜Y, –ì–{˜a½, ”ü”n—E‹P, –Ø‘ºŒ›–¾,

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h

‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU, AP-18(2015).

 

”­–¾

[1] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè 2004-036389 Œ´ŽqŠÔ—ÍŒ°”÷‹¾—pƒJƒ“ƒ`ƒŒƒo[@

 

[2] ŒÃì‹M‘å, –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè 2004-253258, ƒJƒ“ƒ`ƒŒƒo[‚¨‚æ‚Ñ‚»‚̉ž—p@

 

[3] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ‰P“cGŽ¡, ¼d˜a”ü

“ÁŠè2005-056724 •]‰¿—p”¼“±‘̃fƒoƒCƒXA•]‰¿—p”¼“±‘̃fƒoƒCƒX‚̍쐻•û–@A”¼“±‘̃fƒoƒCƒX‚Ì•]‰¿•û–@,.

 

[4] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2005-337824 “dŽqŒ°”÷‹¾§Œä‘•’uA“dŽqŒ°”÷‹¾§Œä•û–@A§ŒäƒvƒƒOƒ‰ƒ€,

§ŒäƒvƒƒOƒ‰ƒ€‚ð‹L˜^‚µ‚½‹L˜^”}‘́A“dŽqŒ°”÷‹¾ƒVƒXƒeƒ€‚¨‚æ‚Ñ“dŽqüÆŽË‘•’u

 

[5] –Ø‘ºŒšŽŸ˜Y, –x“à‹ª, ’†ˆäÍ•¶, ²“¡é•v, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2007-91856 ‚RŽŸŒ³êŽæ“¾‘•’uA•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€AŽ¥‹C—ÍŒ°”÷‹¾Aî•ñ“Ç Žæ‘•’uA“d—¬•ª•z‘ª’è‘•’uA¶‘ÌŽ¥ê‘ª’è‘•’uA”ñ”j‰óŒŸ¸‘•’uA•À‚тɁA‚ŽŽŸŒ³êŽæ“¾‘•’u

 

[6] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2007-208209 “®Œa‘½‹ÉŽqŒ^”z’uƒŒƒ“ƒY‹y‚Ñ‚»‚ê‚ð—p‚¢‚½‰×“d—±ŽqŒõŠwŒn‘•’u

 

[7]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA’†ˆäÍ•¶A²“¡é•vA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü

“ÁŠèF2009-509223@‘ª’è‚É‚æ‚èê‚ðŽæ“¾‚·‚é‘•’u‚¨‚æ‚Ñ•û–@

“Á‹– 4878063†(2011/12/9)“ú–{

“Á‹–‘æ10-1127682†i2012/3/9jŠØ‘

 

[8] ‘ååM”͏º, ‘å“c¹O, –Ø‘ºŒšŽŸ˜Y, ˆäŒËTˆê˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2008-002057‘–¸‘•’u

 

[9] –Ø‘ºŒšŽŸ˜Y, ´‰Æ’qŽj, ‘吼—m

“ÁŠè2009-164676‰×“d—±ŽqüÆŽË‘•’uA•`‰æ‘•’uA•ªÍŒ°”÷‹¾A‰×“d—±ŽqüoŽË‘•’u‚¨‚æ‚щדd—±Žqü—p‚̃Œƒ“ƒY‘•’u

 

[10] ‘ååM”͏ºA–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA—é–؈ꔎA¬—ÑŒ\AŽR“cŒ[•¶

“ÁŠè2009-180137@§Œä‘•’uAŒ´ŽqŠÔ—ÍŒ°”÷‹¾A§Œä•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€

 

[11] ‘ååM”͏ºA–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶

“ÁŠè2009-193606@U“®‘Ì‚ÌŽü”g”ŒŸo‘•’uAŒ´ŽqŠÔ—ÍŒ°”÷‹¾AU“®‘Ì‚ÌŽü”g”ŒŸo•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€

 

[12]–Ø‘ºŒšŽŸ˜YA“úóIA‘吼—mA‘ååM”͏º

“ÁŠè2009-297601@ƒJƒ“ƒ`ƒŒƒo[Œ^ƒZƒ“ƒTCƒoƒCƒIƒZƒ“ƒT‚¨‚æ‚уvƒ[ƒuŒ°”÷‹¾

 

[13]–Ø‘ºŒšŽŸ˜Y

“ÁŠè2010-44218@ƒ|ƒeƒ“ƒVƒƒƒ‹Žæ“¾‘•’uAŽ¥êŒ°”÷‹¾AŒŸ¸‘•’u‚¨‚æ‚у|ƒeƒ“ƒVƒƒƒ‹Žæ“¾•û–@

 

[14] ¬”¨ŒbŽq, –Ø‘ºŒšŽŸ˜Y

“ÁŠè:2010-214453  Ž¥êƒZƒ“ƒT‹y‚ÑŽ¥êƒZƒ“ƒT‚̐»‘¢•û–@

 

[15] –Ø‘ºŒšŽŸ˜Y

“ÁŠèF2010-261016 Ž¥ê•ª•zŽæ“¾‘•’u

 

[16] K.Kimura, K.Kobayashi, H.Yamada, K.Matsushige

United States Patent: US 7,829,863 B2, Nov.9,2010

ELECTRON BEAM IRRADIATION DEVICE

 

‘¼14Œ

 

‰ðàC’˜‘“™

[1]K. Kimura, T. Horiuchi, N. Oyabu, K. Kobayashi, Y. Hirata, M. Abe, K. Matsushige, S. Morita, H. Yamada,

gLocal Solvation Force Measurement by Frequency Modulation Atomic Froce Microscopyh

Ext.Abstr.10h Int.Conf.Non-Contact Atomic Force Microscopy, 2007”NAp.83.

 

[2] K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, and H. Yamada

"Molecular-scale Hydration Structures Investigated by Frequency ModulationAtomic Force Microscopy"

Ext. Abstr. 11th Int. Conf. Non-contact Atomic Force Microscopy, 2008, p. 62.

 

[3] Collaboration with Integral Geometry Instruments, LLC

g“dŽ¥êÄ\¬‘–¸Œ^ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾h, ‰ÈŠwE•ªÍ‹@Ší‘—— p. 711 (2012).

 

[4] –Ø‘ºŒšŽŸ˜Y

g‚±‚±‚Ü‚Å—ˆ‚½Œ´ŽqŠÔ—ÍŒ°”÷‹¾@ƒCƒIƒ“‰t‘Ì’†‚Ōő̕¨Ž¿•\–Ê‚ÌŒ´Žq‚ðŠÏŽ@h

ŒŽŠ§‰»Šw 68Šª p.63(2012)

 

[5] “úóI, ¼‰ª—˜“Þ, –Ø‘ºŒšŽŸ˜Y, ‘吼—m

gFM-AFM‚ÅŠÏ‚éŠE–ʉt‘̍\‘¢‚̉»Šwh@

•\–ʉȊwiŒ¤‹†Ð‰îj 34 (2013) 352-357,

 

[6] –Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŒ¤‹†h

‚­‚³‚¾‚æ‚è25† 12ŒŽ25“ú

 

[7]@–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‹|ˆäF‰À, XN¬, ¯“‡ˆê‹P, ’†“c¬K, “yˆä‹±“ñ

 "”ñ”j‰óƒ‚ƒjƒ^ƒŠƒ“ƒO‚Ì‚½‚ß‚Ì3ŽŸŒ³ƒf[ƒ^‰ðÍ‹Zp‚¨‚æ‚Ñ‘•’u‹Zp", ‹‘å\‘¢•¨ƒwƒ‹ƒXƒ‚ƒjƒ^ƒŠƒ“ƒO, NTS (2015).

 

[8] ––Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA–Ø‘ºŒ›–¾

g“d—¬Œo˜H‰ÂŽ‹‰»‹Zp\’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—p\h“d‹CŠw‰ïŽ@135Šª7†@i2015j437-440 .(Invited)

 

[9]”ü”n—E‹PA–Ø‘ºŒ›–¾A–Ø‘ºŒšŽŸ˜Y

gƒTƒuƒT[ƒtƒFƒXŽ¥‹CƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ÌŠJ”­‚Æ”¼“±‘̃`ƒbƒv“à•”‚Ì“d—¬Œo˜H‰f‘œ‰»‚ւ̉ž—ph

ƒPƒ~ƒJƒ‹ƒGƒ“ƒWƒjƒ„ƒŠƒ“ƒO@60Šª10†@772-778i2015j

 

[10] –Ø‘ºŒšŽŸ˜Y

 gŒ¤‹†Žº–K–â@_ŒË‘åŠw‘åŠw‰@—ŠwŒ¤‹†‰È–Ø‘ºŒ¤‹†Žºh

ƒGƒŒƒNƒgƒƒjƒNƒXŽÀ‘•Šw‰ïŽVol.18@No.7@P511@ i2015”N11ŒŽ1“ú”­sj

 

[11] Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@Œ¤‹†¬‰ÊÅ“K“WŠJŽx‰‡ƒvƒƒOƒ‰ƒ€@

gŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u FOCUS001‚ð¤•i‰»@_ŒË‘åŠw”­ƒxƒ“ƒ`ƒƒ[Šé‹Æ Integral Geometry InstrumentsŽÐ‚ð‘n—§h

A-STEP¬‰ÊW@2014@P57 i2014”N9ŒŽj

 

[12] Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@Œ¤‹†¬‰ÊÅ“K“WŠJŽx‰‡ƒvƒƒOƒ‰ƒ€@

g‘åŠw”­ƒxƒ“ƒ`ƒƒ[Šé‹ÆuIntegral Geometry Science ŽÐv‚ðÝ—§h

A-STEP¬‰ÊW@2016@P30i2016”N1ŒŽ‰ü’ùj

 

[13]–Ø‘ºŒšŽŸ˜Y

g“d’r—p\‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”­h

JSTæ’[Œv‘ª—v——2016@Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@æ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”­ƒvƒƒOƒ‰ƒ€@P24@i2016”N4ŒŽj

 

 

ŽóÜ

[1] •½¬16”N9ŒŽ1“ú

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾iSCFM)‚É‚æ‚锼“±‘Ì•sƒ•¨”Z“x•]‰¿h

‰ž—p•¨—Šw‰ï u‰‰§—ãÜ

 

[2] •½¬16”N11ŒŽ20“ú

g‚QŽŸŒ³“dŽqƒr[ƒ€ƒŠƒ\ƒOƒ‰ƒtƒBh

ŠÖ¼ƒeƒNƒmƒAƒCƒfƒBƒAƒRƒ“ƒeƒXƒg04@ ‘åŠw‚Ì•”@—DGÜ

 

[3] •½¬17”N6ŒŽ29“ú

g‘–¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚é“®ì’†MOSFET‚É‚¨‚¯‚é‚QŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

‹ž“s‘åŠwƒiƒmHŠw‚“™Œ¤‹†‰@@‘æ‚R‰ñŽáŽèŒ¤‹†ŽÒ”­•\‰ï@—DGÜ

 

[4] •½¬17”N11ŒŽ23“ú

g‚QŽŸŒ³”z—ñ‚³‚ꂽ“dŽqüÆŽËŒ¹‚ð—p‚¢‚½“dŽqŒ°”÷‹¾‚¨‚æ‚Ñ•„†‰»“dŽqüƒAƒŒƒCÆŽË•ûŽ®‚ð—p‚¢‚½‚Š´“x‚QŽŸ“dŽqŒŸo–@h

ŠÖ¼ƒeƒNƒmƒAƒCƒfƒBƒAƒRƒ“ƒeƒXƒg05@ ‘åŠw‚Ì•” €ƒOƒ‰ƒ“ƒvƒŠ@ƒnƒCƒeƒN•”–å

 

[5] •½¬18”N5ŒŽ19“ú

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚ÌŠJ”­‚ƃiƒm“dŽqƒfƒoƒCƒX‰ðÍ‚ւ̉ž—ph

ƒiƒmŠw‰ï ‘æ‚S‰ñ‘å‰ï Best Young Presenter Award

 

[6] •½¬18”N6ŒŽ23“ú

g“ÁŽê‹¤U\‘¢‚ð—p‚¢‚½’´”÷ŽãÃ“d‹C—ÍŒŸoƒZƒ“ƒT[‚ÌŠJ”­h

‹ž“s‘åŠwVBL‘æ‚P‚O‰ñŽáŽèŒ¤‹†•¬@—DGÜ

 

[7] •½¬19”N3ŒŽ5“ú

gNoncontact-mode scanning capacitance force microscopy towards quantitative two-dimensional carrier profiling on semiconductor devicesh

Selected letter for Virtual Journal of Nanoscale Science & Technology.

 

[8] •½¬19”N6ŒŽ23“ú

g—n”}˜a\‘¢‰ÂŽ‹‰»‘•’uh

ƒeƒNƒmˆ¤ ‹ž“s‘åŠwVBLŽ{Ý’·Ü

 

[9] •½¬20”N11ŒŽ13“ú

g‘–¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚éMOSFET“®ìŽž‚Ì•sƒ•¨•ª•zŒv‘ªh

“ú–{•\–ʉȊw‰ï@‹ZpÜ

 

[10] •½¬21”N

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚̍\‘¢‰ðÍh

•ªŽq‰ÈŠw“¢˜_‰ï —DGu‰‰Ü

 

[11] •½¬26”N

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

‘æˆê‰ñ ’†’ҏÜ

 

[12] •½¬26”N6ŒŽ4“ú

g•¨Ž¿ŠE–ʂ̍\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

2014 JPCA ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUÜ

 

 

ƒƒfƒBƒA”­•\

2010”N11ŒŽ23“ú@ƒeƒNƒmˆ¤2010@‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ@

–Ø‘ºŒ¤‹†Žº‚̏¬”¨ŒbŽq‚ª‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ‚ðŽóÜ

http://www.kyoto-u.ac.jp/static/ja/news_data/h/h1/news7/2010/101123_1.htm

 

2011”N9ŒŽ21“ú@‰»ŠwH‹Æ“ú•ñV•·ˆê–Ê

g“dŽq•”•i‚ð”ñ”j‰óŒŸ¸@Ž¥ê•ª•z‚𑪒肵‰æ‘œ‚É-

 

2011”N9ŒŽ22“ú@ƒ}ƒCƒiƒrƒjƒ…[ƒX

g‘º“c»ìŠA_ŒË‘å‚Æ“dŽq•”•i‚̌̏á‰ÓŠ‚ð“Á’è‰Â”\‚È”ñ”j‰óŒŸ¸‘•’u‚ðŠJ”­h

 

2011”N9ŒŽ22“ú@“úŒoƒvƒŒƒXƒŠƒŠ[ƒX

g‘º“c»ìŠA_ŒË‘å‚Æ“dŽq•”•i‚̌̏á‰ÓŠ‚ð“Á’è‰Â”\‚È”ñ”j‰óŒŸ¸‘•’u‚ðŠJ”­h

 

2012”N6ŒŽ28“ú@ƒ}ƒCƒiƒrƒjƒ…[ƒX

g“d‹C‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’uh

http://news.mynavi.jp/news/2012/06/28/043/index.html

 

2012”N6ŒŽ28“ú@DIGINFO TV

g“d‹C‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’uh

http://jp.diginfo.tv/v/12-0124-n-jp.php

 

2012”N6ŒŽ28“ú@DIGINFO TV(ENGLISH)

gMaking Electric Currents Visibleh

http://www.diginfo.tv/v/12-0124-n-en.php

 

2012”N9ŒŽ7“ú@@ELECTRONIC JOURNAL

_ŒË‘åA“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ðÐ‰î

http://www.electronicjournal.co.jp/news/2012/09/07.html

 

2012”N11ŒŽ30“ú _ŒËŽs@(–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜A)

_ŒËˆã—ÃŽY‹Æ“sŽs‚É‚¨‚¢‚āAIntegral Geometry Instruments‡“¯‰ïŽÐ‚̐io

http://www.city.kobe.lg.jp/information/press/2012/11/20121130141001.html

http://www.kobe-lsc.jp/news/index.html

 

2012”N12ŒŽ12“ú ‰»ŠwH‹Æ“ú•ñ@(–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜A)

_ŒË‘å”­‚Ì‚h‚f‚h “d—¬Œo˜H‚ð‰ÂŽ‹‰»

http://www.kagakukogyonippo.com/headline/2012/12/12-9364.html

 

2013”N1ŒŽ7“ú “ú–{ŒoÏV•·11–ʁi–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

ŒÌá‰ÓŠ@Ž¥ê‚Å’T’m@ƒ\ƒtƒgƒEƒFƒAŠJ”­IGI-

 

2013”N1ŒŽ7“ú “ú–{ŒoÏV•·@“dŽq”Łi–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

ŒÌá‰ÓŠ@Ž¥ê‚Å’T’m@ƒ\ƒtƒgƒEƒFƒAŠJ”­IGI-

 http://www.nikkei.com/article/DGXNZO50300920V00C13A1TJE000/

 

2013”N4ŒŽ3“ú JST  A-STEP ƒz[ƒ€ƒy[ƒW Œ¤‹†ŠJ”­¬‰Ê —“

gJSTŒ¤‹†¬‰Ê“WŠJŽ–‹Æ‚ÌŒ¤‹†ŠJ”­‚É‚¨‚¢‚ÄŽ¥‹CƒCƒ[ƒWƒ“ƒO–@‚É‚æ‚é“d—¬Œo˜H‰f‘œ‰»‘•’u‚ª»•i‰»‚³‚ê‚Ü‚µ‚½Bh

http://www.jst.go.jp/a-step/seika/

 

2014”N02ŒŽ27“ú “Œ—mŒoÏ@ò’JÂ ’˜g¢ŠE‚ª‹Á‚­ƒjƒbƒ|ƒ“‚̈ã—ÃŽY‹Æ—́h i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

Integral Geometry InstrumentsŽÐ‚Æ‚Ì‹¤“¯Œ¤‹†‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

 

2014”N4ŒŽ22“ú “úŠ§H‹Æ@

g‚•ª‰ð”\‚Å”ñ”j‰óŒŸ¸‰æ‘œh

“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

http://j-net21.smrj.go.jp/watch/news_tyus/entry/20140424-02.html

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2014”N4ŒŽ29“ú “úŠ§H‹Æ ˆê–Ê

g‚RŽŸŒ³ŒŸ¸ƒ\ƒtƒgƒEƒGƒAƒVƒXƒeƒ€ŠJ”­h

“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

http://www.nikkan.co.jp/news/nkx0920140429aaav.html

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2015”N2ŒŽ1“ú ‘åŠw•]‰¿‹@\

_ŒË‘åŠw‚Ì•]‰¿u—D‚ꂽ“_v‚T“_‚Ì’†‚ŁAŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ª‘I’肳‚ê‚Ü‚µ‚½B

uŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÉŠÖ‚·‚錤‹†¬‰Ê‚É‚æ‚èA‰¢•ÄA“ú–{‚É‚¨‚¢‚Ä“Á‹–‚ª¬—§‚µ‚Ä‚¨‚èA“¯¬‰Ê‚ÉŠÖ‚í‚é“Á‹–oŠè‚ð’Ê‚¶‚ă\ƒtƒgƒEƒFƒAƒpƒbƒP[ƒW‚̔̔„‚ÉŒq‚ª‚Á‚Ä‚¢‚éBv

http://www.kobe-u.ac.jp/info/project/evaluation/attestation.html

 

2015”N3ŒŽ20“ú _ŒË‘åŠwƒz[ƒ€ƒy[ƒWu_‘ål‚Ì–{vƒR[ƒi[‚ÉŒfÚB

‹‘å\‘¢•¨ƒwƒ‹ƒXƒ‚ƒjƒ^ƒŠƒ“ƒO\—ò‰»‚̃ƒJƒjƒYƒ€‚©‚çŠÄŽ‹‹Zp‚Æ‚»‚ÌŽÀÛ‚Ü‚Å

http://www.kobe-u.ac.jp/info/public-relations/book/1503_20_1.html

_‘ål‚Ì–{

http://www.kobe-u.ac.jp/info/public-relations/book/index.html

 

2015”N3ŒŽ30“ú _ŒËˆã—ÃŽY‹Æ“sŽs‚̃z[ƒ€ƒy[ƒW

_ŒË‘åŠw”­ƒxƒ“ƒ`ƒƒ[Šé‹Æ‚̏Љî

http://www.kobe-lsc.jp/interview/igi

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2015”N4ŒŽ10“ú yî•ñ’ñ‹ŸF‚µ‚Ü‚à‚悤z‚R‚X‚P†i‚Q‚O‚P‚T”N‚SŒŽ‚P‚O“új

 gioŠé‹ÆƒCƒ“ƒ^ƒrƒ…[‚ðXV‚µ‚Ü‚µ‚½iIntegral Geometry Instruments, LLCj

@@áŒv‘ª‚⌟¸A‰æ‘œˆ—‚Ì•ª–ì‚É‚¨‚¢‚āA¢ŠEÅæ’[‚Ì‹Zp‚ð’ñ‹Ÿ‚µ‚Ä‚¢‚«‚Ü‚·âh

“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2015”N4ŒŽ _ŒË‘åŠw—ŠwŒ¤‹†‰È Œ¤‹†ƒgƒsƒbƒNƒXÐ‰î

ƒTƒuƒT[ƒtƒFƒX‰f‘œ‰»–@‚ÉŠÖ‚·‚錤‹†

http://www.sci.kobe-u.ac.jp/topics/2014chem2.htm

 

2015”N7ŒŽ16“ú XV

w“§Ž‹‚̉Ȋwx

 `Œ©‚¦‚È‚¢‚à‚Ì‚ðŒ©‚é‹Zp‚ªA¢ŠE‚ðŽç‚é`

http://douhiro.com/video/?cd_video=98

 

2015”N‚XŒŽ‚P‚T“ú ‚R–Ê

—nÚƒjƒ…[ƒXiŽY•ño”ÅŠ”Ž®‰ïŽÐj2015”N9ŒŽ15“ú@‘æ3115†

 

2015”N‚XŒŽ‚Q‚O“ú ‚T–Ê

ŒŸ¸‹@Šíƒjƒ…[ƒXiŽY•ño”ÅŠ”Ž®‰ïŽÐj2015”N9ŒŽ20“ú@‘æ1314†

 

2015”N10ŒŽ29“ú@AMEDƒvƒŒƒXƒŠƒŠ[ƒX

“ú–{‚̈ã—ÂɊvV‚ð‚à‚½‚ç‚·Œv‘ªE•ªÍ‹Zp‚ÌŠJ”­,

•½¬27”N“xuæ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”­ƒvƒƒOƒ‰ƒ€v‚ɍ̑ð

ŠÖ˜AHPFhttp://www.amed.go.jp/news/press.html

http://www.hosp.kobe-u.ac.jp/topic/2015/amed_151106.html

http://www.kobe-u.ac.jp/NEWS/research/2015_10_30_01.html

http://www.kobe-u.ac.jp/kuirc/

http://www.sci.kobe-u.ac.jp/news/2015/151029.htm

 

2015”N11ŒŽ05“ú@“úŠ§H‹Æ

gƒI[ƒ‹ƒWƒƒƒpƒ“‚ňã—Ë@ŠíŠJ”­|‚`‚l‚d‚cA_ŒË‘å‚Ì“û‚ª‚ñf’f‚È‚Ç‚Uƒe[ƒ}‚ðŽx‰‡Ì‘ðh

http://www.nikkan.co.jp/news/nkx1020151105ccad.html

 

 

2015”N11ŒŽ13“ú

‘æ 5 ‰ñ CSJ ‰»ŠwƒtƒFƒXƒ^ 2015@‰ï@ŠúF2015”N10ŒŽ13“ú(‰Î)`15“ú(–Ø)

P6-015 ”ü —E‹Pu“d‚âƒCƒIƒ“‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’u‚ÌŠJ”­v—DGƒ|ƒXƒ^[”­•\Ü

http://www1.csj.jp/festa/2015/document/poster_award.pdf

 

 

2015”N11ŒŽ23“ú@ƒeƒNƒmˆ¤2015@‘åŠw‚Ì•” €ƒOƒ‰ƒ“ƒvƒŠ@

–Ø‘ºŒ¤‹†Žº‚Ì”ü —E‹PŒN‚ª‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ‚ðŽóÜ

http://www.kobe-u.ac.jp/NEWS/research/2015_12_01_02.html

 

2016”N3ŒŽ15“ú@_ŒË‘åŠw@•½¬‚Q‚V”N“xŠw¶•\²

–Ø‘ºŒ¤‹†Žº‚Ì”ü”n—E‹PŒN‚ªŠw’·‚æ‚è•\²‚³‚ꂽ

http://www.chem.sci.kobe-u.ac.jp/

http://www.sci.kobe-u.ac.jp/news/2015/160324.htm

 

2016”N3ŒŽ30“ú@JSTƒTƒCƒGƒ“ƒXƒjƒ…[ƒX‚ÉŒfÚ

uŽ–ŒÌ‚𖢑R‚É–h‚®I ŠJ”­i‚ÞƒCƒ“ƒtƒ‰ŒŸ¸‹Zpi2016”N3ŒŽ30“ú”zMjv

https://sciencechannel.jst.go.jp/M160001/detail/M150001021.html

ŠÖ˜AHPFhttp://www.kobe-u.ac.jp/NEWS/research/2016_04_01_02.html

http://www.chem.sci.kobe-u.ac.jp/

http://www.sci.kobe-u.ac.jp/news/2015/160330.htm

 

Šw‰ï”­•\i–Ø‘º“o’d•ªj

[1]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\A–x“àrŽõCŽR“cŒ[•¶A¼d˜a”üA™‘º”Ž”V

gƒPƒ‹ƒrƒ“ƒvƒ[ƒuŒ°”÷‹¾‚É‚æ‚é•\–Ê“dˆÊ/—e—Ê“¯Žž‘ª’èh

HŠú‘æ62‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAˆ¤’mH‹Æ‘åŠw 2001”N9ŒŽ

 

[2]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”üA‰«–ì—Tä

g—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹­—U“d‘̍ޗ¿•]‰¿h

t‹G‘æ49‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“ŒŠC‘åŠw 2002”N3ŒŽ

 

[3] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

" Scanning Capacitance Force Microscopy"

The 5th International Conference on Noncontact Atomic Force Microscopy, Montreal, 2002”N8ŒŽ

 

[4]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\A–x“àrŽõAŽR“cŒ[•¶A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-pnÚ‡‚Ì•]‰¿h

HŠú‘æ63‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAVŠƒ‘åŠw 2002”N9ŒŽ

 

[5]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•zŒv‘ªh

t‹G‘æ50‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA_“ސì‘åŠw 2003”N3ŒŽ

 

[6] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gMetal-Oxide-Semiconductor Field Effect Transistors Investigated by Scanning Capacitance Force Microscopy g

12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Eindhoven,the Netherlands, 2003”N7ŒŽ

 

[7]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•z•]‰¿h

HŠú‘æ64‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC•Ÿ‰ª‘åŠw 2003”N8ŒŽ

 

[8]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü

g“ÁŽê‹¤U\‘¢‚ð—L‚·‚éƒJƒ“ƒ`ƒŒƒo[‚ð—p‚¢‚½Ã“d‹C—ÍŒŸo‚̍‚Š´“x‰»h

HŠú‘æ64‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC•Ÿ‰ª‘åŠw 2003”N8ŒŽ

 

[9] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gScanning Capacitance Force Microscopy imaging of Metal –Oxide-Semiconductor Field Effect Transistorsh

AVS 50th International Symposium & Exhibition, Baltimore, 2003”N11ŒŽ

 

[10] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gScanning Capacitance Force Microscopy imaging of Metal-Oxide-Semiconductor Field Effect Transistorsh

7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, 2003”N11ŒŽ

 

[11]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾(SCFM)‚É‚æ‚锼“±‘Ì•sƒ•¨”Z“x•]‰¿h

t‹G‘æ51‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“Œ‹žH‰È‘åŠw 2004”N3ŒŽ

 

[12]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•z•]‰¿h

HŠú‘æ65‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC“Œ–kŠw‰@‘åŠw 2004”N9ŒŽ

 

[13] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

gDesigning Resonance Modes of AFM Cantilevers and its Application for Probing of Electric Properties and Operation with Ultrasmall Oscillation Amplitudeh

2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ

 

[14] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gTwo-dimensional Carrier Profiling on Operating Si-MOSFET by Scanning Capacitance Force Microscopyh

2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ

 

[15]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—͉ƌ°”÷‹¾‹y‚Ñ‘–¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚é“®ì’†Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

t‹G‘æ52‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAé‹Ê‘åŠw 2005”N3ŒŽ

 

[16] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gTwo-dimensional Carrier Profiling on Operating Si-MOSFET by Scanning Capacitance Force Microscopyh

The 8th International Workshop on the Fabrication, Characterization and Modeling of Ultra Shallow Junctions in Semiconductors, Florida, USA, 2005”N6ŒŽ

 

[17] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

gDesigning Resonance Modes of AFM Cantilevers for the Versatile Applications to High-Sensitive Force Detectorsh

13th International Colloquium on Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ

 

[18] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gTwo-dimensional Carrier Profiling on Operating Si-MOSFET by Scanning Capacitance Force Microscopy and SCMh

13th International Colloquium on Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ

 

[19]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é“®ì’†Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

HŠú‘æ66‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“¿“‡‘åŠw 2005”N9ŒŽ

 

[20]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶AŽ›”ö—C¶A¼d˜a”ü

g‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾‚É‚æ‚é—L‹@ELƒfƒoƒCƒXŠE–Ê‚É‚¨‚¯‚é2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

HŠú‘æ66‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“¿“‡‘åŠw 2005”N9ŒŽ

 

[21] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

gDesigning Resonance Modes of AFM Cantilevers and its Application for Probing of Electric Properties and Operation with Ultrasmall Oscillation Amplitudeh

2005 International Symposium on Nonlinear Theory and its Applications, Bruges, Belgium, 2005”N10ŒŽ

 

[22] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

g2D carrier profiling on operating Si-MOSFET by SCFM and SCMh

9th International Conference on Non-Contact Atomic Force Microscopy, 2006”N7ŒŽ

 

[23]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ª

HŠú‘æ67‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA—§–½ŠÙ‘åŠwA2006”N9ŒŽ

 

[24] K. Kimura, T. Horiuchi, K. Kobayashi, K. Matsushige and H.Yamada

gHydration Force Measurements by Frequency Modulation Dynamic Force Microscopyh

14th International Colloquium on Scanning Probe Microscopy, 2006”N12ŒŽ

 

 [25] –Ø‘ºŒšŽŸ˜YA–x“à‹ªA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ªh

t‹G‘æ53‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAÂŽRŠw‰@‘åŠw 2007”N3ŒŽ

 

[26]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”͏ºA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ªh

“ú–{Œ°”÷‹¾Šw‰ï63‰ñŠwpu‰‰‰ïAŽéëƒƒbƒZVŠƒƒRƒ“ƒxƒ“ƒVƒ‡ƒ“ƒZƒ“ƒ^[ 2007”N5ŒŽ

 

[27]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”͏ºA¬—ÑŒ\A•½˜a–FŽ÷A¼d˜a”üCŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ…˜a\‘¢Œv‘ªh

HŠú‘æ68‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïiƒvƒ[ƒuŒ°”÷‹¾6.6j–kŠC“¹H‘å 2007”N9ŒŽ

 

[28]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”͏ºA¬—ÑŒ\A•½˜a–FŽ÷A¼d˜a”üAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ…˜a\‘¢Œv‘ªh

HŠú‘æ68‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïi“Á’èƒe[ƒ}B:¶‘Ì•ªŽqŒv‘ªEƒoƒCƒIƒeƒNƒmƒƒW[10.1j–kŠC“¹H‘å 2007”N9ŒŽ

 

[29] K. Kimura, T. Horiuchi, N.Oyabu, K. Kobayashi, Y.Hirata, M.Abe, K. Matsushige, S. Morita and H.Yamada

gLocal Solvation Force Measurements by Frequenscy Modulation Atomic Force Microscopyh

The 10th International NC-AFM Conference, Antalya, 2007”N9ŒŽ

 

[30]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”͏ºC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢‚ÌŠÏŽ@h

ƒ\ƒtƒgƒiƒmƒeƒNƒmƒƒW[Œ¤‹†•”‰ï@‘æ3‰ñŒ¤‹†‰ï@“Œ‹žH‘å 2008”N1ŒŽ

 

[31] –Ø‘ºŒšŽŸ˜Y, ˆäŒËTˆê˜Y, ‘ååM”͏º, ¬—ÑŒ\, ¡ˆä—²Žu, “cãŸ‹K, ’Ë“c·, ¼d˜a”ü, ŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢Œv‘ªh

t‹G‘æ54‰ñ‰ž—p•¨—Šw‰ïŠÖŒW˜A‡u‰‰‰ï,@ “ú‘å, 2008”N3ŒŽ

 

[32]–Ø‘ºŒ’ŽŸ˜YAˆäŒËTˆê˜YA‘ååM”͏ºC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üAŽR“cŒ[•¶C‘吼—m

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢‚ÌŠÏŽ@h

“Á’è—̈æu‚ŽŸ•ªŽq‰ÈŠwv‘æ3‰ñ‡“¯”ljï‹cAVŠƒ 2008”N5ŒŽ

 

[33]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”͏ºC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üA‘吼—mAŽR“cŒ[•¶

gƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鐶‘̍‚•ªŽq‚¨‚æ‚ÑŽü•Ó—n”}˜a‚̍\‘¢‰ðÍh

_ŒË‘åŠw—ŠwŒ¤‹†‰È¶•¨ŠwêUŠwpu‰‰‰ïA_ŒË‘åŠw 2008”N7ŒŽ(Invited)

 

[34]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”͏ºC¬—ÑŒ\A¡ˆä—²ŽuA‘吼—mAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚̍\‘¢‰ðÍh

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwŠÖŒW˜A‡u‰‰‰ïC’†•”‘åŠw 2008”N9ŒŽ

 

[35] K. Kimura, S.Ido, N.Oyabu, K.Kobayashi, T.Imai, and H.Yamada

gMolecule-Scale Hydration Structures Investigated by Frequency Modulation Atomic Force Microscopyh

11th International Conference on Non-Contact Atomic Force Microscopy (NCAFM2008), Madrid 2008”N9ŒŽ

 

[36] K. Kimura, S.Ido, N.Oyabu, K.Kobayashi, T.Imai, and H.Yamada

gMolecule-Scale Hydration Structures Investigated by Frequency modulation atomic force microscopyh

2008 MRS Fall Meeting, Boston 2008”N12ŒŽ

 

[37] K. Kimura, T.Hiasa, H.Onishi

gDevelopment of Scanning Probe Tomography and its Application for Visualizing Internal Nanomagnetic Structuresh

2008 MRS Fall Meeting, Boson 2008”N12ŒŽ

 

[38] K. Kimura, T.Hiasa, H.Onishi

gScanning Probe Tomography Developed for Visualising Buried Magnetic Structuresh

2008 MRS Fall Meeting, Boston 2008”N12ŒŽ

 

[39] K. Kimura, S.Kataoka, T.Hiasa, A.Sasahara, H.Onishi, N.Oyabu, M.Ohta, K.Watanabe, R.Kokawa, K.Kobayashi and H.Yamada

FM-AFM Study of Buried Metal Oxide Interfaces

The Sixth International Workshop on Oxide Surface (IWOX-E) 2009”N1ŒŽ

 

[40]–Ø‘ºŒšŽŸ˜Y

g–„‚à‚ꂽ•¨Ž¿ŠE–Ê‚É‚¨‚¯‚é\‘¢‰ðÍ‚Ì‚½‚߂̐V‹K‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾–@‚ÌŠJ‘ñh(invited)

ˆ¢“ìH‹Æ‚“™ê–åŠwZ‘æ7‰ñŠñ•uÀƒZƒ~ƒi[Aˆ¢“ì2009”N2ŒŽ

 

[41] K. Kimura, T.Hiasa, H.Onishi, M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayashi, T.Imai and H.Yamada

gLocal Hydration Structures Investigated by Frequency Modulation Atomic Force Microscopyh (invited)

“ñ‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi[ Reent Progress in Spectroscopy and Theory in Chemistry, Kolkata,Rep.of  India 2009”N3ŒŽ

 

[42]–Ø‘ºŒšŽŸ˜YA “úóIAˆäŒËTˆê˜YA‘ååM”͏ºC¬—ÑŒ\A¡ˆä—²ŽuA‘吼—mAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚̍\‘¢‰ðÍh

•ªŽq‰ÈŠw“¢˜_‰ï2009A–¼ŒÃ‰®‘åŠw 2009”N9ŒŽ

 

[43] K. Kimura, T.Hiasa, H.Onishi, T.Imai, S.Ido, N.Oyabu, K.Kobayashi, H.Yamada

gHydration Structures Studied by Frequency Modulation Atomic Force Microscopy and 3D Referential Interaction Site Model Theoryh

The 7th International Workshop on Oxide Surfaces (IWOX-E) 2010, VŠƒ 2010”N‚PŒŽ

 

[44]–Ø‘ºŒšŽŸ˜YA“úóIAˆäŒËTˆê˜YA‘ååM”͏ºC¬—ÑŒ\A¡ˆä—²ŽuAŽR“cŒ[•¶A‘吼—m

gAFM‚Å’T‚é‹à‘®Ž_‰»•¨ŠE–Ê‚Ì—n‰t\‘¢hiˆË—Šu‰‰j

“ú–{‰»Šw‰ï‘æ90t‹G”N‰ï“Á•ÊŠé‰æuŒÅ‰tŠE–Ê‚Ì—n‰t\‘¢v‹ß‹E‘åŠw 2010”N3ŒŽ

 

 [45]–Ø‘ºŒšŽŸ˜Y

gŒ©‚¦‚È‚¢‚à‚Ì‚ðf‚éFŒ°”÷‹¾‚ÌŒ´—h

‚‘å˜AŒg“Á•Êu‹`A_ŒË‘åŠw 2010”N8ŒŽ

 

[46]–Ø‘ºŒšŽŸ˜YA‹{‰ºˆ¤ŽqA–Ø‘ºŒ›–¾

g“dŽ¥ê‹t‰ðÍ–@‚ÌŠJ”­‚ÆŽ¥êŒ°”÷‹¾‚ւ̉ž—ph

‘æ71‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC’·è‘åŠw 2010”N9ŒŽ

 

 [47] K. Kimura, T.Hiasa, H.Onishi, M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayahi, T.Imai, H.Yamada

gLiquid Structure on Solid Surface Investigated by Atomic Force Microscopyh (invited)

“úˆó“ñ‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi[A_ŒË 2010”N9ŒŽ

 

[48]–Ø‘ºŒšŽŸ˜Y

gŽŸ¢‘㔼“±‘̃fƒoƒCƒXŒŸ¸‹ZpA»‘¢‹Zp‚ÉŠÖ‚·‚錤‹†hiˆË—Šu‰‰j

Šé‹Æ‚ł̍u‰‰ 2010”N10ŒŽ

 

[49]K.kimura

gMaskless Electron Beam Stepperh

‘ÛƒiƒmƒeƒNƒmƒƒW[‘‡“WA“Œ‹ž 2011”N2ŒŽ

 

[50]–Ø‘ºŒšŽŸ˜Y

g“dŽq•”•iEƒvƒŠƒ“ƒgŠî”‚̔ñ”j‰óŒŸ¸‘•’uh

ƒCƒmƒx[ƒVƒ‡ƒ“ƒWƒƒƒpƒ“2011‘åŠwŒ©–{ŽsA“Œ‹ž 2011”N9ŒŽ

 

[51]@–Ø‘ºŒšŽŸ˜Y

gŽŸ¢‘㎥‹CƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h (Invited)

Šé‹Æ‚ł̍u‰‰ 2011”N11ŒŽ14“ú

 

[52]–Ø‘ºŒšŽŸ˜Y

gŽŸ¢‘㎥‹CƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­‚Æ“dŽq•”•i‚Ì”ñ”j‰óŒŸ¸‚ւ̉ž—ph

semicon japan ŽŸ¢‘ã‹ZpƒpƒrƒŠƒIƒ“o“WŽÒƒvƒŒƒ[ƒ“ƒe[ƒVƒ‡ƒ“ 2011”N12ŒŽ9“ú

 

[53]–Ø‘ºŒšŽŸ˜Y

 g•¨Ž¿“à•”‚ðf‚錰”÷‹¾–@‚ÌŠJ”­h (Invited)

‰ÈŒ¤”ï“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ6‰ñ‡“¯”ljï‹c 2011”N12ŒŽ10“ú

 

[54]–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”͏º, ˆî’jŒ’

g“dŽ¥êÄ\¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“dŽq•”•iŒÌá‰ðÍ‚ւ̉ž—ph (Invited)

‚‰·ƒGƒŒƒNƒgƒƒjƒNƒXŒ¤‹†‰ï, _“ސ쌧 2012”N3ŒŽ‚Q‚P“ú

 

[55]–Ø‘ºŒšŽŸ˜Y

gŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚̍‚«”\‰»‚Æ“dŽqŽY‹Æ‰ï‚Ö‚Ì•‹yh

ƒCƒmƒx[ƒVƒ‡ƒ“„iŽ–‹Æ¬‰Ê•ñ‰ï, _ŒË 2012”N3ŒŽ‚Q‚Q“ú

 

[56]–Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA‘ååM”͏ºAˆî’jŒ’A–Ø‘ºŒ›–¾

gƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰Ê‘fŽq‚ð—p‚¢‚½‚•ª‰ð”\ƒRƒ“ƒNƒŠ[ƒg“à•”“S‹ØŒŸ¸‹Zp‚ÉŠÖ‚·‚錤‹†h

“ú–{”ñ”j‰óŒŸ¸‹¦‰ï•½¬24”N“xt‹Gu‰‰‘å‰ïu‰‰ŠT—vWp.89-p92@“Œ‹ž 2012”N4ŒŽ22“ú

 

[57]–Ø‘ºŒšŽŸ˜Y

g•¨Ž¿ŠE–Ê‚É‚¨‚¯‚é\‘¢‚Æ“d‰×ˆÚ“®‚ð‰ÂŽ‹‰»‚·‚é‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾–@‚ÌŠJ”­g

‘æ50‰ñ“ú–{¶•¨•¨—Šw‰ï”N‰ïA–¼ŒÃ‰®@2012”N9ŒŽ(Invited)

 

[58] K. Kimura, Y. Mima, N. Oyabu, N. Kimura, T. Inao

gDevelopment of magnetic field microscopy for interconnection testing inside passivation layerh

SSDM2012‘Û‰ï‹cA‹ž“s@2012”N9ŒŽ

 

[59] Yuki Mima, Noriaki Oyabu, Takeshi Inao, Noriaki Kimura, Kenjiro Kimura

gDevelopment of Tunneling Magnetoresistance Microscope with Electro-Magnetic Field Reconstructionh

International Conference of the Asian Union of Magnetics Societies (ICAUMS2012), “ޗǁ@2012”N10ŒŽ

 

[60]–Ø‘ºŒšŽŸ˜Y

gƒiƒmƒVƒXƒeƒ€‚Ì‘å‹K–͏WÏ‰»‚ÉŒü‚¯‚½‚‘¬“dŽqü˜IŒõ–@‚ÌŠJ”­g

‚³‚«‚ª‚¯uƒiƒmƒVƒXƒeƒ€‚Æ‹@”\‘n”­v‘æ2Šú¶Œ¤‹†¬‰Ê•ñ‰ïA“Œ‹ž 2012”N12ŒŽ

@

 

[61]–Ø‘ºŒšŽŸ˜Y

gƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚Æ“dŽ¥êÄ\¬–@‚ÌŠJ”­hiˆË—Šu‰‰j

ƒiƒmƒvƒ[ƒuƒeƒNƒmƒƒW[‘æ167ˆÏˆõ‰ï@‘æ69‰ñŒ¤‹†‰ï@“Œ‹ž@2013”N1ŒŽ

 

[62]–Ø‘ºŒšŽŸ˜Y

g“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‹Zpš“O’ê‰ðà

`LiƒCƒIƒ““d’r‚ÌŒŸ¸‚â“dŽq•”•i‚̌̏á‰ðÍ‚É‚¨‚¯‚éŠvV“I‹Zp‚ðÚ‰ð`iˆË—Šu‰‰j

Electronic Journal ‘æ1564‰ñTechnical Seminar, “Œ‹ž 2013”N1ŒŽ

 

[63]–Ø‘ºŒšŽŸ˜Y

gŒ¤‹†ƒV[ƒYEƒxƒ“ƒ`ƒƒ[—§‚¿ã‚°hiˆË—Šu‰‰j

_ŒËˆã—ÃŽY‹Æ“sŽs@ƒNƒ‰ƒXƒ^[Œð—¬‰ïA_ŒË 2013”N2ŒŽ

 

[64]–Ø‘ºŒšŽŸ˜Y

gŽü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–ʂ̍\‘¢‰ðÍhiˆË—Šu‰‰j

“ú–{•ªÍ‰»Šw‰ï‘æ62”N‰ï@—n‰tŠE–ÊŒ¤‹†§’k‰ïA‘åã 2013”N9ŒŽ

 

[65]–Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u |“dŽq•”•iA“d’r“à•”‚Ì“d‹C‚Ì—¬‚ê‚ð‰f‘œ‰»”ñ”j‰óŒÌá‰ðÍ|h

Ceatec Japan 2013 o“WŽÒƒZƒ~ƒi[Aç—t@2013”N10ŒŽ

 

m66n–Ø‘ºŒšŽŸ˜Y

g“d—¬Œo˜H‰f‘œ‰»‘•’u‚ÌŠJ”­‚Æ“d’r“à•”‚Ì”ñ”j‰ó‰æ‘œf’f‚ւ̉ž—ph

FC EXPO2014ƒAƒJƒfƒ~ƒbƒNƒtƒH[ƒ‰ƒ€A“Œ‹ž, 2014”N2ŒŽ

 

m67n–Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

@‹ž“sSMIƒZƒ~ƒi[@2014”N2ŒŽ@“Œ‹žiŽóÜŽÒˆË—Šu‰‰j

 

m68n–Ø‘ºŒšŽŸ˜Y

 g“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‹Zpš“O’ê‰ðà `LiƒCƒIƒ““d’r‚â“dŽq•”•i‚̌̏á‰ðÍ‚É‚¨‚¯‚éŠvV“I‹Zp‚ðÚ‰ð`g

Electronic Journal ‘æ2077‰ñ Technical Seminar 2014”N4ŒŽ@“Œ‹žiˆË—Šu‰‰j

 

m69n–Ø‘ºŒšŽŸ˜Y

g“dŽ¥êÄ\¬Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“d’r“à•””ñ”j‰óŒŸ¸‚ւ̉ž—ph“d‹C‰»Šw‰ï@‘æ81‰ñ‘å‰ï@‘åã@2014”N3ŒŽ

 

m70n–Ø‘ºŒšŽŸ˜Y

Šé‹Æ‚ł̍u‰‰ g“dŽ¥êÄ\¬Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“d’r“à•””ñ”j‰óŒŸ¸‚ւ̉ž—ph

2014”N4ŒŽ@iˆË—Šu‰‰j

 

m71n–Ø‘ºŒšŽŸ˜Y

“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”­

‰ž—p•¨—Šw ‰ïŠÖ¼Žx•” •½¬‚Q‚U”N“x‘æ‚P‰ñu‰‰‰ï

uƒvƒ[ƒuŒ°”÷‹¾‚Æ—L‹@ƒGƒŒƒNƒgƒƒjƒNƒX `ŠÖ¼ŽáŽèŒ¤‹†ŽÒ‚©‚ç‚̏î•ñ”­M`v‹ž“s‘åŠw@2014”N6ŒŽiˆË—Šu‰‰j

 

m72n–Ø‘ºŒšŽŸ˜Y

g•¨Ž¿ŠE–ʂ̍\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

JPCA|show 2014 ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUA“Œ‹ž@2014”N6ŒŽ

 

m73n–Ø‘ºŒšŽŸ˜Y

“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”­

‰ž—p•¨—Šw ‰ïŠÖ¼Žx•” •½¬‚Q‚U”N“x‘æ‚P‰ñu‰‰‰ï

uƒvƒ[ƒuŒ°”÷‹¾‚Æ—L‹@ƒGƒŒƒNƒgƒƒjƒNƒX `ŠÖ¼ŽáŽèŒ¤‹†ŽÒ‚©‚ç‚̏î•ñ”­M`vg“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”­h‹ž“s‘åŠw@2014”N6ŒŽ26“úiˆË—Šu‰‰j

 

m74n–Ø‘ºŒšŽŸ˜Y

g•¨Ž¿ŠE–ʂ̍\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

2014ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[(‘æ28‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“W)

ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUA“Œ‹žƒrƒbƒOƒTƒCƒg@2014”N6ŒŽ 4“ú|6“úA

 

m75n–Ø‘ºŒšŽŸ˜Y

 gNondestructive electric current density imaging inside

rechargeable battery cellg

NC-AFM 2014@@2014”N8ŒŽ4“ú-8“úAç—tŒ§‚‚­‚΍‘Û‰ï‹cêiˆË—Šu‰‰j

17th International Conference on non-contact Atomic Force Microscopyi‘æ17‰ñ@”ñÚGŒ´ŽqŠÔ—ÍŒ°”÷‹¾‘Û‰ï‹cj

 

[76] –Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

í—ª–Ú•WuƒvƒƒZƒXƒCƒ“ƒeƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚鎟¢‘ãƒiƒmƒVƒXƒeƒ€‚Ì‘n»v‚RŒ¤‹†—̈æ‘æ‚Q‰ñ‡“¯ŒöŠJƒVƒ“ƒ|ƒWƒEƒ€A“Œ‹žA2014”N10ŒŽ1“ú

 

m77n–Ø‘ºŒšŽŸ˜Y, ”ü”n—EŽ÷, –ì–{˜a½, ‘ååM”͏º, –Ø‘ºŒ›–¾

g“dŽ¥êÄ\¬ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ÌŠJ”­‚Æ“d’r“à•”‚Ì“d—¬Œo˜H‰f‘œ‰»‚ւ̉ž—ph“d’r“¢˜_‰ï@‘æ81‰ñ‘å‰ï@‘—§‹ž“s‘Û‰ïŠÙ@2014”N‚P‚PŒŽ‚P‚X“ú

–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –ì–{˜a½, ‘ååM”͏º, –Ø‘ºŒ›–¾, ‘æ55 ‰ñ“d’r“¢˜_‰ï u‰‰—vŽ|W p.348 (2014).

 

[78] –Ø‘ºŒšŽŸ˜Y

gŽ¥‹C‰f‘œ‰»‚É‚æ‚é”ñ”j‰ó‰æ‘œŒŸ¸@- “dŽq•”•i,ƒŠƒ`ƒEƒ€’~“d’r“à•”‚̌̏áŒÂŠ‚ð“Á’è -h

ƒOƒŠ[ƒ“ƒCƒmƒx[ƒVƒ‡ƒ“V‹Zpà–¾‰ïC‚i‚r‚s“Œ‹ž–{•”•ÊŠÙƒz[ƒ‹i“Œ‹žEŽsƒ–’Jj 2015”N‚PŒŽ16“ú

 

[79] –Ø‘ºŒšŽŸ˜YCŒü“a”žC–Ø‘ºŒ›–¾CŽO–Ø–œ—RŽqC‚”öM‘¾˜Y

gƒŠƒAƒ‹ƒ^ƒCƒ€ƒ}ƒCƒNƒ”gƒ}ƒ“ƒ‚ƒOƒ‰ƒtƒB‚ÌŠJ”­h‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï@“ŒŠC‘åŠw Ã“ìƒLƒƒƒ“ƒpƒX@2015”N3ŒŽ11“ú`14“ú

 

[80] –Ø‘ºŒšŽŸ˜Y@

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”­‚Æ“dŽq•”•i,’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—ph

æ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”­ƒvƒƒOƒ‰ƒ€@V‹Zpà–¾‰ïC ‚i‚r‚s“Œ‹ž–{•”•ÊŠÙƒz[ƒ‹i“Œ‹žEŽsƒ–’JjC2015”N3ŒŽ23“ú

 

[81] –Ø‘ºŒšŽŸ˜Y@

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”­‚Æ’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—ph

’~“d’rƒ[ƒJ‚ł̍u‰‰iˆ¤’mŒ§jC2015”N4ŒŽ20“ú(Invited)

 

[82]–Ø‘ºŒšŽŸ˜Y@–ì–{˜a½A”ü”n—E‹PA–Ø‘ºŒ›–¾

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h

2015ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[i‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WjƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU@“Œ‹žƒrƒbƒOƒTƒCƒg@2015”N6ŒŽ3“ú`‚T“ú

 

[83] –Ø‘ºŒšŽŸ˜Y

‘æ‚T‰ñŠÖ¼’nˆæ‘åŠwŒ¤‹†Žx‰‡ƒXƒ^ƒbƒtƒ~[ƒeƒBƒ“ƒO,h–Ø‘ºŒ¤‹†Žº‚ÌŠˆ“®, Šú‘Ò‚·‚錤‹†¬‰Ê‚̃AƒEƒgƒŠ[ƒ`Žx‰‡h, _ŒË‘åŠw 2015”N8ŒŽ2“ú(Invited).

 

[84] –Ø‘ºŒšŽŸ˜Y

gƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­‚Ɛ¶‘́A’~“d’r,ƒCƒ“ƒtƒ‰‰æ‘œŒŸ¸‚ւ̉ž—ph

ƒCƒmƒx[ƒVƒ‡ƒ“EƒWƒƒƒpƒ“2015i“Œ‹žƒrƒbƒOƒTƒCƒgj2015”N‚WŒŽ‚Q‚V“ú

 

[85]  –Ø‘ºŒšŽŸ˜Y

gÅæ’[‰æ‘œŒv‘ª‘•’u‚ÌŠJ”­‚ÆŽÀ—p‰»@-ˆÀ‘S,ˆÀS‚ȎЉï‚ð–ÚŽw‚µ‚Ä-h

í—ª–Ú•WuƒvƒƒZƒXƒCƒ“ƒeƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚鎟¢‘ãƒiƒmƒVƒXƒeƒ€‚Ì‘n»v

‚RŒ¤‹†—̈æ‘æ‚R‰ñ‡“¯ŒöŠJƒVƒ“ƒ|ƒWƒEƒ€@“Œ‹žiƒRƒNƒˆƒz[ƒ‹j‚Q‚O‚P‚T”N‚XŒŽ‚Q‚X“ú

 

[86] –Ø‘º ŒšŽŸ˜YC–Ø‘º Œ›–¾CL—˜ _ˆêC‹´–{ ’m‹vC²‹vŠÔ iŽqCŽO–Ø –œ—RŽqC‚”ö M‘¾˜Y

g”÷Žã“d”g‚ð—p‚¢‚½”ñNP“ûŠà‰æ‘œf’f–@‚ÌŠJ”­ \‚Š´“x“ûŠàŒŸo‚ð–ÚŽw‚µ‚ā\h

‘æ‚Q‚T‰ñ@“ú–{“ûŠàŒŸfŠw‰ïŠwp‘‰ï@i‚‚­‚΍‘Û‰ï‹cêj2015”N‚P‚OŒŽ‚R‚O“ú`‚R‚P“ú

 

[87] ›”ü”n —E‹P, –ì–{ ˜a½,–Ø‘º Œ›–¾, –Ø‘º ŒšŽŸ˜Y

 g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŒž‰ñŒ^’~“d’r‚ւ̉ž—ph

‘æ56‰ñ“d’r“¢˜_‰ï@3E25iˆ¤’mŒ§ŽY‹Æ˜J“­ƒZƒ“ƒ^[@ƒEƒCƒ“ƒN‚ ‚¢‚¿j2015”N11ŒŽ13“ú

 

[88] ›–Ø‘ºŒšŽŸ˜Y, “c‘º¹ˆ», –Ø‘ºŒ›–¾, ŽR‰º—SŽi, ‰Í–쐽”VC“c’†—DŽqCŽO–Ø–œ—RŽqCL—˜_ˆê, ‹´–{’m‹v, ²‹vŠÔ˜æŽq, ‚”öM‘¾˜Y, gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ÌŠJ”­- ŽB‘œ‘¬“x‚ÌŒüã‚ÉŠÖ‚·‚錟“¢ -h, ‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï, i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú

‰‰‘è”ԍ†: DP-2-47-5@ƒZƒbƒVƒ‡ƒ“–¼F ƒ|ƒXƒ^[“¢‹c47@“úŽžF 2016”N6ŒŽ17“úi‹àj

 

Šw‰ï”­•\i‹¤’˜j

(1) S. Ido, K. Kimura, N. Oyabu, K. Kobayashi, Y. Hirata & H. Yamada,

 High-resolution Imaging of Biomolecules in Liquids by FM-AFM.

11th International Conference on Non-contact Atomic Force Microscopy, We-1450, Madrid, Spain (2008). Œû“ª”­•\

 

(2) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”͏ºC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C•½“c –FŽ÷C¯ Ž¡C‹–Ø ’C’j,

u‰t’†“®ìŽü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½¶‘̍‚•ªŽq‚̍‚•ª‰ð”\ŠÏŽ@v

“ú–{Œ°”÷‹¾Šw‰ï‘æ64‰ñŠwpu‰‰‰ï, P-082, ‘—§‹ž“s‘Û‰ïŠÙ (2008”N). ƒ|ƒXƒ^[”­•\

 

(3) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”͏ºC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C¯ Ž¡C‹–Ø ’C’j,

uŽü”g”•Ï’²•ûŽ®AFM‚ð—p‚¢‚½ƒvƒ‰ƒXƒ~ƒhDNA‚̉t’†‚•ª‰ð”\ŠÏŽ@v

 2008”Nt‹G ‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 29p-Q-6, “ú–{‘åŠw (2008”N). Œû“ª”­•\

 

 

(4) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”͏ºC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C•½“c –FŽ÷C¯ Ž¡C‹–Ø ’C’j,

uŽü”g”•Ï’²ŒŸo•ûŽ®AFM‚ð—p‚¢‚½¶‘̍‚•ªŽq‚̉t’†‚•ª‰ð”\ŠÏŽ@v

 2008”NH‹G ‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 4a-L-3, ’†•”‘åŠw (2008”N). Œû“ª”­•\

 

 

i5j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘吼—m

 Œõ“d’…–@‚ð—p‚¢‚Ä”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚ÌŒ¤‹†, “Á’è—̈挤‹†u‚ŽŸ•ªŽqŒn‰ÈŠwv‘æ3‰ñ‡“¯”Á‰ï‹c, 2008,

 

i6j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

   Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“ƒ‚ƒfƒ‹G”}‚ÌAFMŠÏŽ@, ‘æ102‰ñG”}“¢˜_‰ï, 2008,

 

i7j  K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, H. Yamada.

Molecular-scale Hydration Structures Investigated by Frequency Modulation Atomic Force Microscopy,

 11th International Conference on Non-contact Atomic Force Microscopy (NCAFM2008), 2008,

 

i8j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚ÌSPMŠÏŽ@,

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2008,

 

i9j Kenjiro Kimura, Takumi Hiasa, Hiroshi Onishi.

Development of scanning probe tomography and its application for visualizing internal nanomagnetic structures,

2008 MRS Fall Meeting, 2008,

 

i10jTakumi Hiasa, Suzumi Kataoka, Kenjiro Kimura, Hiroshi Onishi.

 Scanning probe study of TiO2 surfaces placed in reactive environments,

 2008 MRS Fall Meeting, 2008,

 

i11j Suzumi Kataoka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 SPM Observation of Pt Nanoparticles Photodeposited on TiO2(110),

2008 MRS Fall Meeting, 2008,

 

i12j •Ð‰ª—Á”ü, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, •²ì—Ç•½, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

Œõ“d’…–@‚ō쐬‚µ‚½”’‹à’SŽŽ_‰»ƒ`ƒ^ƒ“G”}‚̃vƒ[ƒuŒ°”÷‹¾ŠÏŽ@,

G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[[ƒVƒ‡ƒ“uK‰ï, 2008,

 

i13j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, •²ì—Ç•½, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–Ê‚ÌŠÏŽ@,

G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[[ƒVƒ‡ƒ“uK‰ï, 2008,

 

i14jSuzumi Kataoka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Noriyuki Oyabu, Kei Kobayashi, Hirofumi Yamada.

 AFM study of Pt Nanoparticles on TiO2(110) Deposited in Solutions,

The 16th International Colloquim on Scanning Probe Microscopy, 2008,

 

i15j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Noriyuki Oyabu, Kei Kobayashi, Hirofumi Yamada.

Solvation Structures at a Solution-TiO2 Interface Studied by Frequency-Modulation Atomic Force Miscroscopy,

The 16th International Colloquim on Scanning Probe Microscopy, 2008,

 

i16j Keita Fujio, Kenjiro Kimura, Naoki Koide, Hiroshi Onishi.

 FM-AFM Study of Dye-Adsorbed TiO2(110) Electrodes,

 The 16th International Colloquim on Scanning Probe Microscopy, 2008,

 

i17j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 ŒõG”}”½‰žê‚É‚¨‚¯‚é‹ÇŠ…˜a\‘¢Œv‘ª,

 _ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï2008,

 

i18j  •Ð‰ª—Á”ü, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

”’‹à’SŽ“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚Ì‘g¬E\‘¢•ªÍ,

_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï2008, 2008,

 

i19j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Ž_‰»ƒ`ƒ^ƒ“-…—n‰tŠE–Ê‚É‚¨‚¯‚é‹ÇŠ…˜a\‘¢‚ÌFM-AFM‰ðÍ,

 “ú–{‰»Šw‰ï‘æ89t‹G”N‰ï, 2009,

 

i20j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 ‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鐅—n‰t-“ñŽ_‰»ƒ`ƒ^ƒ“ŠE–ʂ̋ǏŠ—n”}˜a\‘¢‰ðÍ,

t‹G‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2009,

 

i21j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹à‘®Ž_‰»•¨‚̋ǏŠ…˜a\‘¢‰ðÍ,

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2009,

 

i22j A“c^s, –Ø‘ºŒ’ŽŸ˜Y, ‘吼—m.

TiO2(110)•\–Ê‚É‹z’…‚µ‚½Ž_‘fŒ´Žq‚Ì‹zŠj”½‰ž«,

 ‘æ104‰ñG”}“¢˜_‰ï, 2009,

 

i23j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

‰t’†“®ìŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨-…—n‰tŠE–ʂ̉ðÍ,

 ‘æ29‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2009,

 

i24j “¡”öŒc‘¾, ¬o’¼é, •ÐŽR”Ž”V, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éF‘f‘Š´“d‹Éƒ‚ƒfƒ‹‚ÌŠÏŽ@,

‘æ29‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2009,

 

i25jT. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

 Local Hydration Structures on Metal Oxides Investigated by Frequency-Modulation Atomic Force Microscopy,

The 7th International Workshop on Oxide Surfaces (IWOX-VII), 2010,

 

i26j M. Ueda, M. Yasuo, K. Kimura, H. Onishi.

 Nucleophilic Reactivity of Oxygen Adatoms on a TiO2(110) Surface,

The 7th International Workshop on Oxide Surfaces (IWOX-VII), 2010,

 

i27j Keita Fujio, Naoki Koide, Hiroyuki Katayama, Kenjiro Kimura, Hiroshi Onishi.

 FM-AFM Observation of Dye-Sensitized TiO2 Electrodes,

The 7th International Workshop on Oxide Surfaces (IWOX-VII), 2010,

 

i28j Keita Fujio, Kenjiro Kimura, Naoki Koide, Hiroyuki Katayama, Hiroshi Onishi.

 Dye-Adsorbed TiO2(110) Electrodes Studied with FM-AFM,

The 17th International Colloquim on Scanning Probe Microscopy (ICSPM-17), 2009,

 

i29j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–Ê‚Ì—n”}˜a\‘¢‰ðÍ,

 “ú–{‰»Šw‰ï‘æ90t‹G”N‰ï, 2010,

 

i30j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鎩ŒÈ‘gD‰»’P•ªŽq–Œ‚Ì”ñ…—n”}’†ŠÏŽ@,

t‹G‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2010,

 

i31jT. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

 Force Spectroscopy at Liquid-Oxide Interfaces,

 The 12th International Scanning Probe Microscopy Conference, 2010,

 

i32j T. Sugihara, T. Hiasa, H. Onishi, K. Kimura, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada, T. Iwasaki, Y. Fukami.

 FM-AFM Study of Proteins on Lipid Rafts,

 The 12th International Scanning Probe Microscopy Conference, 2010,

 

i33j¡“c”Žä, “úóI, –Ø‘ºŒšŽŸ˜Y, ]ŒûŒ’ˆê˜Y, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶, ‘吼—m.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éCaCO3”÷—±Žq‚̉t’†‚•ª‰ð”\ŠÏŽ@,

 “ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠwpu‰‰‰ï, 2010,

 

i34j ¡“c”Žä, “úóI, –Ø‘ºŒšŽŸ˜Y, ]ŒûŒ’ˆê˜Y, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶, ‘吼—m.

Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é”÷—±Žq‚̍‚•ª‰ð”\ŠÏŽ@,

“ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠwpu‰‰‰ï, 2010,

 

i35j T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

FM-AFM study of thiol-modified gold films immersed in organic solvents,

13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i36j Keita Fujio, Naoki Koide, Hiroyuki Katayama, Kenjiro Kimura, Hiroshi Onishi.

NC-AFM study of dye-sensitized TiO2 electrodes,

13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i37j T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

 FM-AFM Study on Hydrophilic and Hydrophobic Metal Oxides,

 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i38j M. Yamazaki, T. Hiasa, M. Ohta, K. Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada, T. Hiasa, K. Kimura, H. Onishi.

 Solution-Polyethylene Interface Studied by FM-AFM,

 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i39j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

FM-AFM Study of Hydration at Water-Metal Oxides Interfaces,

The International Chemical Congress of Pacific Basin Societies (PACIFICHEM 2010), 2010,

 

i40j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

Kelvin Probe Force Microscope Study of Impregnated Pt/ TiO2 Catalyst Models,

 The International Chemical Congress of Pacific Basin Societies (PACIFICHEM 2010), 2010,

 

i41j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

 FM-AFM Study of Organic Solvents Interfaced with a Thiol-Modified Gold Surface,

The International Chemical Congress of Pacific Basin Societies (PACIFICHEM 2010), 2010,

 

i42j M. Yamazaki, T. Hiasa, M. Ohta, K. Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada, T. Hiasa, K. Kimura, H. Onishi.

 FM-AFM Study of Solution-Soft Matter Interfaces,

17th International Microscopy Congress (IMC-17), 2010,

 

i43j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì—n”}˜a\‘¢Œv‘ª,

“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ5‰ñ‡“¯”ljï‹c, 2010,

 

i44j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, •²ì—Ç•½, ‘å“c¹O, “n糈ê”V, ŽRè«Žk, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì—n‰t\‘¢‚ÌŒŸ“¢,

 •ªŽq‰ÈŠw“¢˜_‰ï2010, 2010,

 

i45j “Œ—Yˆê, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶

 Ã“d‹C—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨‚Ì•\–Ê“dˆÊ•ª•zŒv‘ª,

 ‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2010,

 

i46j  T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

Force Spectroscopy at Liquid-Solid Interfaces,

The 6th International Workshop on Nano-scale Spectroscopy and Nanotechnology (NSS6), 2010,

 

i47j¬”¨ŒbŽq, ‘吼—m, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y.

 “dŽ¥ê‹t‰ðÍ–@‚É‚æ‚鎥‹C‹L˜^”}‘Ì‚ÌŽOŽŸŒ³Ž¥ê•ª•zŒv‘ª,

‘æ30‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2010,

 

i48j ™Œ´’m‹I, —шí•à, “úóI, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘吼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒyƒvƒ`ƒhƒiƒmƒ`ƒ…[ƒu‚ÌŠÏŽ@,

“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ4‰ñŒöŠJƒVƒ“ƒ|ƒWƒEƒ€, 2010,

 

i49j Masashi Yamazaki, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

FM-AFM Study of Polyethylene-Adsorbed Graphite Immersed in Water,

The 18th International Colloquim on Scanning Probe Microscopy, 2010,

 

i50j Tomoki Sugihara, I. Hayashi, Takumi Hiasa, Kenjiro Kimura, A. Tamura, Hiroshi Onishi, Masahiro Ohta, Kazuyuki Watanabe, Ryohei Kokawa, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

 Peptide Nanotubes Observed by Frequency-Modulation Atomic Force Microscopy,

 The 18th International Colloquim on Scanning Probe Microscopy, 2010,

 

i51j —é–Ø’qŽq, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œ‚ÌŠÏŽ@,

 “ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,

 

i52j“úóI, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œã‚̐…—n‰t\‘¢‚ÌŒŸ“¢,

“ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,

 

i53j¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒƒAƒjƒŠƒ“Œ‹»‚Ì•\–ÊŠÏŽ@,

“ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,

 

i54jŽRè«Žk, •²ì—Ç•½, ‘å“c¹O, “n糈ê”V, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 ƒOƒ‰ƒtƒ@ƒCƒgã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚̏ƒ…’†FM-AFMŠÏŽ@,

 t‹G‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2011,

 

i55j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 ˆÙ‚È‚éæ’[Œa‚ð‚à‚Â’Tj‚ð—p‚¢‚½‰t’†FM-AFMŒv‘ª,

t‹G‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2011,

 

i56j¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒƒAƒjƒŠƒ“Œ‹»‚Ì•\–ÊŠÏŽ@,

 Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,

 

i57j “úóI, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘吼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”͏º, ¬—ÑŒ\, ŽR“cŒ[•¶.

Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œã‚̐…—n‰t\‘¢‚ÌŒŸ“¢,

 Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,

 

i58j •²ì—Ç•½, ŽRè«Žk, ‘å“c¹O, “n糈ê”V, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

ƒOƒ‰ƒtƒ@ƒCƒgã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚̏ƒ…’†FM-AFMŠÏŽ@,

 Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,

 

i59j â—´“T, ‘吼—m, –Ø‘ºŒšŽŸ˜Y.

’ቷŽŽ—¿ƒzƒ‹ƒ_[‚ÌŠJ”­‚Ɖt’†“®ìŽü”g”•Ï’²•ûŽ®AFM‚ւ̉ž—p,

 ‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2011,

 

i60j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 FM-AFM‚É‚æ‚ée…«’P•ªŽq–Œã‚̐…—n‰t\‘¢‚̉ðÍ,

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2011,

 

i61j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 Hydration to Hydrophilic Monolayers Visualized by FM-AFM,

14th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,

 

i62j —é–Ø’qŽq, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

ƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹’P•ªŽq–Œ‚ɐڂ·‚éƒwƒLƒTƒfƒJƒ“‰t‘̂̍\‘¢,

‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i63j¡“c”Žä, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’YŽ_ƒJƒ‹ƒVƒEƒ€‚̉t’†ŠÏŽ@,

 ‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i64j ¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½p-ƒjƒgƒƒAƒjƒŠƒ“-‰t‘ÌŠE–Ê‚ÌŠÏŽ@,

 ‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i65j ™Œ´’m‹I, —шí•à, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘吼—m.

ƒOƒ‰ƒtƒ@ƒCƒg-‰t‘ÌŠE–ʂɏWÏ‚µ‚½ƒyƒvƒ`ƒhƒiƒmƒ`ƒ…[ƒu‚̍\‘¢,

‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i66j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹’P•ªŽq–Œã‚̉t‘̍\‘¢‚̉ðÍ,

 ‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i67jRyohei Kokawa, Masashi Yamazaki, Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.  FM-AFM study of n-Alkane-Adsorbed Graphite Immersed in Liquids,

14th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,

 

i68j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

High-Resolution FM-AFM Imaging of Calcite Particles in Water,

International Symposium on Surface Science (ISSS6), 2011,

 

i69jHirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 High-resolution imaging of CaCO3 particles in liquid by FM-AFM,

Japan-Finland Joint Seminar of Material Science, 2011,

 

i70j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 Interfacial Liquids Visualized by Frequency-Modulation AFM,

 International Association of Colloid and Interface Scientists, Conference (IACIS2012), 2012,

 

i71j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ée…«’P•ªŽq–Œã‚̉t‘̍\‘¢‚ÌŒŸ“¢,

“ú–{‰»Šw‰ï‘æ92t‹G”N‰ï, 2012,

 

i72j  Rina Nishioka, Takumi Hiasa, Hiroshi Onishi, Kenjiro Kimura.

Interfacial Water over p-Nitroaniline (101) Surface,

15th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2012), 2012,

 

i73j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

  FM-AFM ‚É‚æ‚édecanol/HOPG ŠE–ʂ̍\‘¢‰ðÍ,

 ‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2012,

 

i74j “úóI, –Ø‘ºŒ’ŽŸ˜Y, ‘吼—m.

e…E‘a…Šî‚ð‹¤‘¶‚³‚¹‚½•\–ʏã‚̐…˜a\‘¢ŠÏŽ@,

‘æ6‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2012, 2012,

 

i75j  ¼‰ª—˜“Þ, “úóI, ‘吼—m, –Ø‘ºŒšŽŸ˜Y.

ƒjƒgƒƒxƒ“ƒ[ƒ“—U“±‘ÌŒ‹»-…ŠE–Ê‚ÌFM-AFM‚ð—p‚¢‚½\‘¢‰ðÍ,

 ‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,

 

i76j  ¡“c”Žä, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

Žü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒJƒ‹ƒTƒCƒg-…—n‰tŠE–ʂ̍\‘¢‰ðÍ,

 ‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,

 

i77j   “c’†—T—S, –Ø‘ºŒšŽŸ˜Y, Ž}˜a’j, ‘吼—m.

¸‰Ø«Œ‹»‚ÌŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‘å‹C’†ŠÏŽ@,

 ‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,

 

i78j Yuki Mima, Noriaki Oyabu, Takeshi Inao, Noriaki Kimura, Kenjiro Kimura.

 Development of Tunneling Magnetoresistance Microscope with Electro-Magnetic Field Reconstruction,

 International Conference of the Asian Union of Magnetics Societies (ICAUMS2012), 2012,

 

i79j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 FM-AFM Observation on Mercaptohexanol Monolayer in Aqueous Solution,

The 20th International Colloquim on Scanning Probe Microscopy, 2012,

 

i80j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 Water and 2-Propanol Structured on Calcite (104): An Atomic Force Microscopy Study (invited),

Japan-Korea Joint Symposium on Frontiers in Molecular Science -From Quantum to Life-, 2013,

 

i81j  …Œõr‰î, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

 Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’¼½ƒAƒ‹ƒR[ƒ‹-ƒ}ƒCƒJŠE–Ê‚ÌŠÏŽ@,

 “ú–{Œ°”÷‹¾Šw‰ï‘æ69‰ñŠwpu‰‰‰ï, 2013,

 

i82j  Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 Interfacial Water over CaCO3 probed by FM-AFM,

 33rd International Conference on Solution Chemistry, 2013,

 

i83j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 Interfacial Water and 2-Propanol over CaCO3 probed by FM-AFM,

 16th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2013), 2013,

 

i84j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

  Water and 2-Propanol Structured on Calcite (104): Imaging by Frequency-Modulation AFM,

 ‘æ64‰ñƒRƒƒCƒh‚¨‚æ‚ÑŠE–ʉ»Šw“¢˜_‰ï“ú‹ƒVƒ“ƒ|ƒWƒEƒ€, 2013,

 

i85j …Œõr‰î, “úóI, –Ø‘ºŒ’ŽŸ˜Y, ‘吼—m.

Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒ}ƒCƒJã‚Ì’¼½ƒAƒ‹ƒR[ƒ‹‚̉t‘̍\‘¢‚̉ðÍ,

‘æ7‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2013, 2013,

 

i86j  “à“cŒö“T, ŽO“cˆêŽ÷, ¼‰ªC, ˆÉèŒ’°, –Ø‘ºŒšŽŸ˜Y, ‘吼—m.

ˆêŽ²‰„LƒAƒCƒ\ƒ^ƒNƒ`ƒbƒNƒ|ƒŠƒvƒƒsƒŒƒ“‚ÌŽü”g”•Ï’²ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŠÏŽ@,

‘æ63‰ñ‚•ªŽq“¢˜_‰ï, 2014,

 

(87) ”ü”n—E‹P, ‘ååM”͏º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 uƒ‰ƒhƒ“•ÏŠ·‚É‚æ‚鎥‹CƒCƒ[ƒWƒ“ƒO‚̍‚•ª‰ð”\‰»v,

 ‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 11a-C10-7, ˆ¤•Q, 2012”N9ŒŽ

 

(88) ”ü”n—E‹P, ‘ååM”͏º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 uŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚̍‚•ª‰ð”\‰»‚ÉŠÖ‚·‚錤‹†v,

 _ŒË‘åŠw—Šw•”ƒz[ƒ€ƒJƒ~ƒ“ƒOƒfƒC‘æ3‰ñƒTƒCƒGƒ“ƒXƒtƒƒ“ƒeƒBƒAŒ¤‹†”­•\‰ï, _ŒË, 2012”N10ŒŽ

 

(89) ”ü”n—E‹P, ‘ååM”͏º, ˆî’jŒ’, –Ø‘ºŒ›–¾