�_ŒË‘åŠw �”—�ƒf�[ƒ^ƒTƒCƒGƒ“ƒXƒZƒ“ƒ^�[
‘åŠw‰@—�ŠwŒ¤‹†‰È –Ø‘ºŒšŽŸ˜Y Œ¤‹†Žº
Basic Concept of
Dr. K.Kimura Group Research
* Research
1, Noninvasive breast imaging
Advertisement for human subjects about
next-generation scattering field
mammography (2016 fall~) (Japanese version)
2, Nondestructive subsurface electric current imaging
NEDO
article pressed on May 29
*Electric
current distribution imaging inside rechargeable battery.
*High-speed
imaging for observing time-dependance phenomeana.
3, Nondestructive subsurface imaging for Concrete
Infrastructure Sustainability
*�‘—§Œ¤‹†ŠJ”–@�l‰ÈŠw‹Z�p�U‹»‹@�\‚ÌŽæ�Þ
Catalog and paper of magntici field imaging (in
Japanese) (pass)
Catalog and paper of magntici field imaging (in
English) (pass)
* Core member of K. Kimura Group
Kenjiro Kimura (PI)
Akari Inagaki
Seijyu Matsuda
Shogo Suzuki
Yoshinobu Yasui
Yoshiki Hidaka
Mai Ishida
Ryuichi Taguchi
Shiori Maezawa
*Cooperation company for measurement and analysis system
research
Integral Geometry Science inc.: JST & AMED member
Noriaki Kimura
Kyoji Doi
Akane Uoi
Yuki Mima
Miho samejima
*Member of cooperation company
Takeshi Inao
Kazuki Hoshijima
Ex-member of Kimura research group
Baku Kohden
Hiroyuiki kataoka
Kazuya Nishikawa
Kazunori Nomoto
Keiko Kobata
Akari Masuda
Tomoko Suzuki
Rina Nishioka
Satoshi Seike
Tomoki Sugihara
Ryusuke Ban
Yuichi Higashi
Yusuke Ikeda
Moyuko Hosokawa
Œ¤‹†‹Æ�Ñ
˜_•¶
[1] K. Kimura, K. Kobayashi, H.
Yamada, and K. Matsushige
"Two-dimensional dopant profiling by
scanning capacitance force microscopy"
Applied Surface Science 2003”N 210Šª
93-98.
[2] T.
Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige,
"Dynamic
force microscopy at high cantilever resonance frequencies using heterodyne
optical beam deflection method"
Applied
Physics Letter 2004”N 25Šª
6287-6289.
[3] K. Kimura, K. Kobayashi,
H. Yamada, K. Usuda and K. Matsushige
"Scanning capacitance force
microscopy imaging of metal-oxide-semiconductor field effect transistors"
Journal
of Vacuum Science and Technology B 2005”N 23Šª
1454-1458.
[4 ]
T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige
�gFrequency-modulation
atomic force microscopy at high cantilever resonance frequencies using the
heterodyne optical beam deflection method�h
Review of Scientific Instruments 2005”N76Šª
126110(1-3).
[5] K. Kimura, K. Kobayashi,
H. Yamada, K. Usuda and K. Matsushige
" TWO-DIMENSIONAL CARRIER PROFILING ON
OPERATING SIMOSFET BY SCANNING CAPACITANCE MICROSCOPY"
Proceedings of the 8th International Workshop on the
Fabrication, Characterization and Modeling of Ultra Shallow Junctions in
Semiconductors 2005”N 127.
[6] K.
Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige
"Two-dimensional
carrier profiling on operating Si-MOSFET by scanning capacitance microscopy"
Journal of Vacuum Science and Technology B
2006”N 24Šª 1371-1376.
[7] K. Kimura, K. Kobayashi,
H. Yamada, and K. Matsushige
"Improving sensitivity in electrostatic force
detection utilizing cantilever with tailored resonance modes"
Applied
Physics Letter 2007”N 90Šª
053113(1-3).
[8] K. Kimura, K. Kobayashi,
H. Yamada, K. Usuda and K. Matsushige
"Noncontact-mode scanning capacitance force
microscopy towards quantitative tow-dimensional carrier profiling on
semiconductor devices"
Applied
Physics Letter 2007”N 90Šª
083101(1-3).
[9] T. Hiasa, K. Kimura, H.
Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada,
�gSolution-TiO2 Interface Probed by
Frequency-Modulation Atomic Force Microscopy�h
Japanese Journal of Applied Physics 2009”N 48Šª, 08JB19 (1-3).
[10] K. Kimura, S. Ido, N. Oyabu, K.
Kobayashi, Y. Hirata, T. Imai, H. Yamada
�gVisualizing
water molecule distribution by atomic force microscopy"
Journal of Chemical Physics 2010”N 132Šª,
194705(1-5).
[11] T. Hiasa, K. Kimura, H.
Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada
�gAqueous Solution Structure over
ƒ¿-Al2O3(01-12) Probed by Frequency-Modulation Atomic Force Microscopy�h�@Journal of Physical Chemistry C 2010”N 114Šª, 21423-21426.
[12]
K. Fujio, K. Kimura, N. Koide, H. Katayama, H. Onishi.
�gBlack-Dye-Adsorbed
TiO2 (110) Electrodes Studied by Frequency-Modulation Atomic Force Microscopy�h
Japanese Journal of Applied Physics 2010”N49Šª, 08LB06(1-3).
[13] Y. Ando, T. Sugihara, K. Kimura, A. Tsuda.
A Self-Assembled Helical Anthracene Nanofibre Whose
P- and M-Isomers Show Unequal Linear Dichroism in a Vortex, Chemical
Communications 47 (2011) 11748-11750,
[14]
Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.
"Hydration
of hydrophilic thiolate monolayers visualized by atomic force
microscopy"
Phys. Chem. Chem. Phys. 14(2012)8419-8424
[15]
Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi
"Two-dimensional
distribution of liquid hydrocarbons facing alkanethiol monolayers visualized by
frequency modulation atomic force microscopy" , Colloids Surf.
A 396 (2012) 203-207.
[16]
Takumi Hiasa, Tomoki Sugihara, Kenjiro Kimura, Hiroshi Onishi
"FM-AFM
imaging of a commercial polyethylene film immersed in n-dodecane"
J. Phys.; Condens. Matter 24 (2012) 084011 (4 pages).
[17]
Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi
"Minitips in Frequency-Modulation
Atomic Force Microscopy at Solid-Liquid Interface"
Jpn.
J. Appl. Phys. 51 (2012) 025703 (4 pages).
[18]�@–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”Í�º, ˆî’jŒ’,
�g“dŽ¥�ê�Ä�\�¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ��[ƒWƒ“ƒO‘•’u‚ÌŠJ”‚Æ“dŽq•”•iŒÌ�á‰ð�͂ւ̉ž—p�h, ƒGƒŒƒNƒgƒ�ƒjƒNƒXŽÀ‘•‹Z�p 28, 16 (2012).(Invited)
[19] Takumi
Hiasa, Kenjiro Kimura, Hiroshi Onishi
�gCross-Sectional
Structure of Liquid 1-Decanol over Graphite�h
Journal
of Physical Chemistry C 116 (2012) 26475–26479
[20]
Shinichiro Ido, Kenjiro Kimura, Noriaki Oyabu, Kei Kobayashi, Masaru
Tsukuda, Kazumi Matushige, Hirofumi Yamada
�gBeyond the Helix Pitch: Direct Visualization of
Native DNA in Aqueous Solution�h
ACS Nano 2013 7(2)
1817-1822
[21] Sugihara Tomoki,
ituho Hyashi, Hiroshi Onishi, Kenjiro Kimura, Atsuo Tamura
�gSub-nanometer-resolution imaging of peptide nanotubes
in water using frequency modulation atomic force microscopy�h
Chemical
Physics 419(2013)74-77
[22] Takumi
Hiasa, Kenjiro Kimura, Hiroshi Onishi.
�gInterfacial
Structure of Primary and Tertiary Alcohol Liquids over Hhydrophilic Thiolate
Monolayers�h
Journal
of Physical Chemistry C 117 (2013) 5730-5735
[23] Rina
Nishioka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.
�gSpecific
Hydration on p-Nitroaniline Crystal Studied by Atomic Force Microscopy�h
Journal
of Physical Chemistry C 117 (2013) 2939-2943
[24]
Kei Kobayashi, Noriaki Oyabu, Kenjiro Kimura, Shinichiro Ido, Kazuhiro
Suzuki, Takashi Imai, Katsunori
Tagami, Masaru Tsukada, and Hirofumi Yamada
�gVisualization
of hydration layers on muscovite mica in aqueous solution by frequency-modulation
atomic force microscopy�h
Journal of Chemical Physics 138 (2013) 184704.
[25] H. Imada, K.
Kimura, H. Onishi.
�gWater and 2-Propanol
Structured on Calcite (104) Probed by Frequency-Modulation Atomic Force
Microscopy�h, Langmuir 29 (2013) 10744-10751,
[26] H. Imada, K. Kimura, H. Onishi.
�gAtom-Resolved AFM Imaging of Calcite Nanoparticles in
Water�h, Chemical Physics 419 (2013) 193-195,
[27]–Ø‘ºŒšŽŸ˜Y�A”ü”n—E‹P�A‘ååM”Í�º�Aˆî’jŒ’�A–Ø‘ºŒ›–¾
�g�‚Š´“xŽ¥‹C’ï�RŒø‰Ê‘fŽq‚É‚æ‚鎥�ê‚ÌŒv‘ª‚Æ“dŽ¥�ê�Ä�\�¬–@‚ð—p‚¢‚½�‚•ª‰ð”\ƒRƒ“ƒNƒŠ�[ƒg“à•”“S‹ØŒŸ�¸‹Z�p‚ÉŠÖ‚·‚錤‹†�h, ”ñ”j‰óŒŸ�¸Vol.62 (2013) No.10
Oct.527-528. (Invited)
[28] ”ü”n—E‹P�A‘ååM”Í�º�Cˆî’jŒ’�A–Ø‘ºŒ›–¾�A–Ø‘ºŒšŽŸ˜Y
�g“d—¬Œo˜H‚Ì”ñ”j‰ó‰f‘œ‰»‘•’u‚ÌŽÀ—p‰»�]“dŽq•”•i�AƒvƒŠƒ“ƒgŠî”Â�A“d’r‚Ì•s—ljð�͂ւ̉ž—p�]�h‘æ43‰ñ�‘�Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-34(2013).
[29] Y. Mima, N. Oyabu, T. Inao, N.
Kimura, K. Kimura
"Failure analysis of electric circuit board by high
resolution magnetic field microscopy"
Proceedings of IEEE CPMT Symposium Japan (2013) 257-260.
[30] –Ø‘º ŒšŽŸ˜Y�A–ì–{ ˜a�½�A�¬”¨ ŒbŽq�A—é–Ø ’qŽq�A”ü”n —E‹P, ‘ååM”Í�º�Cˆî’jŒ’�A–Ø‘ºŒ›–¾ �g•¨Ž¿ŠE–Ê‚Ì�\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT�[ƒtƒFƒXƒCƒ��[ƒWƒ“ƒO–@‚ÌŠJ”�]�h‘æ44‰ñ�‘�Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-17(2014). (ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU�Ü)
[31] –Ø‘ºŒšŽŸ˜Y, –ì–{˜a�½, ”ü”n—E‹P, –Ø‘ºŒ›–¾,
�g�‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ�¸�h
‘æ29‰ñ�Å�æ’[ŽÀ‘•‹Z�p�EƒpƒbƒP�[ƒWƒ“ƒO“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU, AP-18(2015).
”–¾
[1] –Ø‘ºŒšŽŸ˜Y, �¬—ÑŒ\, ŽR“cŒ[•¶, �¼�d˜a”ü
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[8] ‘ååM”Í�º, ‘å“c�¹�O, –Ø‘ºŒšŽŸ˜Y, ˆäŒË�Tˆê˜Y, �¬—ÑŒ\, ŽR“cŒ[•¶, �¼�d˜a”ü
“ÁŠè2008-002057‘–�¸‘•’u
[9] –Ø‘ºŒšŽŸ˜Y, �´‰Æ’qŽj, ‘å�¼—m
“ÁŠè2009-164676‰×“d—±Žq�ü�ÆŽË‘•’u�A•`‰æ‘•’u�A•ª�ÍŒ°”÷‹¾�A‰×“d—±Žq�ü�oŽË‘•’u‚¨‚æ‚щדd—±Žq�ü—p‚̃Œƒ“ƒY‘•’u
[10] ‘ååM”Í�º�A–Ø‘ºŒšŽŸ˜Y�AˆäŒË�Tˆê˜Y�A—é–Øˆê”Ž�A�¬—ÑŒ\�AŽR“cŒ[•¶
“ÁŠè2009-180137�@�§Œä‘•’u�AŒ´ŽqŠÔ—ÍŒ°”÷‹¾�A�§Œä•û–@‚¨‚æ‚уvƒ�ƒOƒ‰ƒ€
[11] ‘ååM”Í�º�A–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶
“ÁŠè2009-193606�@�U“®‘̂̎ü”g�”ŒŸ�o‘•’u�AŒ´ŽqŠÔ—ÍŒ°”÷‹¾�A�U“®‘̂̎ü”g�”ŒŸ�o•û–@‚¨‚æ‚уvƒ�ƒOƒ‰ƒ€
[12]–Ø‘ºŒšŽŸ˜Y�A“ú�ó�I�A‘å�¼—m�A‘ååM”Í�º
“ÁŠè2009-297601�@ƒJƒ“ƒ`ƒŒƒo�[Œ^ƒZƒ“ƒT�CƒoƒCƒIƒZƒ“ƒT‚¨‚æ‚уvƒ��[ƒuŒ°”÷‹¾
[13]–Ø‘ºŒšŽŸ˜Y
“ÁŠè2010-44218�@ƒ|ƒeƒ“ƒVƒƒƒ‹Žæ“¾‘•’u�AŽ¥�ꌰ”÷‹¾�AŒŸ�¸‘•’u‚¨‚æ‚у|ƒeƒ“ƒVƒƒƒ‹Žæ“¾•û–@
[14] �¬”¨ŒbŽq, –Ø‘ºŒšŽŸ˜Y
“ÁŠè:2010-214453 Ž¥�êƒZƒ“ƒT‹y‚ÑŽ¥�êƒZƒ“ƒT‚Ì�»‘¢•û–@
[15] –Ø‘ºŒšŽŸ˜Y
“ÁŠè�F2010-261016 Ž¥�ꕪ•zŽæ“¾‘•’u
[16]
K.Kimura, K.Kobayashi, H.Yamada, K.Matsushige
United
States Patent: US 7,829,863 B2, Nov.9,2010
ELECTRON
BEAM IRRADIATION DEVICE
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[1]K.
Kimura, T. Horiuchi, N. Oyabu, K. Kobayashi, Y. Hirata, M. Abe, K. Matsushige,
S. Morita, H. Yamada,
�gLocal
Solvation Force Measurement by Frequency Modulation Atomic Froce Microscopy�h
Ext.Abstr.10h
Int.Conf.Non-Contact Atomic Force Microscopy, 2007”N�Ap.83.
[2] K.
Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, and H. Yamada
"Molecular-scale
Hydration Structures Investigated by Frequency ModulationAtomic Force
Microscopy"
Ext.
Abstr. 11th Int. Conf. Non-contact Atomic Force Microscopy, 2008, p. 62.
[3]
Collaboration with Integral Geometry Instruments, LLC
�g“dŽ¥�ê�Ä�\�¬
– ‘–�¸Œ^ƒgƒ“ƒlƒ‹Ž¥‹C’ï�RŒø‰ÊŒ°”÷‹¾�h,
‰ÈŠw�E•ª�Í‹@Ší‘�—— p. 711 (2012).
[4]
–Ø‘ºŒšŽŸ˜Y
�g‚±‚±‚܂ŗˆ‚½Œ´ŽqŠÔ—ÍŒ°”÷‹¾�@ƒCƒIƒ“‰t‘Ì’†‚Ōő̕¨Ž¿•\–ʂ̌´Žq‚ðŠÏŽ@�h
ŒŽŠ§‰»Šw
68Šª
p.63(2012)
[5]
“ú�ó�I,
�¼‰ª—˜“Þ,
–Ø‘ºŒšŽŸ˜Y,
‘å�¼—m
�gFM-AFM‚ÅŠÏ‚éŠE–ʉt‘Ì�\‘¢‚̉»Šw�h�@
•\–ʉȊw�iŒ¤‹†�Љî�j
34 (2013) 352-357,
[6]
–Ø‘ºŒšŽŸ˜Y
�g�‚•ª‰ð”\ƒTƒuƒT�[ƒtƒFƒXƒCƒ��[ƒWƒ“ƒO–@‚ÌŒ¤‹†�h
‚‚³‚¾‚æ‚è25�†
12ŒŽ25“ú
[7]�@–Ø‘ºŒšŽŸ˜Y,
”ü”n—E‹P,
–Ø‘ºŒ›–¾,
‹|ˆä�F‰À,
�X�N�¬,
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’†“c�¬�K,
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‹�‘å�\‘¢•¨ƒwƒ‹ƒXƒ‚ƒjƒ^ƒŠƒ“ƒO,
NTS (2015).
[8]
�––Ø‘ºŒšŽŸ˜Y�A”ü”n—E‹P�A–Ø‘ºŒ›–¾
�g“d—¬Œo˜H‰ÂŽ‹‰»‹Z�p�\’~“d’r”ñ”j‰óŒŸ�¸‚ւ̉ž—p�\�h“d‹CŠw‰ïŽ��@135Šª7�†�@�i2015�j437-440
.(Invited)
[9]”ü”n—E‹P�A–Ø‘ºŒ›–¾�A–Ø‘ºŒšŽŸ˜Y
�gƒTƒuƒT�[ƒtƒFƒXŽ¥‹CƒCƒ��[ƒWƒ“ƒOƒVƒXƒeƒ€‚ÌŠJ”‚Æ”¼“±‘̃`ƒbƒv“à•”‚Ì“d—¬Œo˜H‰f‘œ‰»‚ւ̉ž—p�h
ƒPƒ~ƒJƒ‹ƒGƒ“ƒWƒjƒ„ƒŠƒ“ƒO�@60Šª10�†�@772-778�i2015�j
[10]
–Ø‘ºŒšŽŸ˜Y
�gŒ¤‹†Žº–K–â�@�_ŒË‘åŠw‘åŠw‰@—�ŠwŒ¤‹†‰È–Ø‘ºŒ¤‹†Žº�h
ƒGƒŒƒNƒgƒ�ƒjƒNƒXŽÀ‘•Šw‰ïŽ�Vol.18�@No.7�@P511�@ �i2015”N11ŒŽ1“ú”�s�j
[11]
Œ¤‹†�¬‰Ê“WŠJŽ–‹Æ�@Œ¤‹†�¬‰Ê�Å“K“WŠJŽx‰‡ƒvƒ�ƒOƒ‰ƒ€�@
�gŽ¥‹CƒCƒ��[ƒWƒ“ƒO‘•’u
FOCUS001‚ð�¤•i‰»�@�_ŒË‘åŠw”ƒxƒ“ƒ`ƒƒ�[Šé‹Æ
Integral Geometry InstrumentsŽÐ‚ð‘n—§�h
A-STEP�¬‰Ê�W�@2014�@P57
�i2014”N9ŒŽ�j
[12]
Œ¤‹†�¬‰Ê“WŠJŽ–‹Æ�@Œ¤‹†�¬‰Ê�Å“K“WŠJŽx‰‡ƒvƒ�ƒOƒ‰ƒ€�@
�g‘åŠw”ƒxƒ“ƒ`ƒƒ�[Šé‹Æ�uIntegral
Geometry Science ŽÐ�v‚ð�Ý—§�h
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http://www.kobe-u.ac.jp/NEWS/research/2015_10_30_01.html
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[3] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
" Scanning Capacitance Force Microscopy"
The 5th International Conference on
Noncontact Atomic Force Microscopy, Montreal, 2002”N8ŒŽ
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[6] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
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Effect Transistors Investigated by Scanning Capacitance Force Microscopy �g
12th International Conference on
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[7]–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶�A‰P“c�GŽ¡�A�¼�d˜a”ü
�g‘–�¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•s�ƒ•¨•ª•z•]‰¿�h
�HŠú‘æ64‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�C•Ÿ‰ª‘åŠw 2003”N8ŒŽ
[8]–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶�A�¼�d˜a”ü
�g“ÁŽê‹¤�U�\‘¢‚ð—L‚·‚éƒJƒ“ƒ`ƒŒƒo�[‚ð—p‚¢‚½�Ód‹C—ÍŒŸ�o‚Ì�‚Š´“x‰»�h
�HŠú‘æ64‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�C•Ÿ‰ª‘åŠw 2003”N8ŒŽ
[9] K. Kimura, K. Kobayashi, H. Yamada,
K. Usuda and K. Matsushige
�gScanning Capacitance Force
Microscopy imaging of Metal –Oxide-Semiconductor Field Effect Transistors�h
AVS 50th International Symposium & Exhibition, Baltimore,
2003”N11ŒŽ
[10] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
�gScanning Capacitance Force
Microscopy imaging of Metal-Oxide-Semiconductor Field Effect Transistors�h
7th International Conference on
Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, 2003”N11ŒŽ
[11]–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶�A�¼�d˜a”ü
�g‘–�¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾(SCFM)‚É‚æ‚锼“±‘Ì•s�ƒ•¨”Z“x•]‰¿�h
�t‹G‘æ51‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�A“Œ‹ž�H‰È‘åŠw 2004”N3ŒŽ
[12]–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶�A‰P“c�GŽ¡�A�¼�d˜a”ü
�g‘–�¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•s�ƒ•¨•ª•z•]‰¿�h
�HŠú‘æ65‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�C“Œ–kŠw‰@‘åŠw 2004”N9ŒŽ
[13] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
�gDesigning Resonance Modes of AFM
Cantilevers and its Application for Probing of Electric Properties and
Operation with Ultrasmall Oscillation Amplitude�h
2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ
[14] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
�gTwo-dimensional Carrier Profiling on
Operating Si-MOSFET by Scanning Capacitance Force Microscopy�h
2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ
[15]–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶�A‰P“c�GŽ¡�A�¼�d˜a”ü
�g‘–�¸Œ^—e—ÊŒ´ŽqŠÔ—͉ƌ°”÷‹¾‹y‚Ñ‘–�¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚é“®�ì’†Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ª�h
�t‹G‘æ52‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�A�é‹Ê‘åŠw 2005”N3ŒŽ
[16] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
�gTwo-dimensional Carrier Profiling on
Operating Si-MOSFET by Scanning Capacitance Force Microscopy�h
The 8th International Workshop on the
Fabrication, Characterization and Modeling of Ultra Shallow Junctions in
Semiconductors, Florida, USA, 2005”N6ŒŽ
[17] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
�gDesigning Resonance Modes of AFM
Cantilevers for the Versatile Applications to High-Sensitive Force Detectors�h
13th International Colloquium on
Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ
[18] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
�gTwo-dimensional Carrier Profiling on
Operating Si-MOSFET by Scanning Capacitance Force Microscopy and SCM�h
13th International Colloquium on
Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ
[19]–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶�A‰P“c�GŽ¡�A�¼�d˜a”ü
�g‘–�¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é“®�ì’†Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ª�h
�HŠú‘æ66‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�A“¿“‡‘åŠw 2005”N9ŒŽ
[20]–Ø‘ºŒšŽŸ˜Y�A�¬—ÑŒ\�AŽR“cŒ[•¶�AŽ›”ö—C�¶�A�¼�d˜a”ü
�g‘–�¸Œ^ƒvƒ��[ƒuŒ°”÷‹¾‚É‚æ‚é—L‹@ELƒfƒoƒCƒXŠE–ʂɂ¨‚¯‚é2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ª�h
�HŠú‘æ66‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�A“¿“‡‘åŠw 2005”N9ŒŽ
[21] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
�gDesigning Resonance Modes of AFM
Cantilevers and its Application for Probing of Electric Properties and
Operation with Ultrasmall Oscillation Amplitude�h
2005 International Symposium on
Nonlinear Theory and its Applications, Bruges, Belgium, 2005”N10ŒŽ
[22] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
�g2D carrier profiling on operating
Si-MOSFET by SCFM and SCM�h
9th International Conference on
Non-Contact Atomic Force Microscopy, 2006”N7ŒŽ
[23]–Ø‘ºŒšŽŸ˜Y�A–x“à‹ª�A�¬—ÑŒ\�A•½˜a–FŽ÷�AŽR“cŒ[•¶�A�¼�d˜a”ü
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ª
�HŠú‘æ67‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�A—§–½ŠÙ‘åŠw�A2006”N9ŒŽ
[24] K. Kimura, T. Horiuchi, K.
Kobayashi, K. Matsushige and H.Yamada
�gHydration Force Measurements by Frequency
Modulation Dynamic Force Microscopy�h
14th International Colloquium on
Scanning Probe Microscopy, 2006”N12ŒŽ
[25] –Ø‘ºŒšŽŸ˜Y�A–x“à‹ª�A�¬—ÑŒ\�A•½˜a–FŽ÷�AŽR“cŒ[•¶�A�¼�d˜a”ü
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ª�h
�t‹G‘æ53‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�A�ÂŽRŠw‰@‘åŠw 2007”N3ŒŽ
[26]–Ø‘ºŒšŽŸ˜Y�A–x“à‹ª�A‘ååM”Í�º�A�¬—ÑŒ\�A•½˜a–FŽ÷�AŽR“cŒ[•¶�A�¼�d˜a”ü
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ª�h
“ú–{Œ°”÷‹¾Šw‰ï63‰ñŠw�p�u‰‰‰ï�AŽé�ëƒ�ƒbƒZ�VŠƒƒRƒ“ƒxƒ“ƒVƒ‡ƒ“ƒZƒ“ƒ^�[ 2007”N5ŒŽ
[27]–Ø‘ºŒšŽŸ˜Y�A–x“à‹ª�A‘ååM”Í�º�A�¬—ÑŒ\�A•½˜a–FŽ÷�A�¼�d˜a”ü�CŽR“cŒ[•¶
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹Ç�Š�…˜a�\‘¢Œv‘ª�h
�HŠú‘æ68‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�iƒvƒ��[ƒuŒ°”÷‹¾6.6�j–kŠC“¹�H‘å 2007”N9ŒŽ
[28]–Ø‘ºŒšŽŸ˜Y�A–x“à‹ª�A‘ååM”Í�º�A�¬—ÑŒ\�A•½˜a–FŽ÷�A�¼�d˜a”ü�AŽR“cŒ[•¶
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹Ç�Š�…˜a�\‘¢Œv‘ª�h
�HŠú‘æ68‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�i“Á’èƒe�[ƒ}B:�¶‘Ì•ªŽqŒv‘ª�EƒoƒCƒIƒeƒNƒmƒ�ƒW�[10.1�j–kŠC“¹�H‘å 2007”N9ŒŽ
[29] K. Kimura, T. Horiuchi, N.Oyabu,
K. Kobayashi, Y.Hirata, M.Abe, K. Matsushige, S. Morita and H.Yamada
�gLocal Solvation Force Measurements
by Frequenscy Modulation Atomic Force Microscopy�h
The 10th International NC-AFM Conference, Antalya, 2007”N9ŒŽ
[30]–Ø‘ºŒšŽŸ˜Y�AˆäŒË�Tˆê˜Y�A‘ååM”Í�º�C�¬—ÑŒ\�A�¡ˆä—²Žu�A�¼�d˜a”ü�AŽR“cŒ[•¶
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹Ç�Š—n”}˜a�\‘¢‚ÌŠÏŽ@�h
ƒ\ƒtƒgƒiƒmƒeƒNƒmƒ�ƒW�[Œ¤‹†•”‰ï�@‘æ3‰ñŒ¤‹†‰ï�@“Œ‹ž�H‘å 2008”N1ŒŽ
[31] –Ø‘ºŒšŽŸ˜Y, ˆäŒË�Tˆê˜Y, ‘ååM”Í�º, �¬—ÑŒ\, �¡ˆä—²Žu, “c�ã�Ÿ‹K, ’Ë“c�·, �¼�d˜a”ü, ŽR“cŒ[•¶
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹Ç�Š—n”}˜a�\‘¢Œv‘ª�h
�t‹G‘æ54‰ñ‰ž—p•¨—�Šw‰ïŠÖŒW˜A�‡�u‰‰‰ï,�@ “ú‘å, 2008”N3ŒŽ
[32]–Ø‘ºŒ’ŽŸ˜Y�AˆäŒË�Tˆê˜Y�A‘ååM”Í�º�C�¬—ÑŒ\�A�¡ˆä—²Žu�A�¼�d˜a”ü�AŽR“cŒ[•¶�C‘å�¼—m
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹Ç�Š—n”}˜a�\‘¢‚ÌŠÏŽ@�h
“Á’è—̈æ�u�‚ŽŸ•ªŽq‰ÈŠw�v‘æ3‰ñ�‡“¯”ljï‹c�A�VŠƒ 2008”N5ŒŽ
[33]–Ø‘ºŒšŽŸ˜Y�AˆäŒË�Tˆê˜Y�A‘ååM”Í�º�C�¬—ÑŒ\�A�¡ˆä—²Žu�A�¼�d˜a”ü�A‘å�¼—m�AŽR“cŒ[•¶
�gƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é�¶‘Ì�‚•ªŽq‚¨‚æ‚ÑŽü•Ó—n”}˜a‚Ì�\‘¢‰ð�Í�h
�_ŒË‘åŠw—�ŠwŒ¤‹†‰È�¶•¨Šw�ê�UŠw�p�u‰‰‰ï�A�_ŒË‘åŠw 2008”N7ŒŽ(Invited)
[34]–Ø‘ºŒšŽŸ˜Y�AˆäŒË�Tˆê˜Y�A‘ååM”Í�º�C�¬—ÑŒ\�A�¡ˆä—²Žu�A‘å�¼—m�AŽR“cŒ[•¶
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹Ç�Š—n”}˜a‚Ì�\‘¢‰ð�Í�h
‘æ69‰ñ‰ž—p•¨—�Šw‰ïŠwŠÖŒW˜A�‡�u‰‰‰ï�C’†•”‘åŠw 2008”N9ŒŽ
[35] K. Kimura, S.Ido, N.Oyabu,
K.Kobayashi, T.Imai, and H.Yamada
�gMolecule-Scale Hydration Structures
Investigated by Frequency Modulation Atomic Force Microscopy�h
11th International Conference on
Non-Contact Atomic Force Microscopy (NCAFM2008), Madrid 2008”N9ŒŽ
[36] K. Kimura, S.Ido, N.Oyabu,
K.Kobayashi, T.Imai, and H.Yamada
�gMolecule-Scale Hydration Structures
Investigated by Frequency modulation atomic force microscopy�h
2008 MRS Fall Meeting, Boston 2008”N12ŒŽ
[37] K. Kimura, T.Hiasa, H.Onishi
�gDevelopment of Scanning Probe
Tomography and its Application for Visualizing Internal Nanomagnetic
Structures�h
2008 MRS Fall Meeting, Boson 2008”N12ŒŽ
[38] K. Kimura, T.Hiasa, H.Onishi
�gScanning Probe Tomography Developed
for Visualising Buried Magnetic Structures�h
2008 MRS Fall Meeting, Boston 2008”N12ŒŽ
[39] K. Kimura, S.Kataoka, T.Hiasa,
A.Sasahara, H.Onishi, N.Oyabu, M.Ohta, K.Watanabe, R.Kokawa, K.Kobayashi and
H.Yamada
FM-AFM Study of Buried Metal Oxide Interfaces
The Sixth International Workshop on
Oxide Surface (IWOX-�E) 2009”N1ŒŽ
[40]–Ø‘ºŒšŽŸ˜Y
�g–„‚à‚ꂽ•¨Ž¿ŠE–ʂɂ¨‚¯‚é�\‘¢‰ð�͂̂½‚ß‚Ì�V‹K‘–�¸Œ^ƒvƒ��[ƒuŒ°”÷‹¾–@‚ÌŠJ‘ñ�h(invited)
ˆ¢“ì�H‹Æ�‚“™�ê–åŠw�Z‘æ7‰ñŠñ•��u�ÀƒZƒ~ƒi�[�Aˆ¢“ì2009”N2ŒŽ
[41] K. Kimura, T.Hiasa, H.Onishi,
M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayashi, T.Imai and H.Yamada
�gLocal Hydration Structures
Investigated by Frequency Modulation Atomic Force Microscopy�h (invited)
“ñ�‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi�[ Reent Progress in Spectroscopy and Theory in Chemistry,
Kolkata,Rep.of India 2009”N3ŒŽ
[42]–Ø‘ºŒšŽŸ˜Y�A “ú�ó�I�AˆäŒË�Tˆê˜Y�A‘ååM”Í�º�C�¬—ÑŒ\�A�¡ˆä—²Žu�A‘å�¼—m�AŽR“cŒ[•¶
�g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹Ç�Š—n”}˜a‚Ì�\‘¢‰ð�Í�h
•ªŽq‰ÈŠw“¢˜_‰ï2009�A–¼ŒÃ‰®‘åŠw 2009”N9ŒŽ
[43] K. Kimura, T.Hiasa, H.Onishi,
T.Imai, S.Ido, N.Oyabu, K.Kobayashi, H.Yamada
�gHydration Structures Studied by
Frequency Modulation Atomic Force Microscopy and 3D Referential Interaction
Site Model Theory�h
The 7th International Workshop on
Oxide Surfaces (IWOX-�E) 2010, �VŠƒ 2010”N‚PŒŽ
[44]–Ø‘ºŒšŽŸ˜Y�A“ú�ó�I�AˆäŒË�Tˆê˜Y�A‘ååM”Í�º�C�¬—ÑŒ\�A�¡ˆä—²Žu�AŽR“cŒ[•¶�A‘å�¼—m
�gAFM‚Å’T‚é‹à‘®Ž_‰»•¨ŠE–ʂ̗n‰t�\‘¢�h�iˆË—Š�u‰‰�j
“ú–{‰»Šw‰ï‘æ90�t‹G”N‰ï“Á•ÊŠé‰æ�uŒÅ‰tŠE–ʂ̗n‰t�\‘¢�v‹ß‹E‘åŠw 2010”N3ŒŽ
[45]–Ø‘ºŒšŽŸ˜Y
�gŒ©‚¦‚È‚¢‚à‚Ì‚ð�f‚é�FŒ°”÷‹¾‚ÌŒ´—��h
�‚‘å˜AŒg“Á•Ê�u‹`�A�_ŒË‘åŠw 2010”N8ŒŽ
[46]–Ø‘ºŒšŽŸ˜Y�A‹{‰ºˆ¤Žq�A–Ø‘ºŒ›–¾
�g“dŽ¥�ê‹t‰ð�Í–@‚ÌŠJ”‚ÆŽ¥�ꌰ”÷‹¾‚ւ̉ž—p�h
‘æ71‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï�C’·�è‘åŠw 2010”N9ŒŽ
[47] K. Kimura, T.Hiasa, H.Onishi,
M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayahi, T.Imai, H.Yamada
�gLiquid Structure on Solid Surface
Investigated by Atomic Force Microscopy�h (invited)
“úˆó“ñ�‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi�[�A�_ŒË 2010”N9ŒŽ
[48]–Ø‘ºŒšŽŸ˜Y
�gŽŸ�¢‘㔼“±‘̃fƒoƒCƒXŒŸ�¸‹Z�p�A�»‘¢‹Z�p‚ÉŠÖ‚·‚錤‹†�h�iˆË—Š�u‰‰�j
Šé‹Æ‚Å‚Ì�u‰‰ 2010”N10ŒŽ
[49]K.kimura
�gMaskless Electron Beam Stepper�h
�‘�ÛƒiƒmƒeƒNƒmƒ�ƒW�[‘��‡“W�A“Œ‹ž 2011”N2ŒŽ
[50]–Ø‘ºŒšŽŸ˜Y
�g“dŽq•”•i�EƒvƒŠƒ“ƒgŠî”‚̔ñ”j‰óŒŸ�¸‘•’u�h
ƒCƒmƒx�[ƒVƒ‡ƒ“ƒWƒƒƒpƒ“2011‘åŠwŒ©–{Žs�A“Œ‹ž 2011”N9ŒŽ
[51]�@–Ø‘ºŒšŽŸ˜Y
�gŽŸ�¢‘㎥‹CƒCƒ��[ƒWƒ“ƒO–@‚ÌŠJ”�h (Invited)
Šé‹Æ‚Å‚Ì�u‰‰ 2011”N11ŒŽ14“ú
[52]–Ø‘ºŒšŽŸ˜Y
�gŽŸ�¢‘㎥‹CƒCƒ��[ƒWƒ“ƒO–@‚ÌŠJ”‚Æ“dŽq•”•i‚Ì”ñ”j‰óŒŸ�¸‚ւ̉ž—p�h
semicon japan ŽŸ�¢‘ã‹Z�pƒpƒrƒŠƒIƒ“�o“WŽÒƒvƒŒƒ[ƒ“ƒe�[ƒVƒ‡ƒ“ 2011”N12ŒŽ9“ú
[53]–Ø‘ºŒšŽŸ˜Y
�g•¨Ž¿“à•”‚ð�f‚錰”÷‹¾–@‚ÌŠJ”�h (Invited)
‰ÈŒ¤”ï“Á’è—̈挤‹†�u�‚ŽŸŒn•ªŽq‰ÈŠw�v‘æ6‰ñ�‡“¯”ljï‹c 2011”N12ŒŽ10“ú
[54]–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”Í�º, ˆî’jŒ’
�g“dŽ¥�ê�Ä�\�¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ��[ƒWƒ“ƒO‘•’u‚ÌŠJ”‚Æ“dŽq•”•iŒÌ�á‰ð�͂ւ̉ž—p�h (Invited)
�‚‰·ƒGƒŒƒNƒgƒ�ƒjƒNƒXŒ¤‹†‰ï, �_“Þ�쌧 2012”N3ŒŽ‚Q‚P“ú
[55]–Ø‘ºŒšŽŸ˜Y
�gŽ¥‹CƒCƒ��[ƒWƒ“ƒO‘•’u‚Ì�‚�«”\‰»‚Æ“dŽqŽY‹Æ‰ï‚Ö‚Ì•�‹y�h
ƒCƒmƒx�[ƒVƒ‡ƒ“�„�iŽ–‹Æ�¬‰Ê•ñ��‰ï, �_ŒË 2012”N3ŒŽ‚Q‚Q“ú
[56]–Ø‘ºŒšŽŸ˜Y�A”ü”n—E‹P�A‘ååM”Í�º�Aˆî’jŒ’�A–Ø‘ºŒ›–¾
�gƒgƒ“ƒlƒ‹Ž¥‹C’ï�RŒø‰Ê‘fŽq‚ð—p‚¢‚½�‚•ª‰ð”\ƒRƒ“ƒNƒŠ�[ƒg“à•”“S‹ØŒŸ�¸‹Z�p‚ÉŠÖ‚·‚錤‹†�h
“ú–{”ñ”j‰óŒŸ�¸‹¦‰ï•½�¬24”N“x�t‹G�u‰‰‘å‰ï�u‰‰ŠT—v�Wp.89-p92�@“Œ‹ž 2012”N4ŒŽ22“ú
[57]–Ø‘ºŒšŽŸ˜Y
�g•¨Ž¿ŠE–ʂɂ¨‚¯‚é�\‘¢‚Æ“d‰×ˆÚ“®‚ð‰ÂŽ‹‰»‚·‚é‘–�¸Œ^ƒvƒ��[ƒuŒ°”÷‹¾–@‚ÌŠJ”�g
‘æ50‰ñ“ú–{�¶•¨•¨—�Šw‰ï”N‰ï�A–¼ŒÃ‰®�@2012”N9ŒŽ(Invited)
[58] K. Kimura, Y. Mima, N. Oyabu, N.
Kimura, T. Inao
�gDevelopment of magnetic field
microscopy for interconnection testing inside passivation layer�h
SSDM2012�‘�Û‰ï‹c�A‹ž“s�@2012”N9ŒŽ
[59] Yuki Mima, Noriaki Oyabu, Takeshi Inao, Noriaki Kimura,
Kenjiro Kimura
�gDevelopment
of Tunneling Magnetoresistance Microscope with Electro-Magnetic Field
Reconstruction�h
International Conference of the
Asian Union of Magnetics Societies (ICAUMS2012), “Þ—Ç�@2012”N10ŒŽ
[60]–Ø‘ºŒšŽŸ˜Y
�gƒiƒmƒVƒXƒeƒ€‚Ì‘å‹K–Í�W�ω»‚ÉŒü‚¯‚½�‚‘¬“dŽq�ü˜IŒõ–@‚ÌŠJ”�g
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�@
[61]–Ø‘ºŒšŽŸ˜Y
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[62]–Ø‘ºŒšŽŸ˜Y
�g“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ��[ƒWƒ“ƒO‹Z�p�š“O’ê‰ð�à
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Electronic Journal ‘æ1564‰ñTechnical Seminar, “Œ‹ž 2013”N1ŒŽ
[63]–Ø‘ºŒšŽŸ˜Y
�gŒ¤‹†ƒV�[ƒY�Eƒxƒ“ƒ`ƒƒ�[—§‚¿�ã‚°�h�iˆË—Š�u‰‰�j
�_ŒËˆã—ÃŽY‹Æ“sŽs�@ƒNƒ‰ƒXƒ^�[Œð—¬‰ï�A�_ŒË 2013”N2ŒŽ
[64]–Ø‘ºŒšŽŸ˜Y
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“ú–{•ª�͉»Šw‰ï‘æ62”N‰ï�@—n‰tŠE–ÊŒ¤‹†�§’k‰ï�A‘å�ã 2013”N9ŒŽ
[65]–Ø‘ºŒšŽŸ˜Y
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FC EXPO2014ƒAƒJƒfƒ~ƒbƒNƒtƒH�[ƒ‰ƒ€�A“Œ‹ž,
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imaging inside
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[76] –Ø‘ºŒšŽŸ˜Y
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[78] –Ø‘ºŒšŽŸ˜Y
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[79] –Ø‘ºŒšŽŸ˜Y�CŒü“a”ž�C–Ø‘ºŒ›–¾�CŽO–Ø–œ—RŽq�C�‚”ö�M‘¾˜Y
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[80] –Ø‘ºŒšŽŸ˜Y�@
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[81] –Ø‘ºŒšŽŸ˜Y�@
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’~“d’rƒ��[ƒJ‚Å‚Ì�u‰‰�iˆ¤’mŒ§�j�C2015”N4ŒŽ20“ú(Invited)
[82]–Ø‘ºŒšŽŸ˜Y�@–ì–{˜a�½�A”ü”n—E‹P�A–Ø‘ºŒ›–¾
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[83] –Ø‘ºŒšŽŸ˜Y
‘æ‚T‰ñŠÖ�¼’nˆæ‘åŠwŒ¤‹†Žx‰‡ƒXƒ^ƒbƒtƒ~�[ƒeƒBƒ“ƒO,�h–Ø‘ºŒ¤‹†Žº‚ÌŠˆ“®, Šú‘Ò‚·‚錤‹†�¬‰Ê‚̃AƒEƒgƒŠ�[ƒ`Žx‰‡�h, �_ŒË‘åŠw 2015”N8ŒŽ2“ú(Invited).
[84] –Ø‘ºŒšŽŸ˜Y
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[85] –Ø‘ºŒšŽŸ˜Y
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[86] –Ø‘º ŒšŽŸ˜Y�C–Ø‘º Œ›–¾�C�L—˜ �_ˆê�C‹´–{ ’m‹v�C�²‹vŠÔ �iŽq�CŽO–Ø –œ—RŽq�C�‚”ö �M‘¾˜Y
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[87] �›”ü”n —E‹P, –ì–{ ˜a�½,–Ø‘º Œ›–¾, –Ø‘º ŒšŽŸ˜Y
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[88] �›–Ø‘ºŒšŽŸ˜Y, “c‘º�¹ˆ», –Ø‘ºŒ›–¾, ŽR‰º—SŽi, ‰Í–ì�½”V�C“c’†—DŽq�CŽO–Ø–œ—RŽq�C�L—˜�_ˆê,
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Šw‰ï”•\�i‹¤’˜�j
(1) S. Ido, K. Kimura, N. Oyabu, K.
Kobayashi, Y. Hirata & H. Yamada,
High-resolution Imaging of Biomolecules
in Liquids by FM-AFM.
11th International Conference on
Non-contact Atomic Force Microscopy, We-1450, Madrid, Spain (2008). Ξһӥ\
(2) ˆäŒË �Tˆê˜Y�C–x“à ‹ª�C‘ååM ”Í�º�C–Ø‘º ŒšŽŸ˜Y�C�¬—Ñ Œ\�C�¼�d ˜a”ü�CŽR“c Œ[•¶�C•½“c –FŽ÷�C�¯ Ž¡�C‹�–Ø ’C’j,
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�uŽü”g�”•Ï’²•ûŽ®AFM‚ð—p‚¢‚½ƒvƒ‰ƒXƒ~ƒhDNA‚̉t’†�‚•ª‰ð”\ŠÏŽ@�v
2008”N�t‹G ‘æ55‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï, 29p-Q-6, “ú–{‘åŠw (2008”N). Œû“ª”•\
(4) ˆäŒË �Tˆê˜Y�C–x“à ‹ª�C‘ååM ”Í�º�C–Ø‘º ŒšŽŸ˜Y�C�¬—Ñ Œ\�C�¼�d ˜a”ü�CŽR“c Œ[•¶�C•½“c –FŽ÷�C�¯ Ž¡�C‹�–Ø ’C’j,
�uŽü”g�”•Ï’²ŒŸ�o•ûŽ®AFM‚ð—p‚¢‚½�¶‘Ì�‚•ªŽq‚̉t’†�‚•ª‰ð”\ŠÏŽ@�v
2008”N�H‹G ‘æ69‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 4a-L-3, ’†•”‘åŠw (2008”N). Œû“ª”•\
�i5�j •Љª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m
Œõ“d’…–@‚ð—p‚¢‚Ä”’‹à‚ð’SŽ�‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–ʂ̌¤‹†, “Á’è—̈挤‹†�u�‚ŽŸ•ªŽqŒn‰ÈŠw�v‘æ3‰ñ�‡“¯”Á‰ï‹c, 2008,
�i6�j •Љª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ�‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“ƒ‚ƒfƒ‹�G”}‚ÌAFMŠÏŽ@, ‘æ102‰ñ�G”}“¢˜_‰ï, 2008,
�i7�j
K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, H. Yamada.
Molecular-scale Hydration Structures Investigated
by Frequency Modulation Atomic Force Microscopy,
11th International Conference on
Non-contact Atomic Force Microscopy (NCAFM2008), 2008,
�i8�j •Љª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ�‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚ÌSPMŠÏŽ@,
‘æ69‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 2008,
�i9�j Kenjiro Kimura, Takumi Hiasa,
Hiroshi Onishi.
Development of scanning probe
tomography and its application for visualizing internal nanomagnetic
structures,
2008 MRS Fall Meeting, 2008,
�i10�jTakumi Hiasa, Suzumi Kataoka, Kenjiro
Kimura, Hiroshi Onishi.
Scanning probe study of TiO2 surfaces
placed in reactive environments,
2008 MRS Fall Meeting, 2008,
�i11�j Suzumi Kataoka, Takumi Hiasa,
Kenjiro Kimura, Hiroshi Onishi.
SPM Observation of Pt Nanoparticles
Photodeposited on TiO2(110),
2008 MRS Fall Meeting, 2008,
�i12�j •Љª—Á”ü, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, •²�ì—Ç•½, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Œõ“d’…–@‚Å�ì�¬‚µ‚½”’‹à’SŽ�Ž_‰»ƒ`ƒ^ƒ“�G”}‚̃vƒ��[ƒuŒ°”÷‹¾ŠÏŽ@,
�G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[�[ƒVƒ‡ƒ“�u�K‰ï, 2008,
�i13�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, •²�ì—Ç•½, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–ʂ̊ώ@,
�G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[�[ƒVƒ‡ƒ“�u�K‰ï, 2008,
�i14�jSuzumi Kataoka, Takumi Hiasa, Kenjiro
Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe,
Noriyuki Oyabu, Kei Kobayashi, Hirofumi Yamada.
AFM study of Pt Nanoparticles on
TiO2(110) Deposited in Solutions,
The 16th International Colloquim on
Scanning Probe Microscopy, 2008,
�i15�j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Noriyuki
Oyabu, Kei Kobayashi, Hirofumi Yamada.
Solvation Structures at a
Solution-TiO2 Interface Studied by Frequency-Modulation Atomic Force
Miscroscopy,
The 16th International Colloquim on
Scanning Probe Microscopy, 2008,
�i16�j Keita Fujio, Kenjiro Kimura, Naoki
Koide, Hiroshi Onishi.
FM-AFM Study of Dye-Adsorbed TiO2(110)
Electrodes,
The 16th International Colloquim on
Scanning Probe Microscopy, 2008,
�i17�j“ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Œõ�G”}”½‰ž�ê‚É‚¨‚¯‚é‹Ç�Š�…˜a�\‘¢Œv‘ª,
�_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^�[ŽáŽèƒtƒ�ƒ“ƒeƒBƒAŒ¤‹†‰ï2008,
�i18�j
•Љª—Á”ü, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
”’‹à’SŽ�“ñŽ_‰»ƒ`ƒ^ƒ“•\–ʂ̑g�¬�E�\‘¢•ª�Í,
�_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^�[ŽáŽèƒtƒ�ƒ“ƒeƒBƒAŒ¤‹†‰ï2008, 2008,
�i19�j“ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Ž_‰»ƒ`ƒ^ƒ“-�…—n‰tŠE–ʂɂ¨‚¯‚é‹Ç�Š�…˜a�\‘¢‚ÌFM-AFM‰ð�Í,
“ú–{‰»Šw‰ï‘æ89�t‹G”N‰ï, 2009,
�i20�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é�…—n‰t-“ñŽ_‰»ƒ`ƒ^ƒ“ŠE–ʂ̋Ç�Š—n”}˜a�\‘¢‰ð�Í,
�t‹G‘æ56‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï, 2009,
�i21�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹à‘®Ž_‰»•¨‚Ì‹Ç�Š�…˜a�\‘¢‰ð�Í,
‘æ70‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 2009,
�i22�j �A“c�^�s, –Ø‘ºŒ’ŽŸ˜Y, ‘å�¼—m.
TiO2(110)•\–ʂɋz’…‚µ‚½Ž_‘fŒ´Žq‚Ì‹zŠj”½‰ž�«,
‘æ104‰ñ�G”}“¢˜_‰ï, 2009,
�i23�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†“®�쌴ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨-�…—n‰tŠE–ʂ̉ð�Í,
‘æ29‰ñ•\–ʉȊwŠw�p�u‰‰‰ï, 2009,
�i24�j “¡”öŒc‘¾, �¬�o’¼�é, •ÐŽR”Ž”V, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Žü”g�”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é�F‘f‘�Š´“d‹Éƒ‚ƒfƒ‹‚ÌŠÏŽ@,
‘æ29‰ñ•\–ʉȊwŠw�p�u‰‰‰ï, 2009,
�i25�jT. Hiasa, K. Kimura, H. Onishi, R.
Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
Local Hydration Structures on Metal
Oxides Investigated by Frequency-Modulation Atomic Force Microscopy,
The 7th International Workshop on
Oxide Surfaces (IWOX-VII), 2010,
�i26�j M. Ueda, M. Yasuo, K. Kimura, H.
Onishi.
Nucleophilic Reactivity of Oxygen Adatoms
on a TiO2(110) Surface,
The 7th International Workshop on
Oxide Surfaces (IWOX-VII), 2010,
�i27�j Keita Fujio, Naoki Koide, Hiroyuki
Katayama, Kenjiro Kimura, Hiroshi Onishi.
FM-AFM Observation of Dye-Sensitized TiO2
Electrodes,
The 7th International Workshop on Oxide
Surfaces (IWOX-VII), 2010,
�i28�j Keita Fujio, Kenjiro Kimura, Naoki
Koide, Hiroyuki Katayama, Hiroshi Onishi.
Dye-Adsorbed TiO2(110) Electrodes Studied
with FM-AFM,
The 17th International Colloquim on
Scanning Probe Microscopy (ICSPM-17), 2009,
�i29�j“ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–ʂ̗n”}˜a�\‘¢‰ð�Í,
“ú–{‰»Šw‰ï‘æ90�t‹G”N‰ï, 2010,
�i30�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚�[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鎩ŒÈ‘g�D‰»’P•ªŽq–Œ‚Ì”ñ�…—n”}’†ŠÏŽ@,
�t‹G‘æ57‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï, 2010,
�i31�jT. Hiasa, K. Kimura, H. Onishi, R.
Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
Force Spectroscopy at Liquid-Oxide
Interfaces,
The 12th International Scanning Probe
Microscopy Conference, 2010,
�i32�j T. Sugihara, T. Hiasa, H. Onishi, K.
Kimura, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada, T.
Iwasaki, Y. Fukami.
FM-AFM Study of Proteins on Lipid Rafts,
The 12th International Scanning Probe
Microscopy Conference, 2010,
�i33�j�¡“c”Ž�ä, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, �]ŒûŒ’ˆê˜Y, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶, ‘å�¼—m.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éCaCO3”÷—±Žq‚̉t’†�‚•ª‰ð”\ŠÏŽ@,
“ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠw�p�u‰‰‰ï, 2010,
�i34�j �¡“c”Ž�ä, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, �]ŒûŒ’ˆê˜Y, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶, ‘å�¼—m.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é”÷—±Žq‚Ì�‚•ª‰ð”\ŠÏŽ@,
“ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠw�p�u‰‰‰ï, 2010,
�i35�j T. Hiasa, K. Kimura, H.
Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi,
H. Yamada.
FM-AFM study of thiol-modified gold
films immersed in organic solvents,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
�i36�j Keita Fujio, Naoki Koide, Hiroyuki
Katayama, Kenjiro Kimura, Hiroshi Onishi.
NC-AFM study of dye-sensitized TiO2
electrodes,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
�i37�j T. Hiasa, K. Kimura, H. Onishi, R.
Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
FM-AFM Study on Hydrophilic and
Hydrophobic Metal Oxides,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
�i38�j M. Yamazaki, T. Hiasa, M. Ohta, K.
Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada, T. Hiasa, K.
Kimura, H. Onishi.
Solution-Polyethylene Interface Studied
by FM-AFM,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
�i39�j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi
Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
FM-AFM Study of Hydration at
Water-Metal Oxides Interfaces,
The International Chemical Congress
of Pacific Basin Societies (PACIFICHEM 2010), 2010,
�i40�j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi
Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
Kelvin Probe Force Microscope Study
of Impregnated Pt/ TiO2 Catalyst Models,
The International Chemical Congress of
Pacific Basin Societies (PACIFICHEM 2010), 2010,
�i41�j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi
Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
FM-AFM Study of Organic Solvents
Interfaced with a Thiol-Modified Gold Surface,
The International Chemical Congress
of Pacific Basin Societies (PACIFICHEM 2010), 2010,
�i42�j M. Yamazaki, T. Hiasa,
M. Ohta, K. Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada,
T. Hiasa, K. Kimura, H. Onishi.
FM-AFM Study of Solution-Soft Matter
Interfaces,
17th International Microscopy
Congress (IMC-17), 2010,
�i43�j“ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–ʂ̗n”}˜a�\‘¢Œv‘ª,
“Á’è—̈挤‹†�u�‚ŽŸŒn•ªŽq‰ÈŠw�v‘æ5‰ñ�‡“¯”ljï‹c, 2010,
�i44�j“ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, •²�ì—Ç•½, ‘å“c�¹�O, “n糈ê”V, ŽR�è�«Žk, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–ʂ̗n‰t�\‘¢‚ÌŒŸ“¢,
•ªŽq‰ÈŠw“¢˜_‰ï2010, 2010,
�i45�j “Œ—Yˆê, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶
�Ód‹C—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨‚Ì•\–Ê“dˆÊ•ª•zŒv‘ª,
‘æ71‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 2010,
�i46�j
T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M.
Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
Force Spectroscopy at Liquid-Solid
Interfaces,
The 6th International Workshop on
Nano-scale Spectroscopy and Nanotechnology (NSS6), 2010,
�i47�j�¬”¨ŒbŽq, ‘å�¼—m, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y.
“dŽ¥�ê‹t‰ð�Í–@‚É‚æ‚鎥‹C‹L˜^”}‘̂̎OŽŸŒ³Ž¥�ꕪ•zŒv‘ª,
‘æ30‰ñ•\–ʉȊwŠw�p�u‰‰‰ï, 2010,
�i48�j �™Œ´’m‹I, —шí•à, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒyƒvƒ`ƒhƒiƒmƒ`ƒ…�[ƒu‚ÌŠÏŽ@,
“Á’è—̈挤‹†�u�‚ŽŸŒn•ªŽq‰ÈŠw�v‘æ4‰ñŒöŠJƒVƒ“ƒ|ƒWƒEƒ€, 2010,
�i49�j Masashi Yamazaki, Ryohei Kokawa,
Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi,
Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
FM-AFM Study of Polyethylene-Adsorbed
Graphite Immersed in Water,
The 18th International Colloquim on
Scanning Probe Microscopy, 2010,
�i50�j Tomoki Sugihara, I. Hayashi, Takumi
Hiasa, Kenjiro Kimura, A. Tamura, Hiroshi Onishi, Masahiro Ohta, Kazuyuki
Watanabe, Ryohei Kokawa, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
Peptide Nanotubes Observed by
Frequency-Modulation Atomic Force Microscopy,
The 18th International Colloquim on
Scanning Probe Microscopy, 2010,
�i51�j —é–Ø’qŽq, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI�[ƒ‹Ž©ŒÈ‘g�D‰»’P•ªŽq–Œ‚ÌŠÏŽ@,
“ú–{‰»Šw‰ï‘æ91�t‹G”N‰ï, 2011,
�i52�j“ú�ó�I, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI�[ƒ‹Ž©ŒÈ‘g�D‰»’P•ªŽq–Œ�ã‚Ì�…—n‰t�\‘¢‚ÌŒŸ“¢,
“ú–{‰»Šw‰ï‘æ91�t‹G”N‰ï, 2011,
�i53�j�¼‰ª—˜“Þ, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒ�ƒAƒjƒŠƒ“Œ‹�»‚Ì•\–ÊŠÏŽ@,
“ú–{‰»Šw‰ï‘æ91�t‹G”N‰ï, 2011,
�i54�jŽR�è�«Žk, •²�ì—Ç•½, ‘å“c�¹�O, “n糈ê”V, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
ƒOƒ‰ƒtƒ@ƒCƒg�ã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚Ì�ƒ�…’†FM-AFMŠÏŽ@,
�t‹G‘æ58‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï, 2011,
�i55�j“ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
ˆÙ‚È‚é�æ’[Œa‚ð‚à‚Â’T�j‚ð—p‚¢‚½‰t’†FM-AFMŒv‘ª,
�t‹G‘æ58‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï, 2011,
�i56�j�¼‰ª—˜“Þ, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒ�ƒAƒjƒŠƒ“Œ‹�»‚Ì•\–ÊŠÏŽ@,
Œ¤‹†‰ï�u•¨—�‰»Šw“IŽè–@‚É‚æ‚é�V‹K•\–Ê•]‰¿�v, 2011,
�i57�j “ú�ó�I, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m, ‘å“c�¹�O, “n粈ê”V, ŽR�è�«Žk, •²�ì—Ç•½, ‘ååM”Í�º, �¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI�[ƒ‹Ž©ŒÈ‘g�D‰»’P•ªŽq–Œ�ã‚Ì�…—n‰t�\‘¢‚ÌŒŸ“¢,
Œ¤‹†‰ï�u•¨—�‰»Šw“IŽè–@‚É‚æ‚é�V‹K•\–Ê•]‰¿�v, 2011,
�i58�j •²�ì—Ç•½, ŽR�è�«Žk, ‘å“c�¹�O, “n糈ê”V, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
ƒOƒ‰ƒtƒ@ƒCƒg�ã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚Ì�ƒ�…’†FM-AFMŠÏŽ@,
Œ¤‹†‰ï�u•¨—�‰»Šw“IŽè–@‚É‚æ‚é�V‹K•\–Ê•]‰¿�v, 2011,
�i59�j �â—´“T, ‘å�¼—m, –Ø‘ºŒšŽŸ˜Y.
’á‰·ŽŽ—¿ƒzƒ‹ƒ_�[‚ÌŠJ”‚Ɖt’†“®�ìŽü”g�”•Ï’²•ûŽ®AFM‚ւ̉ž—p,
‘æ72‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 2011,
�i60�j“ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
FM-AFM‚É‚æ‚é�e�…�«’P•ªŽq–Œ�ã‚Ì�…—n‰t�\‘¢‚̉ð�Í,
‘æ72‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 2011,
�i61�j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi.
Hydration to Hydrophilic Monolayers
Visualized by FM-AFM,
14th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,
�i62�j —é–Ø’qŽq, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
ƒAƒ‹ƒJƒ“ƒ`ƒI�[ƒ‹’P•ªŽq–Œ‚É�Ú‚·‚éƒwƒLƒTƒfƒJƒ“‰t‘Ì‚Ì�\‘¢,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
�i63�j�¡“c”Ž�ä, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’YŽ_ƒJƒ‹ƒVƒEƒ€‚̉t’†ŠÏŽ@,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
�i64�j �¼‰ª—˜“Þ, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Žü”g�”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½p-ƒjƒgƒ�ƒAƒjƒŠƒ“-‰t‘ÌŠE–ʂ̊ώ@,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
�i65�j �™Œ´’m‹I, —шí•à, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘å�¼—m.
ƒOƒ‰ƒtƒ@ƒCƒg-‰t‘ÌŠE–Ê‚É�W�Ï‚µ‚½ƒyƒvƒ`ƒhƒiƒmƒ`ƒ…�[ƒu‚Ì�\‘¢,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
�i66�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI�[ƒ‹’P•ªŽq–Œ�ã‚̉t‘Ì�\‘¢‚̉ð�Í,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
�i67�jRyohei Kokawa, Masashi Yamazaki,
Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi
Onishi. FM-AFM study of
n-Alkane-Adsorbed Graphite Immersed in Liquids,
14th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,
�i68�j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
High-Resolution FM-AFM Imaging of
Calcite Particles in Water,
International Symposium on Surface
Science (ISSS6), 2011,
�i69�jHirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
High-resolution imaging of CaCO3
particles in liquid by FM-AFM,
Japan-Finland Joint Seminar of
Material Science, 2011,
�i70�j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi.
Interfacial Liquids Visualized by
Frequency-Modulation AFM,
International Association of Colloid and
Interface Scientists, Conference (IACIS2012), 2012,
�i71�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é�e�…�«’P•ªŽq–Œ�ã‚̉t‘Ì�\‘¢‚ÌŒŸ“¢,
“ú–{‰»Šw‰ï‘æ92�t‹G”N‰ï, 2012,
�i72�j
Rina Nishioka, Takumi Hiasa, Hiroshi Onishi, Kenjiro Kimura.
Interfacial Water over p-Nitroaniline
(101) Surface,
15th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2012), 2012,
�i73�j “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
FM-AFM ‚É‚æ‚édecanol/HOPG ŠE–Ê‚Ì�\‘¢‰ð�Í,
‘æ73‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 2012,
�i74�j “ú�ó�I, –Ø‘ºŒ’ŽŸ˜Y, ‘å�¼—m.
�e�…�E‘a�…Šî‚ð‹¤‘¶‚³‚¹‚½•\–Ê�ã‚Ì�…˜a�\‘¢ŠÏŽ@,
‘æ6‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2012, 2012,
�i75�j
�¼‰ª—˜“Þ, “ú�ó�I, ‘å�¼—m, –Ø‘ºŒšŽŸ˜Y.
ƒjƒgƒ�ƒxƒ“ƒ[ƒ“—U“±‘ÌŒ‹�»-�…ŠE–Ê‚ÌFM-AFM‚ð—p‚¢‚½�\‘¢‰ð�Í,
‘æ32‰ñ•\–ʉȊwŠw�p�u‰‰‰ï, 2012,
�i76�j
�¡“c”Ž�ä, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Žü”g�”ŒŸ�o•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒJƒ‹ƒTƒCƒg-�…—n‰tŠE–Ê‚Ì�\‘¢‰ð�Í,
‘æ32‰ñ•\–ʉȊwŠw�p�u‰‰‰ï, 2012,
�i77�j “c’†—T—S, –Ø‘ºŒšŽŸ˜Y, Ž}˜a’j, ‘å�¼—m.
�¸‰Ø�«Œ‹�»‚ÌŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‘å‹C’†ŠÏŽ@,
‘æ32‰ñ•\–ʉȊwŠw�p�u‰‰‰ï, 2012,
�i78�j Yuki Mima, Noriaki Oyabu, Takeshi
Inao, Noriaki Kimura, Kenjiro Kimura.
Development of Tunneling Magnetoresistance
Microscope with Electro-Magnetic Field Reconstruction,
International Conference of the Asian
Union of Magnetics Societies (ICAUMS2012), 2012,
�i79�j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi.
FM-AFM Observation on Mercaptohexanol
Monolayer in Aqueous Solution,
The 20th International Colloquim on
Scanning Probe Microscopy, 2012,
�i80�j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
Water and 2-Propanol Structured on
Calcite (104): An Atomic Force Microscopy Study (invited),
Japan-Korea Joint Symposium on
Frontiers in Molecular Science -From Quantum to Life-, 2013,
�i81�j
�…Œõ�r‰î, “ú�ó�I, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
Žü”g�”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’¼�½ƒAƒ‹ƒR�[ƒ‹-ƒ}ƒCƒJŠE–ʂ̊ώ@,
“ú–{Œ°”÷‹¾Šw‰ï‘æ69‰ñŠw�p�u‰‰‰ï, 2013,
�i82�j
Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.
Interfacial Water over CaCO3 probed by
FM-AFM,
33rd International Conference on Solution
Chemistry, 2013,
�i83�j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
Interfacial Water and 2-Propanol over
CaCO3 probed by FM-AFM,
16th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2013), 2013,
�i84�j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
Water and 2-Propanol Structured on Calcite (104): Imaging by
Frequency-Modulation AFM,
‘æ64‰ñƒRƒ�ƒCƒh‚¨‚æ‚ÑŠE–ʉ»Šw“¢˜_‰ï“ú�‹ƒVƒ“ƒ|ƒWƒEƒ€, 2013,
�i85�j �…Œõ�r‰î, “ú�ó�I, –Ø‘ºŒ’ŽŸ˜Y, ‘å�¼—m.
Žü”g�”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒ}ƒCƒJ�ã‚Ì’¼�½ƒAƒ‹ƒR�[ƒ‹‚̉t‘Ì�\‘¢‚̉ð�Í,
‘æ7‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2013, 2013,
�i86�j
“à“cŒö“T, ŽO“cˆêŽ÷, �¼‰ª�C, ˆÉ�茒�°, –Ø‘ºŒšŽŸ˜Y, ‘å�¼—m.
ˆê޲‰„�LƒAƒCƒ\ƒ^ƒNƒ`ƒbƒNƒ|ƒŠƒvƒ�ƒsƒŒƒ“‚ÌŽü”g�”•Ï’²ŒŸ�o•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŠÏŽ@,
‘æ63‰ñ�‚•ªŽq“¢˜_‰ï, 2014,
(87) ”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
�uƒ‰ƒhƒ“•ÏŠ·‚É‚æ‚鎥‹CƒCƒ��[ƒWƒ“ƒO‚Ì�‚•ª‰ð”\‰»�v,
‘æ73‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï, 11a-C10-7, ˆ¤•Q, 2012”N9ŒŽ
(88) ”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
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�_ŒË‘åŠw—�Šw•”ƒz�[ƒ€ƒJƒ~ƒ“ƒOƒfƒC‘æ3‰ñƒTƒCƒGƒ“ƒXƒtƒ�ƒ“ƒeƒBƒAŒ¤‹†”•\‰ï, �_ŒË, 2012”N10ŒŽ
(89) ”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
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‘æ53‰ñ“d’r“¢˜_‰ï, 3A16, •Ÿ‰ª, 2012”N11ŒŽ
(90) ”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
�u“dŽ¥�ê�Ä�\�¬-Ž¥‹C’ï�RŒø‰ÊŒ°”÷‹¾‚ð—p‚¢‚½“d‰×ˆÚ“®‚̉Ž‹‰»�v,
�_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^�[ŽáŽèƒtƒ�ƒ“ƒeƒBƒAŒ¤‹†‰ï 2012, P063, �_ŒË, 2012”N12ŒŽ
(91) ”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
�u“dŽ¥�ê�Ä�\�¬ƒgƒ“ƒlƒ‹Ž¥‹C’ï�RŒø‰ÊŒ°”÷‹¾‚ÌŠJ”‚Æ“d’r“à•”‚É‚¨‚¯‚é“d‰×ˆÚ“®‰ÂŽ‹‰»‚ւ̉ž—p�v,‘æ54‰ñ“d’r“¢˜_�E�E 3F17, ‘å�ã, 2013”N10ŒŽ
”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y, ‘æ54 ‰ñ“d’r“¢˜_‰ï �u‰‰—vŽ|�W p.423 (2013)
(92) Y. Mima, N. Oyabu, K. Inao, N.
Kimura, and K. Kenjiro:
�gDevelopment of
tunnelingmagnetoresistance microscope with electromagnetic field
reconstruction�h
International Conference of the Asian Union
of Magnetics Societies 2012, 2pPS-114, Japan, Oct. 2012.
(93) ”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
�u“d’r“à•”‚Ì“d—¬•ª•z‚̉f‘œ‰» - �‚•ª‰ð”\Ž¥‹CƒCƒ��[ƒWƒ“ƒO‘•’u‚ÌŠJ” -�v,
FC EXPO 2013 �`‘æ9‰ñ [�‘�Û] �…‘f�E”R—¿“d’r“W�`, “Œ‹ž, 2013”N2ŒŽ
(94) ”ü”n—E‹P, ‘ååM”Í�º, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
�u“d—¬Œo˜H‚Ì”ñ”j‰ó‰f‘œ‰»‘•’u‚ÌŽÀ—p‰»�]“dŽq•”•i, ƒvƒŠƒ“ƒgŠî”Â, “d’r‚Ì•s—ljð�͂ւ̉ž—p�]�v
JPCA2013�]‘æ43‰ñ�‘�Û“dŽq‰ñ˜HŽY‹Æ“W�],“Œ‹ž,2013”N6ŒŽ
(95) Yuki Mima, Noriaki Oyabu,
Takeshi Inao, Noriaki Kimura, Kenjiro Kimura:
Failure analysis of electric circuit
board�@by high resolution magnetic field
microscopy
IEEE CPMT Symposium Japan (Formerly VLSI
Packaging Workshop of Japan)2013,Session19:Reliability2,Japan,Nov.2013.
(96) ”ü”n —E‹P,–ì–{ ˜a�½,‘ååM ”Í�Ð,–Ø‘º Œ›–¾,–Ø‘º ŒšŽŸ˜Y
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(97) –ì–{ ˜a�½,”ü”n —E‹P,‘ååM ”Í�º,–Ø‘º Œ›–¾,–Ø‘º ŒšŽŸ˜Y
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(98) •ЉªŠ°�K�C‘�“c—T‹P�C–Ø‘ºŒšŽŸ˜Y�C’ƒ’JŠG—�
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