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‘åŠw‰@—ŠwŒ¤‹†‰È –Ø‘ºŒšŽŸ˜Y Œ¤‹†Žº

 

 

Basic Concept of  Dr. K.Kimura Group Research

 

‘æˆê‰ñ“ú–{ˆã—ÃŒ¤‹†ŠJ”­‘åÜ

 

*_ŒËŽs‚ÌŽæÞ

 

* Research

1, Noninvasive breast imaging

 

Advertisement for human subjects about next-generation scattering field

mammography (2016 fall~) (Japanese version)

 

2, Nondestructive subsurface electric current imaging

@Ž¥êˆêŽ®i“ú–{ŒêAEnglishj

NEDO article pressed on May 29

 

–“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€

 

*High spatial resolution imaging using magnetic field reconstruction based on the mathematics – Integral Geometry -.

 

*Electric current distribution imaging inside rechargeable battery.

 

*High-speed imaging for observing time-dependance phenomeana.

 

Documents of Magnetic imaging

 

 

3, Nondestructive subsurface imaging for Concrete Infrastructure Sustainability

 

*‘—§Œ¤‹†ŠJ”­–@l‰ÈŠw‹ZpU‹»‹@\‚ÌŽæÞ

 

 

 

 

Catalog and paper of magntici field imaging (in Japanese) (pass)

Catalog and paper of magntici field imaging (in English) (pass)

 

 

 

 

 

                                                                                                                                     

* Core member of K. Kimura Group

Kenjiro Kimura (PI)

Akari Inagaki

Seijyu Matsuda

Shogo Suzuki

Yoshinobu Yasui

Yoshiki Hidaka

Mai Ishida

Ryuichi Taguchi

Shiori Maezawa

 

*Cooperation company for measurement and analysis system research

Integral Geometry Science inc.: JST & AMED member

Noriaki Kimura

Kyoji Doi

Akane Uoi

Yuki Mima

Miho samejima

 

*Member of cooperation company

Takeshi Inao

Kazuki Hoshijima

 

Ex-member of Kimura research group

Baku Kohden

Hiroyuiki kataoka

Kazuya Nishikawa

Kazunori Nomoto

Keiko Kobata

Akari Masuda

Tomoko Suzuki

Rina Nishioka

Satoshi Seike

Tomoki Sugihara

Ryusuke Ban

Yuichi Higashi

Yusuke Ikeda

Moyuko Hosokawa

 

Œ¤‹†‹ÆÑ

˜_•¶

[1] K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige

"Two-dimensional dopant profiling by scanning capacitance force microscopy"

Applied Surface Science 2003”N 210Šª 93-98.

 

[2] T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige,

"Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method"

Applied Physics Letter 2004”N 25Šª 6287-6289.

 

[3] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

"Scanning capacitance force microscopy imaging of metal-oxide-semiconductor field effect transistors"

Journal of Vacuum Science and Technology B 2005”N 23Šª 1454-1458.

 

[4 ] T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige

gFrequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection methodh

Review of Scientific Instruments 2005”N76Šª 126110(1-3).

 

[5] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

" TWO-DIMENSIONAL CARRIER PROFILING ON OPERATING SIMOSFET BY SCANNING CAPACITANCE MICROSCOPY"

Proceedings of the 8th International Workshop on the Fabrication, Characterization and Modeling of Ultra Shallow Junctions in Semiconductors 2005”N 127.

 

 

[6] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

"Two-dimensional carrier profiling on operating Si-MOSFET by scanning capacitance microscopy"

Journal of Vacuum Science and Technology B 2006”N 24Šª 1371-1376.

 

[7] K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige

"Improving sensitivity in electrostatic force detection utilizing cantilever with tailored resonance modes"

Applied Physics Letter 2007”N 90Šª 053113(1-3).

 

[8] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

"Noncontact-mode scanning capacitance force microscopy towards quantitative tow-dimensional carrier profiling on semiconductor devices"

Applied Physics Letter 2007”N 90Šª 083101(1-3).

 

[9] T. Hiasa, K. Kimura, H. Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K.  Kobayashi, H. Yamada,

gSolution-TiO2 Interface Probed by Frequency-Modulation Atomic Force Microscopyh

Japanese Journal of Applied Physics 2009”N 48Šª, 08JB19 (1-3).

 

[10] K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, Y. Hirata, T. Imai, H. Yamada

gVisualizing water molecule distribution by atomic force microscopy"

Journal of Chemical Physics 2010”N 132Šª, 194705(1-5).

 

[11] T. Hiasa, K. Kimura, H. Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada

gAqueous Solution Structure over ƒ¿-Al2O3(01-12) Probed by Frequency-Modulation Atomic Force Microscopyh@Journal of Physical Chemistry C 2010”N 114Šª, 21423-21426.

 

[12] K. Fujio, K. Kimura, N. Koide, H. Katayama, H. Onishi.

gBlack-Dye-Adsorbed TiO2 (110) Electrodes Studied by Frequency-Modulation Atomic Force Microscopyh Japanese Journal of Applied Physics 2010”N49Šª, 08LB06(1-3).

 

[13] Y. Ando, T. Sugihara, K. Kimura, A. Tsuda.

A Self-Assembled Helical Anthracene Nanofibre Whose P- and M-Isomers Show Unequal Linear Dichroism in a Vortex, Chemical Communications 47 (2011) 11748-11750,

 

[14] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

"Hydration of hydrophilic thiolate monolayers visualized by atomic force microscopy" 

    Phys. Chem. Chem. Phys.  14(2012)8419-8424

 

[15] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi

"Two-dimensional distribution of liquid hydrocarbons facing alkanethiol monolayers visualized by frequency modulation atomic force microscopy" , Colloids Surf. A  396 (2012) 203-207.

     

 [16] Takumi Hiasa, Tomoki Sugihara, Kenjiro Kimura, Hiroshi Onishi

"FM-AFM imaging of a commercial polyethylene film immersed in n-dodecane" 

   J. Phys.; Condens. Matter 24 (2012) 084011 (4 pages).

 

[17] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi

 "Minitips in Frequency-Modulation Atomic Force Microscopy at Solid-Liquid Interface" 

 Jpn. J. Appl. Phys. 51 (2012) 025703 (4 pages).

 

[18]@–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”ͺ, ˆî’jŒ’,

g“dŽ¥êÄ\¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“dŽq•”•iŒÌá‰ð͂ւ̉ž—ph, ƒGƒŒƒNƒgƒƒjƒNƒXŽÀ‘•‹Zp 28, 16 (2012).(Invited)

 

[19] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi

gCross-Sectional Structure of Liquid 1-Decanol over Graphiteh

Journal of Physical Chemistry C 116 (2012) 26475–26479

 

[20] Shinichiro Ido, Kenjiro Kimura, Noriaki Oyabu, Kei Kobayashi, Masaru Tsukuda, Kazumi Matushige, Hirofumi Yamada

gBeyond the Helix Pitch: Direct Visualization of Native DNA in Aqueous Solutionh

ACS Nano 2013 7(2) 1817-1822

 

[21] Sugihara Tomoki, ituho Hyashi, Hiroshi Onishi, Kenjiro Kimura, Atsuo Tamura

gSub-nanometer-resolution imaging of peptide nanotubes in water using frequency modulation atomic force microscopyh

Chemical Physics 419(2013)74-77

 

[22] Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

gInterfacial Structure of Primary and Tertiary Alcohol Liquids over Hhydrophilic Thiolate Monolayersh

Journal of Physical Chemistry C 117 (2013) 5730-5735

 

[23] Rina Nishioka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

gSpecific Hydration on p-Nitroaniline Crystal Studied by Atomic Force Microscopyh

Journal of Physical Chemistry C 117 (2013) 2939-2943

 

[24] Kei Kobayashi, Noriaki Oyabu, Kenjiro Kimura, Shinichiro Ido, Kazuhiro Suzuki, Takashi Imai,  Katsunori Tagami, Masaru Tsukada, and Hirofumi Yamada

gVisualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopyh

Journal of Chemical Physics 138 (2013) 184704.

 

[25] H. Imada, K. Kimura, H. Onishi.

gWater and 2-Propanol Structured on Calcite (104) Probed by Frequency-Modulation Atomic Force Microscopyh, Langmuir 29 (2013) 10744-10751,

 

[26] H. Imada, K. Kimura, H. Onishi.

gAtom-Resolved AFM Imaging of Calcite Nanoparticles in Waterh, Chemical Physics 419 (2013) 193-195,

 

[27]–Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA‘ååM”ͺAˆî’jŒ’A–Ø‘ºŒ›–¾

g‚Š´“xŽ¥‹C’ïRŒø‰Ê‘fŽq‚É‚æ‚鎥ê‚ÌŒv‘ª‚Æ“dŽ¥êÄ\¬–@‚ð—p‚¢‚½‚•ª‰ð”\ƒRƒ“ƒNƒŠ[ƒg“à•”“S‹ØŒŸ¸‹Zp‚ÉŠÖ‚·‚錤‹†h, ”ñ”j‰óŒŸ¸Vol.62 (2013) No.10 Oct.527-528. (Invited)

 

[28] ”ü”n—E‹PA‘ååM”ͺCˆî’jŒ’A–Ø‘ºŒ›–¾A–Ø‘ºŒšŽŸ˜Y

g“d—¬Œo˜H‚Ì”ñ”j‰ó‰f‘œ‰»‘•’u‚ÌŽÀ—p‰»]“dŽq•”•iAƒvƒŠƒ“ƒgŠî”ÂA“d’r‚Ì•s—ljð͂ւ̉ž—p]h‘æ43‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-34(2013).

 

[29] Y. Mima, N. Oyabu, T. Inao, N. Kimura, K. Kimura

"Failure analysis of electric circuit board by high resolution magnetic field microscopy"

Proceedings of IEEE CPMT Symposium Japan (2013) 257-260.

 

[30] –Ø‘º ŒšŽŸ˜YA–ì–{ ˜a½A¬”¨ ŒbŽqA—é–Ø ’qŽqA”ü”n —E‹P, ‘ååM”ͺCˆî’jŒ’A–Ø‘ºŒ›–¾ g•¨Ž¿ŠE–Ê‚Ì\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­]h‘æ44‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-17(2014). (ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUÜ)

 

[31] –Ø‘ºŒšŽŸ˜Y, –ì–{˜a½, ”ü”n—E‹P, –Ø‘ºŒ›–¾,

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h

‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU, AP-18(2015).

 

”­–¾

[1] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè 2004-036389 Œ´ŽqŠÔ—ÍŒ°”÷‹¾—pƒJƒ“ƒ`ƒŒƒo[@

 

[2] ŒÃì‹M‘å, –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè 2004-253258, ƒJƒ“ƒ`ƒŒƒo[‚¨‚æ‚Ñ‚»‚̉ž—p@

 

[3] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ‰P“cGŽ¡, ¼d˜a”ü

“ÁŠè2005-056724 •]‰¿—p”¼“±‘̃fƒoƒCƒXA•]‰¿—p”¼“±‘̃fƒoƒCƒX‚Ì컕û–@A”¼“±‘̃fƒoƒCƒX‚Ì•]‰¿•û–@,.

 

[4] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2005-337824 “dŽqŒ°”÷‹¾§Œä‘•’uA“dŽqŒ°”÷‹¾§Œä•û–@A§ŒäƒvƒƒOƒ‰ƒ€,

§ŒäƒvƒƒOƒ‰ƒ€‚ð‹L˜^‚µ‚½‹L˜^”}‘ÌA“dŽqŒ°”÷‹¾ƒVƒXƒeƒ€‚¨‚æ‚Ñ“dŽqüÆŽË‘•’u

 

[5] –Ø‘ºŒšŽŸ˜Y, –x“à‹ª, ’†ˆäÍ•¶, ²“¡é•v, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2007-91856 ‚RŽŸŒ³êŽæ“¾‘•’uA•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€AŽ¥‹C—ÍŒ°”÷‹¾Aî•ñ“Ç Žæ‘•’uA“d—¬•ª•z‘ª’è‘•’uA¶‘ÌŽ¥ê‘ª’è‘•’uA”ñ”j‰óŒŸ¸‘•’uA•À‚Ñ‚ÉA‚ŽŽŸŒ³êŽæ“¾‘•’u

 

[6] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2007-208209 “®Œa‘½‹ÉŽqŒ^”z’uƒŒƒ“ƒY‹y‚Ñ‚»‚ê‚ð—p‚¢‚½‰×“d—±ŽqŒõŠwŒn‘•’u

 

[7]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA’†ˆäÍ•¶A²“¡é•vA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü

“ÁŠèF2009-509223@‘ª’è‚É‚æ‚èê‚ðŽæ“¾‚·‚é‘•’u‚¨‚æ‚Ñ•û–@

“Á‹– 4878063(2011/12/9)“ú–{

“Á‹–‘æ10-1127682†i2012/3/9jŠØ‘

 

[8] ‘ååM”ͺ, ‘å“c¹O, –Ø‘ºŒšŽŸ˜Y, ˆäŒËTˆê˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü

“ÁŠè2008-002057‘–¸‘•’u

 

[9] –Ø‘ºŒšŽŸ˜Y, ´‰Æ’qŽj, ‘å¼—m

“ÁŠè2009-164676‰×“d—±ŽqüÆŽË‘•’uA•`‰æ‘•’uA•ªÍŒ°”÷‹¾A‰×“d—±ŽqüoŽË‘•’u‚¨‚æ‚щדd—±Žqü—p‚̃Œƒ“ƒY‘•’u

 

[10] ‘ååM”ͺA–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA—é–؈ꔎA¬—ÑŒ\AŽR“cŒ[•¶

“ÁŠè2009-180137@§Œä‘•’uAŒ´ŽqŠÔ—ÍŒ°”÷‹¾A§Œä•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€

 

[11] ‘ååM”ͺA–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶

“ÁŠè2009-193606@U“®‘Ì‚ÌŽü”g”ŒŸo‘•’uAŒ´ŽqŠÔ—ÍŒ°”÷‹¾AU“®‘Ì‚ÌŽü”g”ŒŸo•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€

 

[12]–Ø‘ºŒšŽŸ˜YA“úóIA‘å¼—mA‘ååM”ͺ

“ÁŠè2009-297601@ƒJƒ“ƒ`ƒŒƒo[Œ^ƒZƒ“ƒTCƒoƒCƒIƒZƒ“ƒT‚¨‚æ‚уvƒ[ƒuŒ°”÷‹¾

 

[13]–Ø‘ºŒšŽŸ˜Y

“ÁŠè2010-44218@ƒ|ƒeƒ“ƒVƒƒƒ‹Žæ“¾‘•’uAŽ¥êŒ°”÷‹¾AŒŸ¸‘•’u‚¨‚æ‚у|ƒeƒ“ƒVƒƒƒ‹Žæ“¾•û–@

 

[14] ¬”¨ŒbŽq, –Ø‘ºŒšŽŸ˜Y

“ÁŠè:2010-214453  Ž¥êƒZƒ“ƒT‹y‚ÑŽ¥êƒZƒ“ƒT‚Ì»‘¢•û–@

 

[15] –Ø‘ºŒšŽŸ˜Y

“ÁŠèF2010-261016 Ž¥ê•ª•zŽæ“¾‘•’u

 

[16] K.Kimura, K.Kobayashi, H.Yamada, K.Matsushige

United States Patent: US 7,829,863 B2, Nov.9,2010

ELECTRON BEAM IRRADIATION DEVICE

 

‘¼14Œ

 

‰ðàC’˜‘“™

[1]K. Kimura, T. Horiuchi, N. Oyabu, K. Kobayashi, Y. Hirata, M. Abe, K. Matsushige, S. Morita, H. Yamada,

gLocal Solvation Force Measurement by Frequency Modulation Atomic Froce Microscopyh

Ext.Abstr.10h Int.Conf.Non-Contact Atomic Force Microscopy, 2007”NAp.83.

 

[2] K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, and H. Yamada

"Molecular-scale Hydration Structures Investigated by Frequency ModulationAtomic Force Microscopy"

Ext. Abstr. 11th Int. Conf. Non-contact Atomic Force Microscopy, 2008, p. 62.

 

[3] Collaboration with Integral Geometry Instruments, LLC

g“dŽ¥êÄ\¬‘–¸Œ^ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾h, ‰ÈŠwE•ªÍ‹@Ší‘—— p. 711 (2012).

 

[4] –Ø‘ºŒšŽŸ˜Y

g‚±‚±‚Ü‚Å—ˆ‚½Œ´ŽqŠÔ—ÍŒ°”÷‹¾@ƒCƒIƒ“‰t‘Ì’†‚Ōő̕¨Ž¿•\–Ê‚ÌŒ´Žq‚ðŠÏŽ@h

ŒŽŠ§‰»Šw 68Šª p.63(2012)

 

[5] “úóI, ¼‰ª—˜“Þ, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m

gFM-AFM‚ÅŠÏ‚éŠE–ʉt‘Ì\‘¢‚̉»Šwh@

•\–ʉȊwiŒ¤‹†Ð‰îj 34 (2013) 352-357,

 

[6] –Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŒ¤‹†h

‚­‚³‚¾‚æ‚è25 12ŒŽ25“ú

 

[7]@–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‹|ˆäF‰À, XN¬, ¯“‡ˆê‹P, ’†“c¬K, “yˆä‹±“ñ

 "”ñ”j‰óƒ‚ƒjƒ^ƒŠƒ“ƒO‚Ì‚½‚ß‚Ì3ŽŸŒ³ƒf[ƒ^‰ðÍ‹Zp‚¨‚æ‚Ñ‘•’u‹Zp", ‹‘å\‘¢•¨ƒwƒ‹ƒXƒ‚ƒjƒ^ƒŠƒ“ƒO, NTS (2015).

 

[8] ––Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA–Ø‘ºŒ›–¾

g“d—¬Œo˜H‰ÂŽ‹‰»‹Zp\’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—p\h“d‹CŠw‰ïŽ@135Šª7†@i2015j437-440 .(Invited)

 

[9]”ü”n—E‹PA–Ø‘ºŒ›–¾A–Ø‘ºŒšŽŸ˜Y

gƒTƒuƒT[ƒtƒFƒXŽ¥‹CƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ÌŠJ”­‚Æ”¼“±‘̃`ƒbƒv“à•”‚Ì“d—¬Œo˜H‰f‘œ‰»‚ւ̉ž—ph

ƒPƒ~ƒJƒ‹ƒGƒ“ƒWƒjƒ„ƒŠƒ“ƒO@60Šª10†@772-778i2015j

 

[10] –Ø‘ºŒšŽŸ˜Y

 gŒ¤‹†Žº–K–â@_ŒË‘åŠw‘åŠw‰@—ŠwŒ¤‹†‰È–Ø‘ºŒ¤‹†Žºh

ƒGƒŒƒNƒgƒƒjƒNƒXŽÀ‘•Šw‰ïŽVol.18@No.7@P511@ i2015”N11ŒŽ1“ú”­sj

 

[11] Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@Œ¤‹†¬‰ÊÅ“K“WŠJŽx‰‡ƒvƒƒOƒ‰ƒ€@

gŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u FOCUS001‚ð¤•i‰»@_ŒË‘åŠw”­ƒxƒ“ƒ`ƒƒ[Šé‹Æ Integral Geometry InstrumentsŽÐ‚ð‘n—§h

A-STEP¬‰ÊW@2014@P57 i2014”N9ŒŽj

 

[12] Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@Œ¤‹†¬‰ÊÅ“K“WŠJŽx‰‡ƒvƒƒOƒ‰ƒ€@

g‘åŠw”­ƒxƒ“ƒ`ƒƒ[Šé‹ÆuIntegral Geometry Science ŽÐv‚ðÝ—§h

A-STEP¬‰ÊW@2016@P30i2016”N1ŒŽ‰ü’ùj

 

[13]–Ø‘ºŒšŽŸ˜Y

g“d’r—p\‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”­h

JSTæ’[Œv‘ª—v——2016@Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@æ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”­ƒvƒƒOƒ‰ƒ€@P24@i2016”N4ŒŽj

 

 

ŽóÜ

[1] •½¬16”N9ŒŽ1“ú

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾iSCFM)‚É‚æ‚锼“±‘Ì•sƒ•¨”Z“x•]‰¿h

‰ž—p•¨—Šw‰ï u‰‰§—ãÜ

 

[2] •½¬16”N11ŒŽ20“ú

g‚QŽŸŒ³“dŽqƒr[ƒ€ƒŠƒ\ƒOƒ‰ƒtƒBh

ŠÖ¼ƒeƒNƒmƒAƒCƒfƒBƒAƒRƒ“ƒeƒXƒg04@ ‘åŠw‚Ì•”@—DGÜ

 

[3] •½¬17”N6ŒŽ29“ú

g‘–¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚铮쒆MOSFET‚É‚¨‚¯‚é‚QŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

‹ž“s‘åŠwƒiƒmHŠw‚“™Œ¤‹†‰@@‘æ‚R‰ñŽáŽèŒ¤‹†ŽÒ”­•\‰ï@—DGÜ

 

[4] •½¬17”N11ŒŽ23“ú

g‚QŽŸŒ³”z—ñ‚³‚ꂽ“dŽqüÆŽËŒ¹‚ð—p‚¢‚½“dŽqŒ°”÷‹¾‚¨‚æ‚Ñ•„†‰»“dŽqüƒAƒŒƒCÆŽË•ûŽ®‚ð—p‚¢‚½‚Š´“x‚QŽŸ“dŽqŒŸo–@h

ŠÖ¼ƒeƒNƒmƒAƒCƒfƒBƒAƒRƒ“ƒeƒXƒg05@ ‘åŠw‚Ì•” €ƒOƒ‰ƒ“ƒvƒŠ@ƒnƒCƒeƒN•”–å

 

[5] •½¬18”N5ŒŽ19“ú

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚ÌŠJ”­‚ƃiƒm“dŽqƒfƒoƒCƒX‰ð͂ւ̉ž—ph

ƒiƒmŠw‰ï ‘æ‚S‰ñ‘å‰ï Best Young Presenter Award

 

[6] •½¬18”N6ŒŽ23“ú

g“ÁŽê‹¤U\‘¢‚ð—p‚¢‚½’´”÷ŽãÓd‹C—ÍŒŸoƒZƒ“ƒT[‚ÌŠJ”­h

‹ž“s‘åŠwVBL‘æ‚P‚O‰ñŽáŽèŒ¤‹†•¬@—DGÜ

 

[7] •½¬19”N3ŒŽ5“ú

gNoncontact-mode scanning capacitance force microscopy towards quantitative two-dimensional carrier profiling on semiconductor devicesh

Selected letter for Virtual Journal of Nanoscale Science & Technology.

 

[8] •½¬19”N6ŒŽ23“ú

g—n”}˜a\‘¢‰ÂŽ‹‰»‘•’uh

ƒeƒNƒmˆ¤ ‹ž“s‘åŠwVBLŽ{Ý’·Ü

 

[9] •½¬20”N11ŒŽ13“ú

g‘–¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚éMOSFET“®ìŽž‚Ì•sƒ•¨•ª•zŒv‘ªh

“ú–{•\–ʉȊw‰ï@‹ZpÜ

 

[10] •½¬21”N

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚Ì\‘¢‰ðÍh

•ªŽq‰ÈŠw“¢˜_‰ï —DGu‰‰Ü

 

[11] •½¬26”N

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

‘æˆê‰ñ ’†’ÒÜ

 

[12] •½¬26”N6ŒŽ4“ú

g•¨Ž¿ŠE–Ê‚Ì\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

2014 JPCA ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUÜ

 

 

ƒƒfƒBƒA”­•\

2010”N11ŒŽ23“ú@ƒeƒNƒmˆ¤2010@‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ@

–Ø‘ºŒ¤‹†Žº‚̬”¨ŒbŽq‚ª‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ‚ðŽóÜ

http://www.kyoto-u.ac.jp/static/ja/news_data/h/h1/news7/2010/101123_1.htm

 

2011”N9ŒŽ21“ú@‰»ŠwH‹Æ“ú•ñV•·ˆê–Ê

g“dŽq•”•i‚ð”ñ”j‰óŒŸ¸@Ž¥ê•ª•z‚𑪒肵‰æ‘œ‚É-

 

2011”N9ŒŽ22“ú@ƒ}ƒCƒiƒrƒjƒ…[ƒX

g‘º“c»ìŠA_ŒË‘å‚Æ“dŽq•”•i‚ÌŒÌá‰ÓŠ‚ð“Á’è‰Â”\‚È”ñ”j‰óŒŸ¸‘•’u‚ðŠJ”­h

 

2011”N9ŒŽ22“ú@“úŒoƒvƒŒƒXƒŠƒŠ[ƒX

g‘º“c»ìŠA_ŒË‘å‚Æ“dŽq•”•i‚ÌŒÌá‰ÓŠ‚ð“Á’è‰Â”\‚È”ñ”j‰óŒŸ¸‘•’u‚ðŠJ”­h

 

2012”N6ŒŽ28“ú@ƒ}ƒCƒiƒrƒjƒ…[ƒX

g“d‹C‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’uh

http://news.mynavi.jp/news/2012/06/28/043/index.html

 

2012”N6ŒŽ28“ú@DIGINFO TV

g“d‹C‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’uh

http://jp.diginfo.tv/v/12-0124-n-jp.php

 

2012”N6ŒŽ28“ú@DIGINFO TV(ENGLISH)

gMaking Electric Currents Visibleh

http://www.diginfo.tv/v/12-0124-n-en.php

 

2012”N9ŒŽ7“ú@@ELECTRONIC JOURNAL

_ŒË‘åA“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ðЉî

http://www.electronicjournal.co.jp/news/2012/09/07.html

 

2012”N11ŒŽ30“ú _ŒËŽs@(–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜A)

_ŒËˆã—ÃŽY‹Æ“sŽs‚É‚¨‚¢‚ÄAIntegral Geometry Instruments‡“¯‰ïŽÐ‚Ìio

http://www.city.kobe.lg.jp/information/press/2012/11/20121130141001.html

http://www.kobe-lsc.jp/news/index.html

 

2012”N12ŒŽ12“ú ‰»ŠwH‹Æ“ú•ñ@(–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜A)

_ŒË‘å”­‚Ì‚h‚f‚h “d—¬Œo˜H‚ð‰ÂŽ‹‰»

http://www.kagakukogyonippo.com/headline/2012/12/12-9364.html

 

2013”N1ŒŽ7“ú “ú–{ŒoÏV•·11–Êi–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

ŒÌá‰ÓŠ@Ž¥ê‚Å’T’m@ƒ\ƒtƒgƒEƒFƒAŠJ”­IGI-

 

2013”N1ŒŽ7“ú “ú–{ŒoÏV•·@“dŽq”Åi–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

ŒÌá‰ÓŠ@Ž¥ê‚Å’T’m@ƒ\ƒtƒgƒEƒFƒAŠJ”­IGI-

 http://www.nikkei.com/article/DGXNZO50300920V00C13A1TJE000/

 

2013”N4ŒŽ3“ú JST  A-STEP ƒz[ƒ€ƒy[ƒW Œ¤‹†ŠJ”­¬‰Ê —“

gJSTŒ¤‹†¬‰Ê“WŠJŽ–‹Æ‚ÌŒ¤‹†ŠJ”­‚É‚¨‚¢‚ÄŽ¥‹CƒCƒ[ƒWƒ“ƒO–@‚É‚æ‚é“d—¬Œo˜H‰f‘œ‰»‘•’u‚ª»•i‰»‚³‚ê‚Ü‚µ‚½Bh

http://www.jst.go.jp/a-step/seika/

 

2014”N02ŒŽ27“ú “Œ—mŒoÏ@ò’J ’˜g¢ŠE‚ª‹Á‚­ƒjƒbƒ|ƒ“‚̈ã—ÃŽY‹Æ—Íh i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

Integral Geometry InstrumentsŽÐ‚Æ‚Ì‹¤“¯Œ¤‹†‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

 

2014”N4ŒŽ22“ú “úŠ§H‹Æ@

g‚•ª‰ð”\‚Å”ñ”j‰óŒŸ¸‰æ‘œh

“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

http://j-net21.smrj.go.jp/watch/news_tyus/entry/20140424-02.html

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2014”N4ŒŽ29“ú “úŠ§H‹Æ ˆê–Ê

g‚RŽŸŒ³ŒŸ¸ƒ\ƒtƒgƒEƒGƒAƒVƒXƒeƒ€ŠJ”­h

“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

http://www.nikkan.co.jp/news/nkx0920140429aaav.html

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2015”N2ŒŽ1“ú ‘åŠw•]‰¿‹@\

_ŒË‘åŠw‚Ì•]‰¿u—D‚ꂽ“_v‚T“_‚Ì’†‚ÅAŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ª‘I’肳‚ê‚Ü‚µ‚½B

uŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÉŠÖ‚·‚錤‹†¬‰Ê‚É‚æ‚èA‰¢•ÄA“ú–{‚É‚¨‚¢‚Ä“Á‹–‚ª¬—§‚µ‚Ä‚¨‚èA“¯¬‰Ê‚ÉŠÖ‚í‚é“Á‹–oŠè‚ð’Ê‚¶‚ă\ƒtƒgƒEƒFƒAƒpƒbƒP[ƒW‚̔̔„‚ÉŒq‚ª‚Á‚Ä‚¢‚éBv

http://www.kobe-u.ac.jp/info/project/evaluation/attestation.html

 

2015”N3ŒŽ20“ú _ŒË‘åŠwƒz[ƒ€ƒy[ƒWu_‘ål‚Ì–{vƒR[ƒi[‚ÉŒfÚB

‹‘å\‘¢•¨ƒwƒ‹ƒXƒ‚ƒjƒ^ƒŠƒ“ƒO\—ò‰»‚̃ƒJƒjƒYƒ€‚©‚çŠÄŽ‹‹Zp‚Æ‚»‚ÌŽÀÛ‚Ü‚Å

http://www.kobe-u.ac.jp/info/public-relations/book/1503_20_1.html

_‘ål‚Ì–{

http://www.kobe-u.ac.jp/info/public-relations/book/index.html

 

2015”N3ŒŽ30“ú _ŒËˆã—ÃŽY‹Æ“sŽs‚̃z[ƒ€ƒy[ƒW

_ŒË‘åŠw”­ƒxƒ“ƒ`ƒƒ[Šé‹Æ‚ÌЉî

http://www.kobe-lsc.jp/interview/igi

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2015”N4ŒŽ10“ú yî•ñ’ñ‹ŸF‚µ‚Ü‚à‚悤z‚R‚X‚P†i‚Q‚O‚P‚T”N‚SŒŽ‚P‚O“új

 gioŠé‹ÆƒCƒ“ƒ^ƒrƒ…[‚ðXV‚µ‚Ü‚µ‚½iIntegral Geometry Instruments, LLCj

@@áŒv‘ª‚⌟¸A‰æ‘œˆ—‚Ì•ª–ì‚É‚¨‚¢‚ÄA¢ŠEÅæ’[‚Ì‹Zp‚ð’ñ‹Ÿ‚µ‚Ä‚¢‚«‚Ü‚·âh

“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B

i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj

 

2015”N4ŒŽ _ŒË‘åŠw—ŠwŒ¤‹†‰È Œ¤‹†ƒgƒsƒbƒNƒXЉî

ƒTƒuƒT[ƒtƒFƒX‰f‘œ‰»–@‚ÉŠÖ‚·‚錤‹†

http://www.sci.kobe-u.ac.jp/topics/2014chem2.htm

 

2015”N7ŒŽ16“ú XV

w“§Ž‹‚̉Ȋwx

 `Œ©‚¦‚È‚¢‚à‚Ì‚ðŒ©‚é‹Zp‚ªA¢ŠE‚ðŽç‚é`

http://douhiro.com/video/?cd_video=98

 

2015”N‚XŒŽ‚P‚T“ú ‚R–Ê

—nÚƒjƒ…[ƒXiŽY•ño”ÅŠ”Ž®‰ïŽÐj2015”N9ŒŽ15“ú@‘æ3115

 

2015”N‚XŒŽ‚Q‚O“ú ‚T–Ê

ŒŸ¸‹@Šíƒjƒ…[ƒXiŽY•ño”ÅŠ”Ž®‰ïŽÐj2015”N9ŒŽ20“ú@‘æ1314

 

2015”N10ŒŽ29“ú@AMEDƒvƒŒƒXƒŠƒŠ[ƒX

“ú–{‚̈ã—ÂɊvV‚ð‚à‚½‚ç‚·Œv‘ªE•ªÍ‹Zp‚ÌŠJ”­,

•½¬27”N“xuæ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”­ƒvƒƒOƒ‰ƒ€v‚ÉÌ‘ð

ŠÖ˜AHPFhttp://www.amed.go.jp/news/press.html

http://www.hosp.kobe-u.ac.jp/topic/2015/amed_151106.html

http://www.kobe-u.ac.jp/NEWS/research/2015_10_30_01.html

http://www.kobe-u.ac.jp/kuirc/

http://www.sci.kobe-u.ac.jp/news/2015/151029.htm

 

2015”N11ŒŽ05“ú@“úŠ§H‹Æ

gƒI[ƒ‹ƒWƒƒƒpƒ“‚ňã—Ë@ŠíŠJ”­|‚`‚l‚d‚cA_ŒË‘å‚Ì“û‚ª‚ñf’f‚È‚Ç‚Uƒe[ƒ}‚ðŽx‰‡Ì‘ðh

http://www.nikkan.co.jp/news/nkx1020151105ccad.html

 

 

2015”N11ŒŽ13“ú

‘æ 5 ‰ñ CSJ ‰»ŠwƒtƒFƒXƒ^ 2015@‰ï@ŠúF2015”N10ŒŽ13“ú(‰Î)`15“ú(–Ø)

P6-015 ”ü —E‹Pu“d‚âƒCƒIƒ“‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’u‚ÌŠJ”­v—DGƒ|ƒXƒ^[”­•\Ü

http://www1.csj.jp/festa/2015/document/poster_award.pdf

 

 

2015”N11ŒŽ23“ú@ƒeƒNƒmˆ¤2015@‘åŠw‚Ì•” €ƒOƒ‰ƒ“ƒvƒŠ@

–Ø‘ºŒ¤‹†Žº‚Ì”ü —E‹PŒN‚ª‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ‚ðŽóÜ

http://www.kobe-u.ac.jp/NEWS/research/2015_12_01_02.html

 

2016”N3ŒŽ15“ú@_ŒË‘åŠw@•½¬‚Q‚V”N“xŠw¶•\²

–Ø‘ºŒ¤‹†Žº‚Ì”ü”n—E‹PŒN‚ªŠw’·‚æ‚è•\²‚³‚ꂽ

http://www.chem.sci.kobe-u.ac.jp/

http://www.sci.kobe-u.ac.jp/news/2015/160324.htm

 

2016”N3ŒŽ30“ú@JSTƒTƒCƒGƒ“ƒXƒjƒ…[ƒX‚ÉŒfÚ

uŽ–ŒÌ‚𖢑R‚É–h‚®I ŠJ”­i‚ÞƒCƒ“ƒtƒ‰ŒŸ¸‹Zpi2016”N3ŒŽ30“ú”zMjv

https://sciencechannel.jst.go.jp/M160001/detail/M150001021.html

ŠÖ˜AHPFhttp://www.kobe-u.ac.jp/NEWS/research/2016_04_01_02.html

http://www.chem.sci.kobe-u.ac.jp/

http://www.sci.kobe-u.ac.jp/news/2015/160330.htm

 

Šw‰ï”­•\i–Ø‘º“o’d•ªj

[1]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\A–x“àrŽõCŽR“cŒ[•¶A¼d˜a”üA™‘º”Ž”V

gƒPƒ‹ƒrƒ“ƒvƒ[ƒuŒ°”÷‹¾‚É‚æ‚é•\–Ê“dˆÊ/—e—Ê“¯Žž‘ª’èh

HŠú‘æ62‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAˆ¤’mH‹Æ‘åŠw 2001”N9ŒŽ

 

[2]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”üA‰«–ì—Tä

g—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹­—U“d‘ÌÞ—¿•]‰¿h

t‹G‘æ49‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“ŒŠC‘åŠw 2002”N3ŒŽ

 

[3] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

" Scanning Capacitance Force Microscopy"

The 5th International Conference on Noncontact Atomic Force Microscopy, Montreal, 2002”N8ŒŽ

 

[4]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\A–x“àrŽõAŽR“cŒ[•¶A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-pnÚ‡‚Ì•]‰¿h

HŠú‘æ63‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAVŠƒ‘åŠw 2002”N9ŒŽ

 

[5]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•zŒv‘ªh

t‹G‘æ50‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA_“Þì‘åŠw 2003”N3ŒŽ

 

[6] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gMetal-Oxide-Semiconductor Field Effect Transistors Investigated by Scanning Capacitance Force Microscopy g

12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Eindhoven,the Netherlands, 2003”N7ŒŽ

 

[7]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•z•]‰¿h

HŠú‘æ64‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC•Ÿ‰ª‘åŠw 2003”N8ŒŽ

 

[8]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü

g“ÁŽê‹¤U\‘¢‚ð—L‚·‚éƒJƒ“ƒ`ƒŒƒo[‚ð—p‚¢‚½Ã“d‹C—ÍŒŸo‚Ì‚Š´“x‰»h

HŠú‘æ64‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC•Ÿ‰ª‘åŠw 2003”N8ŒŽ

 

[9] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gScanning Capacitance Force Microscopy imaging of Metal –Oxide-Semiconductor Field Effect Transistorsh

AVS 50th International Symposium & Exhibition, Baltimore, 2003”N11ŒŽ

 

[10] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gScanning Capacitance Force Microscopy imaging of Metal-Oxide-Semiconductor Field Effect Transistorsh

7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, 2003”N11ŒŽ

 

[11]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾(SCFM)‚É‚æ‚锼“±‘Ì•sƒ•¨”Z“x•]‰¿h

t‹G‘æ51‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“Œ‹žH‰È‘åŠw 2004”N3ŒŽ

 

[12]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•z•]‰¿h

HŠú‘æ65‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC“Œ–kŠw‰@‘åŠw 2004”N9ŒŽ

 

[13] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

gDesigning Resonance Modes of AFM Cantilevers and its Application for Probing of Electric Properties and Operation with Ultrasmall Oscillation Amplitudeh

2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ

 

[14] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gTwo-dimensional Carrier Profiling on Operating Si-MOSFET by Scanning Capacitance Force Microscopyh

2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ

 

[15]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—͉ƌ°”÷‹¾‹y‚Ñ‘–¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚铮쒆Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

t‹G‘æ52‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAé‹Ê‘åŠw 2005”N3ŒŽ

 

[16] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gTwo-dimensional Carrier Profiling on Operating Si-MOSFET by Scanning Capacitance Force Microscopyh

The 8th International Workshop on the Fabrication, Characterization and Modeling of Ultra Shallow Junctions in Semiconductors, Florida, USA, 2005”N6ŒŽ

 

[17] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

gDesigning Resonance Modes of AFM Cantilevers for the Versatile Applications to High-Sensitive Force Detectorsh

13th International Colloquium on Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ

 

[18] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

gTwo-dimensional Carrier Profiling on Operating Si-MOSFET by Scanning Capacitance Force Microscopy and SCMh

13th International Colloquium on Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ

 

[19]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü

g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚铮쒆Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

HŠú‘æ66‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“¿“‡‘åŠw 2005”N9ŒŽ

 

[20]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶AŽ›”ö—C¶A¼d˜a”ü

g‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾‚É‚æ‚é—L‹@ELƒfƒoƒCƒXŠE–Ê‚É‚¨‚¯‚é2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh

HŠú‘æ66‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“¿“‡‘åŠw 2005”N9ŒŽ

 

[21] K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige

gDesigning Resonance Modes of AFM Cantilevers and its Application for Probing of Electric Properties and Operation with Ultrasmall Oscillation Amplitudeh

2005 International Symposium on Nonlinear Theory and its Applications, Bruges, Belgium, 2005”N10ŒŽ

 

[22] K. Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige

g2D carrier profiling on operating Si-MOSFET by SCFM and SCMh

9th International Conference on Non-Contact Atomic Force Microscopy, 2006”N7ŒŽ

 

[23]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ª

HŠú‘æ67‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA—§–½ŠÙ‘åŠwA2006”N9ŒŽ

 

[24] K. Kimura, T. Horiuchi, K. Kobayashi, K. Matsushige and H.Yamada

gHydration Force Measurements by Frequency Modulation Dynamic Force Microscopyh

14th International Colloquium on Scanning Probe Microscopy, 2006”N12ŒŽ

 

 [25] –Ø‘ºŒšŽŸ˜YA–x“à‹ªA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ªh

t‹G‘æ53‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAÂŽRŠw‰@‘åŠw 2007”N3ŒŽ

 

[26]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”ͺA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ªh

“ú–{Œ°”÷‹¾Šw‰ï63‰ñŠwpu‰‰‰ïAŽé냃bƒZVŠƒƒRƒ“ƒxƒ“ƒVƒ‡ƒ“ƒZƒ“ƒ^[ 2007”N5ŒŽ

 

[27]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”ͺA¬—ÑŒ\A•½˜a–FŽ÷A¼d˜a”üCŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ…˜a\‘¢Œv‘ªh

HŠú‘æ68‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïiƒvƒ[ƒuŒ°”÷‹¾6.6j–kŠC“¹H‘å 2007”N9ŒŽ

 

[28]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”ͺA¬—ÑŒ\A•½˜a–FŽ÷A¼d˜a”üAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ…˜a\‘¢Œv‘ªh

HŠú‘æ68‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïi“Á’èƒe[ƒ}B:¶‘Ì•ªŽqŒv‘ªEƒoƒCƒIƒeƒNƒmƒƒW[10.1j–kŠC“¹H‘å 2007”N9ŒŽ

 

[29] K. Kimura, T. Horiuchi, N.Oyabu, K. Kobayashi, Y.Hirata, M.Abe, K. Matsushige, S. Morita and H.Yamada

gLocal Solvation Force Measurements by Frequenscy Modulation Atomic Force Microscopyh

The 10th International NC-AFM Conference, Antalya, 2007”N9ŒŽ

 

[30]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢‚ÌŠÏŽ@h

ƒ\ƒtƒgƒiƒmƒeƒNƒmƒƒW[Œ¤‹†•”‰ï@‘æ3‰ñŒ¤‹†‰ï@“Œ‹žH‘å 2008”N1ŒŽ

 

[31] –Ø‘ºŒšŽŸ˜Y, ˆäŒËTˆê˜Y, ‘ååM”ͺ, ¬—ÑŒ\, ¡ˆä—²Žu, “c㟋K, ’Ë“c·, ¼d˜a”ü, ŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢Œv‘ªh

t‹G‘æ54‰ñ‰ž—p•¨—Šw‰ïŠÖŒW˜A‡u‰‰‰ï,@ “ú‘å, 2008”N3ŒŽ

 

[32]–Ø‘ºŒ’ŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üAŽR“cŒ[•¶C‘å¼—m

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢‚ÌŠÏŽ@h

“Á’è—̈æu‚ŽŸ•ªŽq‰ÈŠwv‘æ3‰ñ‡“¯”ljï‹cAVŠƒ 2008”N5ŒŽ

 

[33]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üA‘å¼—mAŽR“cŒ[•¶

gƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鶑̂•ªŽq‚¨‚æ‚ÑŽü•Ó—n”}˜a‚Ì\‘¢‰ðÍh

_ŒË‘åŠw—ŠwŒ¤‹†‰È¶•¨ŠwêUŠwpu‰‰‰ïA_ŒË‘åŠw 2008”N7ŒŽ(Invited)

 

[34]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA‘å¼—mAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚Ì\‘¢‰ðÍh

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwŠÖŒW˜A‡u‰‰‰ïC’†•”‘åŠw 2008”N9ŒŽ

 

[35] K. Kimura, S.Ido, N.Oyabu, K.Kobayashi, T.Imai, and H.Yamada

gMolecule-Scale Hydration Structures Investigated by Frequency Modulation Atomic Force Microscopyh

11th International Conference on Non-Contact Atomic Force Microscopy (NCAFM2008), Madrid 2008”N9ŒŽ

 

[36] K. Kimura, S.Ido, N.Oyabu, K.Kobayashi, T.Imai, and H.Yamada

gMolecule-Scale Hydration Structures Investigated by Frequency modulation atomic force microscopyh

2008 MRS Fall Meeting, Boston 2008”N12ŒŽ

 

[37] K. Kimura, T.Hiasa, H.Onishi

gDevelopment of Scanning Probe Tomography and its Application for Visualizing Internal Nanomagnetic Structuresh

2008 MRS Fall Meeting, Boson 2008”N12ŒŽ

 

[38] K. Kimura, T.Hiasa, H.Onishi

gScanning Probe Tomography Developed for Visualising Buried Magnetic Structuresh

2008 MRS Fall Meeting, Boston 2008”N12ŒŽ

 

[39] K. Kimura, S.Kataoka, T.Hiasa, A.Sasahara, H.Onishi, N.Oyabu, M.Ohta, K.Watanabe, R.Kokawa, K.Kobayashi and H.Yamada

FM-AFM Study of Buried Metal Oxide Interfaces

The Sixth International Workshop on Oxide Surface (IWOX-E) 2009”N1ŒŽ

 

[40]–Ø‘ºŒšŽŸ˜Y

g–„‚à‚ꂽ•¨Ž¿ŠE–Ê‚É‚¨‚¯‚é\‘¢‰ðÍ‚Ì‚½‚ß‚ÌV‹K‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾–@‚ÌŠJ‘ñh(invited)

ˆ¢“ìH‹Æ‚“™ê–åŠwZ‘æ7‰ñŠñ•uÀƒZƒ~ƒi[Aˆ¢“ì2009”N2ŒŽ

 

[41] K. Kimura, T.Hiasa, H.Onishi, M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayashi, T.Imai and H.Yamada

gLocal Hydration Structures Investigated by Frequency Modulation Atomic Force Microscopyh (invited)

“ñ‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi[ Reent Progress in Spectroscopy and Theory in Chemistry, Kolkata,Rep.of  India 2009”N3ŒŽ

 

[42]–Ø‘ºŒšŽŸ˜YA “úóIAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA‘å¼—mAŽR“cŒ[•¶

g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚Ì\‘¢‰ðÍh

•ªŽq‰ÈŠw“¢˜_‰ï2009A–¼ŒÃ‰®‘åŠw 2009”N9ŒŽ

 

[43] K. Kimura, T.Hiasa, H.Onishi, T.Imai, S.Ido, N.Oyabu, K.Kobayashi, H.Yamada

gHydration Structures Studied by Frequency Modulation Atomic Force Microscopy and 3D Referential Interaction Site Model Theoryh

The 7th International Workshop on Oxide Surfaces (IWOX-E) 2010, VŠƒ 2010”N‚PŒŽ

 

[44]–Ø‘ºŒšŽŸ˜YA“úóIAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuAŽR“cŒ[•¶A‘å¼—m

gAFM‚Å’T‚é‹à‘®Ž_‰»•¨ŠE–Ê‚Ì—n‰t\‘¢hiˆË—Šu‰‰j

“ú–{‰»Šw‰ï‘æ90t‹G”N‰ï“Á•ÊŠé‰æuŒÅ‰tŠE–Ê‚Ì—n‰t\‘¢v‹ß‹E‘åŠw 2010”N3ŒŽ

 

 [45]–Ø‘ºŒšŽŸ˜Y

gŒ©‚¦‚È‚¢‚à‚Ì‚ðf‚éFŒ°”÷‹¾‚ÌŒ´—h

‚‘å˜AŒg“Á•Êu‹`A_ŒË‘åŠw 2010”N8ŒŽ

 

[46]–Ø‘ºŒšŽŸ˜YA‹{‰ºˆ¤ŽqA–Ø‘ºŒ›–¾

g“dŽ¥ê‹t‰ðÍ–@‚ÌŠJ”­‚ÆŽ¥êŒ°”÷‹¾‚ւ̉ž—ph

‘æ71‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC’·è‘åŠw 2010”N9ŒŽ

 

 [47] K. Kimura, T.Hiasa, H.Onishi, M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayahi, T.Imai, H.Yamada

gLiquid Structure on Solid Surface Investigated by Atomic Force Microscopyh (invited)

“úˆó“ñ‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi[A_ŒË 2010”N9ŒŽ

 

[48]–Ø‘ºŒšŽŸ˜Y

gŽŸ¢‘㔼“±‘̃fƒoƒCƒXŒŸ¸‹ZpA»‘¢‹Zp‚ÉŠÖ‚·‚錤‹†hiˆË—Šu‰‰j

Šé‹Æ‚Å‚Ìu‰‰ 2010”N10ŒŽ

 

[49]K.kimura

gMaskless Electron Beam Stepperh

‘ÛƒiƒmƒeƒNƒmƒƒW[‘‡“WA“Œ‹ž 2011”N2ŒŽ

 

[50]–Ø‘ºŒšŽŸ˜Y

g“dŽq•”•iEƒvƒŠƒ“ƒgŠî”‚̔ñ”j‰óŒŸ¸‘•’uh

ƒCƒmƒx[ƒVƒ‡ƒ“ƒWƒƒƒpƒ“2011‘åŠwŒ©–{ŽsA“Œ‹ž 2011”N9ŒŽ

 

[51]@–Ø‘ºŒšŽŸ˜Y

gŽŸ¢‘㎥‹CƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h (Invited)

Šé‹Æ‚Å‚Ìu‰‰ 2011”N11ŒŽ14“ú

 

[52]–Ø‘ºŒšŽŸ˜Y

gŽŸ¢‘㎥‹CƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­‚Æ“dŽq•”•i‚Ì”ñ”j‰óŒŸ¸‚ւ̉ž—ph

semicon japan ŽŸ¢‘ã‹ZpƒpƒrƒŠƒIƒ“o“WŽÒƒvƒŒƒ[ƒ“ƒe[ƒVƒ‡ƒ“ 2011”N12ŒŽ9“ú

 

[53]–Ø‘ºŒšŽŸ˜Y

 g•¨Ž¿“à•”‚ðf‚錰”÷‹¾–@‚ÌŠJ”­h (Invited)

‰ÈŒ¤”ï“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ6‰ñ‡“¯”ljï‹c 2011”N12ŒŽ10“ú

 

[54]–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”ͺ, ˆî’jŒ’

g“dŽ¥êÄ\¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“dŽq•”•iŒÌá‰ð͂ւ̉ž—ph (Invited)

‚‰·ƒGƒŒƒNƒgƒƒjƒNƒXŒ¤‹†‰ï, _“Þ쌧 2012”N3ŒŽ‚Q‚P“ú

 

[55]–Ø‘ºŒšŽŸ˜Y

gŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚Ì‚«”\‰»‚Æ“dŽqŽY‹Æ‰ï‚Ö‚Ì•‹yh

ƒCƒmƒx[ƒVƒ‡ƒ“„iŽ–‹Æ¬‰Ê•ñ‰ï, _ŒË 2012”N3ŒŽ‚Q‚Q“ú

 

[56]–Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA‘ååM”ͺAˆî’jŒ’A–Ø‘ºŒ›–¾

gƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰Ê‘fŽq‚ð—p‚¢‚½‚•ª‰ð”\ƒRƒ“ƒNƒŠ[ƒg“à•”“S‹ØŒŸ¸‹Zp‚ÉŠÖ‚·‚錤‹†h

“ú–{”ñ”j‰óŒŸ¸‹¦‰ï•½¬24”N“xt‹Gu‰‰‘å‰ïu‰‰ŠT—vWp.89-p92@“Œ‹ž 2012”N4ŒŽ22“ú

 

[57]–Ø‘ºŒšŽŸ˜Y

g•¨Ž¿ŠE–Ê‚É‚¨‚¯‚é\‘¢‚Æ“d‰×ˆÚ“®‚ð‰ÂŽ‹‰»‚·‚é‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾–@‚ÌŠJ”­g

‘æ50‰ñ“ú–{¶•¨•¨—Šw‰ï”N‰ïA–¼ŒÃ‰®@2012”N9ŒŽ(Invited)

 

[58] K. Kimura, Y. Mima, N. Oyabu, N. Kimura, T. Inao

gDevelopment of magnetic field microscopy for interconnection testing inside passivation layerh

SSDM2012‘Û‰ï‹cA‹ž“s@2012”N9ŒŽ

 

[59] Yuki Mima, Noriaki Oyabu, Takeshi Inao, Noriaki Kimura, Kenjiro Kimura

gDevelopment of Tunneling Magnetoresistance Microscope with Electro-Magnetic Field Reconstructionh

International Conference of the Asian Union of Magnetics Societies (ICAUMS2012), “Þ—Ç@2012”N10ŒŽ

 

[60]–Ø‘ºŒšŽŸ˜Y

gƒiƒmƒVƒXƒeƒ€‚Ì‘å‹K–ÍWω»‚ÉŒü‚¯‚½‚‘¬“dŽqü˜IŒõ–@‚ÌŠJ”­g

‚³‚«‚ª‚¯uƒiƒmƒVƒXƒeƒ€‚Æ‹@”\‘n”­v‘æ2Šú¶Œ¤‹†¬‰Ê•ñ‰ïA“Œ‹ž 2012”N12ŒŽ

@

 

[61]–Ø‘ºŒšŽŸ˜Y

gƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚Æ“dŽ¥êÄ\¬–@‚ÌŠJ”­hiˆË—Šu‰‰j

ƒiƒmƒvƒ[ƒuƒeƒNƒmƒƒW[‘æ167ˆÏˆõ‰ï@‘æ69‰ñŒ¤‹†‰ï@“Œ‹ž@2013”N1ŒŽ

 

[62]–Ø‘ºŒšŽŸ˜Y

g“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‹Zpš“O’ê‰ðà

`LiƒCƒIƒ““d’r‚ÌŒŸ¸‚â“dŽq•”•i‚ÌŒÌá‰ðÍ‚É‚¨‚¯‚éŠvV“I‹Zp‚ðÚ‰ð`iˆË—Šu‰‰j

Electronic Journal ‘æ1564‰ñTechnical Seminar, “Œ‹ž 2013”N1ŒŽ

 

[63]–Ø‘ºŒšŽŸ˜Y

gŒ¤‹†ƒV[ƒYEƒxƒ“ƒ`ƒƒ[—§‚¿ã‚°hiˆË—Šu‰‰j

_ŒËˆã—ÃŽY‹Æ“sŽs@ƒNƒ‰ƒXƒ^[Œð—¬‰ïA_ŒË 2013”N2ŒŽ

 

[64]–Ø‘ºŒšŽŸ˜Y

gŽü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì\‘¢‰ðÍhiˆË—Šu‰‰j

“ú–{•ªÍ‰»Šw‰ï‘æ62”N‰ï@—n‰tŠE–ÊŒ¤‹†§’k‰ïA‘åã 2013”N9ŒŽ

 

[65]–Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u |“dŽq•”•iA“d’r“à•”‚Ì“d‹C‚Ì—¬‚ê‚ð‰f‘œ‰»”ñ”j‰óŒÌá‰ðÍ|h

Ceatec Japan 2013 o“WŽÒƒZƒ~ƒi[Aç—t@2013”N10ŒŽ

 

m66n–Ø‘ºŒšŽŸ˜Y

g“d—¬Œo˜H‰f‘œ‰»‘•’u‚ÌŠJ”­‚Æ“d’r“à•”‚Ì”ñ”j‰ó‰æ‘œf’f‚ւ̉ž—ph

FC EXPO2014ƒAƒJƒfƒ~ƒbƒNƒtƒH[ƒ‰ƒ€A“Œ‹ž, 2014”N2ŒŽ

 

m67n–Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

@‹ž“sSMIƒZƒ~ƒi[@2014”N2ŒŽ@“Œ‹žiŽó܎҈˗Šu‰‰j

 

m68n–Ø‘ºŒšŽŸ˜Y

 g“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‹Zpš“O’ê‰ðà `LiƒCƒIƒ““d’r‚â“dŽq•”•i‚ÌŒÌá‰ðÍ‚É‚¨‚¯‚éŠvV“I‹Zp‚ðÚ‰ð`g

Electronic Journal ‘æ2077‰ñ Technical Seminar 2014”N4ŒŽ@“Œ‹žiˆË—Šu‰‰j

 

m69n–Ø‘ºŒšŽŸ˜Y

g“dŽ¥êÄ\¬Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“d’r“à•””ñ”j‰óŒŸ¸‚ւ̉ž—ph“d‹C‰»Šw‰ï@‘æ81‰ñ‘å‰ï@‘åã@2014”N3ŒŽ

 

m70n–Ø‘ºŒšŽŸ˜Y

Šé‹Æ‚Å‚Ìu‰‰ g“dŽ¥êÄ\¬Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ“d’r“à•””ñ”j‰óŒŸ¸‚ւ̉ž—ph

2014”N4ŒŽ@iˆË—Šu‰‰j

 

m71n–Ø‘ºŒšŽŸ˜Y

“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”­

‰ž—p•¨—Šw ‰ïŠÖ¼Žx•” •½¬‚Q‚U”N“x‘æ‚P‰ñu‰‰‰ï

uƒvƒ[ƒuŒ°”÷‹¾‚Æ—L‹@ƒGƒŒƒNƒgƒƒjƒNƒX `ŠÖ¼ŽáŽèŒ¤‹†ŽÒ‚©‚ç‚Ìî•ñ”­M`v‹ž“s‘åŠw@2014”N6ŒŽiˆË—Šu‰‰j

 

m72n–Ø‘ºŒšŽŸ˜Y

g•¨Ž¿ŠE–Ê‚Ì\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

JPCA|show 2014 ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUA“Œ‹ž@2014”N6ŒŽ

 

m73n–Ø‘ºŒšŽŸ˜Y

“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”­

‰ž—p•¨—Šw ‰ïŠÖ¼Žx•” •½¬‚Q‚U”N“x‘æ‚P‰ñu‰‰‰ï

uƒvƒ[ƒuŒ°”÷‹¾‚Æ—L‹@ƒGƒŒƒNƒgƒƒjƒNƒX `ŠÖ¼ŽáŽèŒ¤‹†ŽÒ‚©‚ç‚Ìî•ñ”­M`vg“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”­h‹ž“s‘åŠw@2014”N6ŒŽ26“úiˆË—Šu‰‰j

 

m74n–Ø‘ºŒšŽŸ˜Y

g•¨Ž¿ŠE–Ê‚Ì\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

2014ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[(‘æ28‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“W)

ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUA“Œ‹žƒrƒbƒOƒTƒCƒg@2014”N6ŒŽ 4“ú|6“úA

 

m75n–Ø‘ºŒšŽŸ˜Y

 gNondestructive electric current density imaging inside

rechargeable battery cellg

NC-AFM 2014@@2014”N8ŒŽ4“ú-8“úAç—tŒ§‚‚­‚Αۉï‹cêiˆË—Šu‰‰j

17th International Conference on non-contact Atomic Force Microscopyi‘æ17‰ñ@”ñÚGŒ´ŽqŠÔ—ÍŒ°”÷‹¾‘Û‰ï‹cj

 

[76] –Ø‘ºŒšŽŸ˜Y

g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­h

í—ª–Ú•WuƒvƒƒZƒXƒCƒ“ƒeƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚鎟¢‘ãƒiƒmƒVƒXƒeƒ€‚Ì‘n»v‚RŒ¤‹†—̈æ‘æ‚Q‰ñ‡“¯ŒöŠJƒVƒ“ƒ|ƒWƒEƒ€A“Œ‹žA2014”N10ŒŽ1“ú

 

m77n–Ø‘ºŒšŽŸ˜Y, ”ü”n—EŽ÷, –ì–{˜a½, ‘ååM”ͺ, –Ø‘ºŒ›–¾

g“dŽ¥êÄ\¬ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ÌŠJ”­‚Æ“d’r“à•”‚Ì“d—¬Œo˜H‰f‘œ‰»‚ւ̉ž—ph“d’r“¢˜_‰ï@‘æ81‰ñ‘å‰ï@‘—§‹ž“s‘Û‰ïŠÙ@2014”N‚P‚PŒŽ‚P‚X“ú

–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –ì–{˜a½, ‘ååM”ͺ, –Ø‘ºŒ›–¾, ‘æ55 ‰ñ“d’r“¢˜_‰ï u‰‰—vŽ|W p.348 (2014).

 

[78] –Ø‘ºŒšŽŸ˜Y

gŽ¥‹C‰f‘œ‰»‚É‚æ‚é”ñ”j‰ó‰æ‘œŒŸ¸@- “dŽq•”•i,ƒŠƒ`ƒEƒ€’~“d’r“à•”‚ÌŒÌáŒÂŠ‚ð“Á’è -h

ƒOƒŠ[ƒ“ƒCƒmƒx[ƒVƒ‡ƒ“V‹Zpà–¾‰ïC‚i‚r‚s“Œ‹ž–{•”•ÊŠÙƒz[ƒ‹i“Œ‹žEŽsƒ–’Jj 2015”N‚PŒŽ16“ú

 

[79] –Ø‘ºŒšŽŸ˜YCŒü“a”žC–Ø‘ºŒ›–¾CŽO–Ø–œ—RŽqC‚”öM‘¾˜Y

gƒŠƒAƒ‹ƒ^ƒCƒ€ƒ}ƒCƒNƒ”gƒ}ƒ“ƒ‚ƒOƒ‰ƒtƒB‚ÌŠJ”­h‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï@“ŒŠC‘åŠw ÓìƒLƒƒƒ“ƒpƒX@2015”N3ŒŽ11“ú`14“ú

 

[80] –Ø‘ºŒšŽŸ˜Y@

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”­‚Æ“dŽq•”•i,’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—ph

æ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”­ƒvƒƒOƒ‰ƒ€@V‹Zpà–¾‰ïC ‚i‚r‚s“Œ‹ž–{•”•ÊŠÙƒz[ƒ‹i“Œ‹žEŽsƒ–’JjC2015”N3ŒŽ23“ú

 

[81] –Ø‘ºŒšŽŸ˜Y@

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”­‚Æ’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—ph

’~“d’rƒ[ƒJ‚Å‚Ìu‰‰iˆ¤’mŒ§jC2015”N4ŒŽ20“ú(Invited)

 

[82]–Ø‘ºŒšŽŸ˜Y@–ì–{˜a½A”ü”n—E‹PA–Ø‘ºŒ›–¾

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h

2015ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[i‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WjƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU@“Œ‹žƒrƒbƒOƒTƒCƒg@2015”N6ŒŽ3“ú`‚T“ú

 

[83] –Ø‘ºŒšŽŸ˜Y

‘æ‚T‰ñŠÖ¼’nˆæ‘åŠwŒ¤‹†Žx‰‡ƒXƒ^ƒbƒtƒ~[ƒeƒBƒ“ƒO,h–Ø‘ºŒ¤‹†Žº‚ÌŠˆ“®, Šú‘Ò‚·‚錤‹†¬‰Ê‚̃AƒEƒgƒŠ[ƒ`Žx‰‡h, _ŒË‘åŠw 2015”N8ŒŽ2“ú(Invited).

 

[84] –Ø‘ºŒšŽŸ˜Y

gƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”­‚ƶ‘ÌA’~“d’r,ƒCƒ“ƒtƒ‰‰æ‘œŒŸ¸‚ւ̉ž—ph

ƒCƒmƒx[ƒVƒ‡ƒ“EƒWƒƒƒpƒ“2015i“Œ‹žƒrƒbƒOƒTƒCƒgj2015”N‚WŒŽ‚Q‚V“ú

 

[85]  –Ø‘ºŒšŽŸ˜Y

gÅæ’[‰æ‘œŒv‘ª‘•’u‚ÌŠJ”­‚ÆŽÀ—p‰»@-ˆÀ‘S,ˆÀS‚ȎЉï‚ð–ÚŽw‚µ‚Ä-h

í—ª–Ú•WuƒvƒƒZƒXƒCƒ“ƒeƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚鎟¢‘ãƒiƒmƒVƒXƒeƒ€‚Ì‘n»v

‚RŒ¤‹†—̈æ‘æ‚R‰ñ‡“¯ŒöŠJƒVƒ“ƒ|ƒWƒEƒ€@“Œ‹žiƒRƒNƒˆƒz[ƒ‹j‚Q‚O‚P‚T”N‚XŒŽ‚Q‚X“ú

 

[86] –Ø‘º ŒšŽŸ˜YC–Ø‘º Œ›–¾CL—˜ _ˆêC‹´–{ ’m‹vC²‹vŠÔ iŽqCŽO–Ø –œ—RŽqC‚”ö M‘¾˜Y

g”÷Žã“d”g‚ð—p‚¢‚½”ñNP“ûŠà‰æ‘œf’f–@‚ÌŠJ”­ \‚Š´“x“ûŠàŒŸo‚ð–ÚŽw‚µ‚Ä\h

‘æ‚Q‚T‰ñ@“ú–{“ûŠàŒŸfŠw‰ïŠwp‘‰ï@i‚‚­‚Αۉï‹cêj2015”N‚P‚OŒŽ‚R‚O“ú`‚R‚P“ú

 

[87] ›”ü”n —E‹P, –ì–{ ˜a½,–Ø‘º Œ›–¾, –Ø‘º ŒšŽŸ˜Y

 g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŒž‰ñŒ^’~“d’r‚ւ̉ž—ph

‘æ56‰ñ“d’r“¢˜_‰ï@3E25iˆ¤’mŒ§ŽY‹Æ˜J“­ƒZƒ“ƒ^[@ƒEƒCƒ“ƒN‚ ‚¢‚¿j2015”N11ŒŽ13“ú

 

[88] ›–Ø‘ºŒšŽŸ˜Y, “c‘º¹ˆ», –Ø‘ºŒ›–¾, ŽR‰º—SŽi, ‰Í–ì½”VC“c’†—DŽqCŽO–Ø–œ—RŽqCL—˜_ˆê, ‹´–{’m‹v, ²‹vŠÔ˜æŽq, ‚”öM‘¾˜Y, gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ÌŠJ”­- ŽB‘œ‘¬“x‚ÌŒüã‚ÉŠÖ‚·‚錟“¢ -h, ‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï, i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú

‰‰‘è”Ô†: DP-2-47-5@ƒZƒbƒVƒ‡ƒ“–¼F ƒ|ƒXƒ^[“¢‹c47@“úŽžF 2016”N6ŒŽ17“úi‹àj

 

Šw‰ï”­•\i‹¤’˜j

(1) S. Ido, K. Kimura, N. Oyabu, K. Kobayashi, Y. Hirata & H. Yamada,

 High-resolution Imaging of Biomolecules in Liquids by FM-AFM.

11th International Conference on Non-contact Atomic Force Microscopy, We-1450, Madrid, Spain (2008). Œû“ª”­•\

 

(2) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”ͺC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C•½“c –FŽ÷C¯ Ž¡C‹–Ø ’C’j,

u‰t’†“®ìŽü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½¶‘Ì‚•ªŽq‚Ì‚•ª‰ð”\ŠÏŽ@v

“ú–{Œ°”÷‹¾Šw‰ï‘æ64‰ñŠwpu‰‰‰ï, P-082, ‘—§‹ž“s‘Û‰ïŠÙ (2008”N). ƒ|ƒXƒ^[”­•\

 

(3) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”ͺC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C¯ Ž¡C‹–Ø ’C’j,

uŽü”g”•Ï’²•ûŽ®AFM‚ð—p‚¢‚½ƒvƒ‰ƒXƒ~ƒhDNA‚̉t’†‚•ª‰ð”\ŠÏŽ@v

 2008”Nt‹G ‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 29p-Q-6, “ú–{‘åŠw (2008”N). Œû“ª”­•\

 

 

(4) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”ͺC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C•½“c –FŽ÷C¯ Ž¡C‹–Ø ’C’j,

uŽü”g”•Ï’²ŒŸo•ûŽ®AFM‚ð—p‚¢‚½¶‘Ì‚•ªŽq‚̉t’†‚•ª‰ð”\ŠÏŽ@v

 2008”NH‹G ‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 4a-L-3, ’†•”‘åŠw (2008”N). Œû“ª”­•\

 

 

i5j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m

 Œõ“d’…–@‚ð—p‚¢‚Ä”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚ÌŒ¤‹†, “Á’è—̈挤‹†u‚ŽŸ•ªŽqŒn‰ÈŠwv‘æ3‰ñ‡“¯”Á‰ï‹c, 2008,

 

i6j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

   Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“ƒ‚ƒfƒ‹G”}‚ÌAFMŠÏŽ@, ‘æ102‰ñG”}“¢˜_‰ï, 2008,

 

i7j  K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, H. Yamada.

Molecular-scale Hydration Structures Investigated by Frequency Modulation Atomic Force Microscopy,

 11th International Conference on Non-contact Atomic Force Microscopy (NCAFM2008), 2008,

 

i8j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚ÌSPMŠÏŽ@,

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2008,

 

i9j Kenjiro Kimura, Takumi Hiasa, Hiroshi Onishi.

Development of scanning probe tomography and its application for visualizing internal nanomagnetic structures,

2008 MRS Fall Meeting, 2008,

 

i10jTakumi Hiasa, Suzumi Kataoka, Kenjiro Kimura, Hiroshi Onishi.

 Scanning probe study of TiO2 surfaces placed in reactive environments,

 2008 MRS Fall Meeting, 2008,

 

i11j Suzumi Kataoka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 SPM Observation of Pt Nanoparticles Photodeposited on TiO2(110),

2008 MRS Fall Meeting, 2008,

 

i12j •Ð‰ª—Á”ü, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, •²ì—Ç•½, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

Œõ“d’…–@‚Å쬂µ‚½”’‹à’SŽŽ_‰»ƒ`ƒ^ƒ“G”}‚̃vƒ[ƒuŒ°”÷‹¾ŠÏŽ@,

G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[[ƒVƒ‡ƒ“uK‰ï, 2008,

 

i13j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, •²ì—Ç•½, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–Ê‚ÌŠÏŽ@,

G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[[ƒVƒ‡ƒ“uK‰ï, 2008,

 

i14jSuzumi Kataoka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Noriyuki Oyabu, Kei Kobayashi, Hirofumi Yamada.

 AFM study of Pt Nanoparticles on TiO2(110) Deposited in Solutions,

The 16th International Colloquim on Scanning Probe Microscopy, 2008,

 

i15j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Noriyuki Oyabu, Kei Kobayashi, Hirofumi Yamada.

Solvation Structures at a Solution-TiO2 Interface Studied by Frequency-Modulation Atomic Force Miscroscopy,

The 16th International Colloquim on Scanning Probe Microscopy, 2008,

 

i16j Keita Fujio, Kenjiro Kimura, Naoki Koide, Hiroshi Onishi.

 FM-AFM Study of Dye-Adsorbed TiO2(110) Electrodes,

 The 16th International Colloquim on Scanning Probe Microscopy, 2008,

 

i17j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 ŒõG”}”½‰žê‚É‚¨‚¯‚é‹ÇŠ…˜a\‘¢Œv‘ª,

 _ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï2008,

 

i18j  •Ð‰ª—Á”ü, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

”’‹à’SŽ“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚Ì‘g¬E\‘¢•ªÍ,

_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï2008, 2008,

 

i19j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Ž_‰»ƒ`ƒ^ƒ“-…—n‰tŠE–Ê‚É‚¨‚¯‚é‹ÇŠ…˜a\‘¢‚ÌFM-AFM‰ðÍ,

 “ú–{‰»Šw‰ï‘æ89t‹G”N‰ï, 2009,

 

i20j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 ‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é…—n‰t-“ñŽ_‰»ƒ`ƒ^ƒ“ŠE–Ê‚Ì‹ÇŠ—n”}˜a\‘¢‰ðÍ,

t‹G‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2009,

 

i21j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹à‘®Ž_‰»•¨‚Ì‹ÇŠ…˜a\‘¢‰ðÍ,

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2009,

 

i22j A“c^s, –Ø‘ºŒ’ŽŸ˜Y, ‘å¼—m.

TiO2(110)•\–Ê‚É‹z’…‚µ‚½Ž_‘fŒ´Žq‚Ì‹zŠj”½‰ž«,

 ‘æ104‰ñG”}“¢˜_‰ï, 2009,

 

i23j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

‰t’†“®ìŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨-…—n‰tŠE–ʂ̉ðÍ,

 ‘æ29‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2009,

 

i24j “¡”öŒc‘¾, ¬o’¼é, •ÐŽR”Ž”V, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éF‘f‘Š´“d‹Éƒ‚ƒfƒ‹‚ÌŠÏŽ@,

‘æ29‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2009,

 

i25jT. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

 Local Hydration Structures on Metal Oxides Investigated by Frequency-Modulation Atomic Force Microscopy,

The 7th International Workshop on Oxide Surfaces (IWOX-VII), 2010,

 

i26j M. Ueda, M. Yasuo, K. Kimura, H. Onishi.

 Nucleophilic Reactivity of Oxygen Adatoms on a TiO2(110) Surface,

The 7th International Workshop on Oxide Surfaces (IWOX-VII), 2010,

 

i27j Keita Fujio, Naoki Koide, Hiroyuki Katayama, Kenjiro Kimura, Hiroshi Onishi.

 FM-AFM Observation of Dye-Sensitized TiO2 Electrodes,

The 7th International Workshop on Oxide Surfaces (IWOX-VII), 2010,

 

i28j Keita Fujio, Kenjiro Kimura, Naoki Koide, Hiroyuki Katayama, Hiroshi Onishi.

 Dye-Adsorbed TiO2(110) Electrodes Studied with FM-AFM,

The 17th International Colloquim on Scanning Probe Microscopy (ICSPM-17), 2009,

 

i29j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–Ê‚Ì—n”}˜a\‘¢‰ðÍ,

 “ú–{‰»Šw‰ï‘æ90t‹G”N‰ï, 2010,

 

i30j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鎩ŒÈ‘gD‰»’P•ªŽq–Œ‚Ì”ñ…—n”}’†ŠÏŽ@,

t‹G‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2010,

 

i31jT. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

 Force Spectroscopy at Liquid-Oxide Interfaces,

 The 12th International Scanning Probe Microscopy Conference, 2010,

 

i32j T. Sugihara, T. Hiasa, H. Onishi, K. Kimura, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada, T. Iwasaki, Y. Fukami.

 FM-AFM Study of Proteins on Lipid Rafts,

 The 12th International Scanning Probe Microscopy Conference, 2010,

 

i33j¡“c”Žä, “úóI, –Ø‘ºŒšŽŸ˜Y, ]ŒûŒ’ˆê˜Y, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶, ‘å¼—m.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éCaCO3”÷—±Žq‚̉t’†‚•ª‰ð”\ŠÏŽ@,

 “ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠwpu‰‰‰ï, 2010,

 

i34j ¡“c”Žä, “úóI, –Ø‘ºŒšŽŸ˜Y, ]ŒûŒ’ˆê˜Y, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶, ‘å¼—m.

Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é”÷—±Žq‚Ì‚•ª‰ð”\ŠÏŽ@,

“ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠwpu‰‰‰ï, 2010,

 

i35j T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

FM-AFM study of thiol-modified gold films immersed in organic solvents,

13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i36j Keita Fujio, Naoki Koide, Hiroyuki Katayama, Kenjiro Kimura, Hiroshi Onishi.

NC-AFM study of dye-sensitized TiO2 electrodes,

13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i37j T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

 FM-AFM Study on Hydrophilic and Hydrophobic Metal Oxides,

 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i38j M. Yamazaki, T. Hiasa, M. Ohta, K. Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada, T. Hiasa, K. Kimura, H. Onishi.

 Solution-Polyethylene Interface Studied by FM-AFM,

 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,

 

i39j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

FM-AFM Study of Hydration at Water-Metal Oxides Interfaces,

The International Chemical Congress of Pacific Basin Societies (PACIFICHEM 2010), 2010,

 

i40j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

Kelvin Probe Force Microscope Study of Impregnated Pt/ TiO2 Catalyst Models,

 The International Chemical Congress of Pacific Basin Societies (PACIFICHEM 2010), 2010,

 

i41j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

 FM-AFM Study of Organic Solvents Interfaced with a Thiol-Modified Gold Surface,

The International Chemical Congress of Pacific Basin Societies (PACIFICHEM 2010), 2010,

 

i42j M. Yamazaki, T. Hiasa, M. Ohta, K. Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada, T. Hiasa, K. Kimura, H. Onishi.

 FM-AFM Study of Solution-Soft Matter Interfaces,

17th International Microscopy Congress (IMC-17), 2010,

 

i43j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì—n”}˜a\‘¢Œv‘ª,

“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ5‰ñ‡“¯”ljï‹c, 2010,

 

i44j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, •²ì—Ç•½, ‘å“c¹O, “n糈ê”V, ŽRè«Žk, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì—n‰t\‘¢‚ÌŒŸ“¢,

 •ªŽq‰ÈŠw“¢˜_‰ï2010, 2010,

 

i45j “Œ—Yˆê, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶

 Ã“d‹C—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨‚Ì•\–Ê“dˆÊ•ª•zŒv‘ª,

 ‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2010,

 

i46j  T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.

Force Spectroscopy at Liquid-Solid Interfaces,

The 6th International Workshop on Nano-scale Spectroscopy and Nanotechnology (NSS6), 2010,

 

i47j¬”¨ŒbŽq, ‘å¼—m, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y.

 “dŽ¥ê‹t‰ðÍ–@‚É‚æ‚鎥‹C‹L˜^”}‘Ì‚ÌŽOŽŸŒ³Ž¥ê•ª•zŒv‘ª,

‘æ30‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2010,

 

i48j ™Œ´’m‹I, —шí•à, “úóI, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒyƒvƒ`ƒhƒiƒmƒ`ƒ…[ƒu‚ÌŠÏŽ@,

“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ4‰ñŒöŠJƒVƒ“ƒ|ƒWƒEƒ€, 2010,

 

i49j Masashi Yamazaki, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

FM-AFM Study of Polyethylene-Adsorbed Graphite Immersed in Water,

The 18th International Colloquim on Scanning Probe Microscopy, 2010,

 

i50j Tomoki Sugihara, I. Hayashi, Takumi Hiasa, Kenjiro Kimura, A. Tamura, Hiroshi Onishi, Masahiro Ohta, Kazuyuki Watanabe, Ryohei Kokawa, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.

 Peptide Nanotubes Observed by Frequency-Modulation Atomic Force Microscopy,

 The 18th International Colloquim on Scanning Probe Microscopy, 2010,

 

i51j —é–Ø’qŽq, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œ‚ÌŠÏŽ@,

 “ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,

 

i52j“úóI, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œã‚Ì…—n‰t\‘¢‚ÌŒŸ“¢,

“ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,

 

i53j¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒƒAƒjƒŠƒ“Œ‹»‚Ì•\–ÊŠÏŽ@,

“ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,

 

i54jŽRè«Žk, •²ì—Ç•½, ‘å“c¹O, “n糈ê”V, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 ƒOƒ‰ƒtƒ@ƒCƒgã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚̃…’†FM-AFMŠÏŽ@,

 t‹G‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2011,

 

i55j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 ˆÙ‚È‚éæ’[Œa‚ð‚à‚Â’Tj‚ð—p‚¢‚½‰t’†FM-AFMŒv‘ª,

t‹G‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2011,

 

i56j¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒƒAƒjƒŠƒ“Œ‹»‚Ì•\–ÊŠÏŽ@,

 Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,

 

i57j “úóI, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.

Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œã‚Ì…—n‰t\‘¢‚ÌŒŸ“¢,

 Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,

 

i58j •²ì—Ç•½, ŽRè«Žk, ‘å“c¹O, “n糈ê”V, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

ƒOƒ‰ƒtƒ@ƒCƒgã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚̃…’†FM-AFMŠÏŽ@,

 Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,

 

i59j â—´“T, ‘å¼—m, –Ø‘ºŒšŽŸ˜Y.

’ቷŽŽ—¿ƒzƒ‹ƒ_[‚ÌŠJ”­‚Ɖt’†“®ìŽü”g”•Ï’²•ûŽ®AFM‚ւ̉ž—p,

 ‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2011,

 

i60j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 FM-AFM‚É‚æ‚ée…«’P•ªŽq–Œã‚Ì…—n‰t\‘¢‚̉ðÍ,

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2011,

 

i61j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 Hydration to Hydrophilic Monolayers Visualized by FM-AFM,

14th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,

 

i62j —é–Ø’qŽq, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

ƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹’P•ªŽq–Œ‚ÉÚ‚·‚éƒwƒLƒTƒfƒJƒ“‰t‘Ì‚Ì\‘¢,

‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i63j¡“c”Žä, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’YŽ_ƒJƒ‹ƒVƒEƒ€‚̉t’†ŠÏŽ@,

 ‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i64j ¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½p-ƒjƒgƒƒAƒjƒŠƒ“-‰t‘ÌŠE–Ê‚ÌŠÏŽ@,

 ‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i65j ™Œ´’m‹I, —шí•à, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘å¼—m.

ƒOƒ‰ƒtƒ@ƒCƒg-‰t‘ÌŠE–Ê‚ÉWÏ‚µ‚½ƒyƒvƒ`ƒhƒiƒmƒ`ƒ…[ƒu‚Ì\‘¢,

‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i66j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹’P•ªŽq–Œã‚̉t‘Ì\‘¢‚̉ðÍ,

 ‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,

 

i67jRyohei Kokawa, Masashi Yamazaki, Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.  FM-AFM study of n-Alkane-Adsorbed Graphite Immersed in Liquids,

14th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,

 

i68j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

High-Resolution FM-AFM Imaging of Calcite Particles in Water,

International Symposium on Surface Science (ISSS6), 2011,

 

i69jHirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 High-resolution imaging of CaCO3 particles in liquid by FM-AFM,

Japan-Finland Joint Seminar of Material Science, 2011,

 

i70j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 Interfacial Liquids Visualized by Frequency-Modulation AFM,

 International Association of Colloid and Interface Scientists, Conference (IACIS2012), 2012,

 

i71j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ée…«’P•ªŽq–Œã‚̉t‘Ì\‘¢‚ÌŒŸ“¢,

“ú–{‰»Šw‰ï‘æ92t‹G”N‰ï, 2012,

 

i72j  Rina Nishioka, Takumi Hiasa, Hiroshi Onishi, Kenjiro Kimura.

Interfacial Water over p-Nitroaniline (101) Surface,

15th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2012), 2012,

 

i73j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

  FM-AFM ‚É‚æ‚édecanol/HOPG ŠE–Ê‚Ì\‘¢‰ðÍ,

 ‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2012,

 

i74j “úóI, –Ø‘ºŒ’ŽŸ˜Y, ‘å¼—m.

e…E‘a…Šî‚ð‹¤‘¶‚³‚¹‚½•\–Êã‚Ì…˜a\‘¢ŠÏŽ@,

‘æ6‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2012, 2012,

 

i75j  ¼‰ª—˜“Þ, “úóI, ‘å¼—m, –Ø‘ºŒšŽŸ˜Y.

ƒjƒgƒƒxƒ“ƒ[ƒ“—U“±‘ÌŒ‹»-…ŠE–Ê‚ÌFM-AFM‚ð—p‚¢‚½\‘¢‰ðÍ,

 ‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,

 

i76j  ¡“c”Žä, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

Žü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒJƒ‹ƒTƒCƒg-…—n‰tŠE–Ê‚Ì\‘¢‰ðÍ,

 ‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,

 

i77j   “c’†—T—S, –Ø‘ºŒšŽŸ˜Y, Ž}˜a’j, ‘å¼—m.

¸‰Ø«Œ‹»‚ÌŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‘å‹C’†ŠÏŽ@,

 ‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,

 

i78j Yuki Mima, Noriaki Oyabu, Takeshi Inao, Noriaki Kimura, Kenjiro Kimura.

 Development of Tunneling Magnetoresistance Microscope with Electro-Magnetic Field Reconstruction,

 International Conference of the Asian Union of Magnetics Societies (ICAUMS2012), 2012,

 

i79j Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.

 FM-AFM Observation on Mercaptohexanol Monolayer in Aqueous Solution,

The 20th International Colloquim on Scanning Probe Microscopy, 2012,

 

i80j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 Water and 2-Propanol Structured on Calcite (104): An Atomic Force Microscopy Study (invited),

Japan-Korea Joint Symposium on Frontiers in Molecular Science -From Quantum to Life-, 2013,

 

i81j  …Œõr‰î, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

 Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’¼½ƒAƒ‹ƒR[ƒ‹-ƒ}ƒCƒJŠE–Ê‚ÌŠÏŽ@,

 “ú–{Œ°”÷‹¾Šw‰ï‘æ69‰ñŠwpu‰‰‰ï, 2013,

 

i82j  Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 Interfacial Water over CaCO3 probed by FM-AFM,

 33rd International Conference on Solution Chemistry, 2013,

 

i83j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

 Interfacial Water and 2-Propanol over CaCO3 probed by FM-AFM,

 16th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2013), 2013,

 

i84j Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.

  Water and 2-Propanol Structured on Calcite (104): Imaging by Frequency-Modulation AFM,

 ‘æ64‰ñƒRƒƒCƒh‚¨‚æ‚ÑŠE–ʉ»Šw“¢˜_‰ï“ú‹ƒVƒ“ƒ|ƒWƒEƒ€, 2013,

 

i85j …Œõr‰î, “úóI, –Ø‘ºŒ’ŽŸ˜Y, ‘å¼—m.

Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒ}ƒCƒJã‚Ì’¼½ƒAƒ‹ƒR[ƒ‹‚̉t‘Ì\‘¢‚̉ðÍ,

‘æ7‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2013, 2013,

 

i86j  “à“cŒö“T, ŽO“cˆêŽ÷, ¼‰ªC, ˆÉ茒°, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.

ˆêŽ²‰„LƒAƒCƒ\ƒ^ƒNƒ`ƒbƒNƒ|ƒŠƒvƒƒsƒŒƒ“‚ÌŽü”g”•Ï’²ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŠÏŽ@,

‘æ63‰ñ‚•ªŽq“¢˜_‰ï, 2014,

 

(87) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 uƒ‰ƒhƒ“•ÏŠ·‚É‚æ‚鎥‹CƒCƒ[ƒWƒ“ƒO‚Ì‚•ª‰ð”\‰»v,

 ‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 11a-C10-7, ˆ¤•Q, 2012”N9ŒŽ

 

(88) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 uŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚Ì‚•ª‰ð”\‰»‚ÉŠÖ‚·‚錤‹†v,

 _ŒË‘åŠw—Šw•”ƒz[ƒ€ƒJƒ~ƒ“ƒOƒfƒC‘æ3‰ñƒTƒCƒGƒ“ƒXƒtƒƒ“ƒeƒBƒAŒ¤‹†”­•\‰ï, _ŒË, 2012”N10ŒŽ

 

(89) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 u“dŽ¥êÄ\¬ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ð—p‚¢‚½“d’r“à•”‚Ì“d—¬–§“x•ª•zŒv‘ªv,

 ‘æ53‰ñ“d’r“¢˜_‰ï, 3A16, •Ÿ‰ª, 2012”N11ŒŽ

 

(90) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 u“dŽ¥êÄ\¬-Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ð—p‚¢‚½“d‰×ˆÚ“®‚̉Ž‹‰»v,

 _ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï 2012, P063, _ŒË, 2012”N12ŒŽ

 

(91) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 u“dŽ¥êÄ\¬ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ÌŠJ”­‚Æ“d’r“à•”‚É‚¨‚¯‚é“d‰×ˆÚ“®‰ÂŽ‹‰»‚ւ̉ž—pv,‘æ54‰ñ“d’r“¢˜_EE 3F17, ‘åã, 2013”N10ŒŽ

 

”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y, ‘æ54 ‰ñ“d’r“¢˜_‰ï u‰‰—vŽ|W p.423 (2013)

 

 

(92) Y. Mima, N. Oyabu, K. Inao, N. Kimura, and K. Kenjiro:

 gDevelopment of tunnelingmagnetoresistance microscope with electromagnetic field reconstructionh

 International Conference of the Asian Union of Magnetics Societies 2012, 2pPS-114, Japan, Oct. 2012.

 

(93) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 u“d’r“à•”‚Ì“d—¬•ª•z‚̉f‘œ‰» - ‚•ª‰ð”\Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­ -v,

 FC EXPO 2013 `‘æ9‰ñ [‘Û] …‘fE”R—¿“d’r“W`, “Œ‹ž, 2013”N2ŒŽ

 

(94) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y

 u“d—¬Œo˜H‚Ì”ñ”j‰ó‰f‘œ‰»‘•’u‚ÌŽÀ—p‰»]“dŽq•”•i, ƒvƒŠƒ“ƒgŠî”Â, “d’r‚Ì•s—ljð͂ւ̉ž—p]v

 JPCA2013]‘æ43‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“W],“Œ‹ž,2013”N6ŒŽ

 

(95) Yuki Mima, Noriaki Oyabu, Takeshi Inao, Noriaki Kimura, Kenjiro Kimura:

 Failure analysis of electric circuit board@by high resolution magnetic field microscopy

 IEEE CPMT Symposium Japan (Formerly VLSI Packaging Workshop of Japan)2013,Session19:Reliability2,Japan,Nov.2013.

 

(96) ”ü”n —E‹P,–ì–{ ˜a½,‘ååM ”ÍÐ,–Ø‘º Œ›–¾,–Ø‘º ŒšŽŸ˜Y

 gƒŠƒAƒ‹ƒ^ƒCƒ€Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”­‚Æ’~“d’r“à“d—¬‚Ì‚‘¬‰f‘œ‰»‚ւ̉ž—ph “d‹C‰»Šw‰ï‘æ82‰ñ‘å‰ï@‰¡•lŒö—§‘åŠw@2015”N3ŒŽ15“ú`17“ú

 

(97)  –ì–{ ˜a½,”ü”n —E‹P,‘ååM ”ͺ,–Ø‘º Œ›–¾,–Ø‘º ŒšŽŸ˜Y

 g“dŽ¥êÄ\¬-Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚É‚æ‚鑽‘w’~“d’r“à•”‚Ì”ñ”j‰ó“d—¬Œo˜H‰f‘œ‰»h “d‹C‰»Šw‰ï‘æ82‰ñ‘å‰ï@‰¡•lŒö—§‘åŠw@2015”N3ŒŽ15“ú`17“ú

 

(98)  •Ð‰ªŠ°KC‘“c—T‹PC–Ø‘ºŒšŽŸ˜YC’ƒ’JŠG—

 gŽü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n‰t’†ƒAƒ~ƒƒCƒhüˆÛ‚Ì\‘¢‰ðÍh_ŒË‘åŠwæ’[—Z‡‰ÈŠwƒVƒ“ƒ|ƒWƒEƒ€w¶‘Ì•ªŽq‚̃_ƒCƒiƒ~ƒNƒX‚ð’­‚ß‚éx_ŒË‘åŠw@2015”N1ŒŽ19“ú`20“ú

 

(99) ‚”öM‘¾˜Y, –Ø‘ºŒšŽŸ˜Y, ŽO–Ø–œ—RŽq, L—˜_ˆê, ‹´–{’m‹v, ²‹vŠÔiŽq, –Ø‘ºŒ›–¾

gƒŠƒAƒ‹ƒ^ƒCƒ€ƒ}ƒCƒNƒ”gƒ}ƒ“ƒ‚ƒOƒ‰ƒtƒB‚ÌŠJ”­‚Æ“ûŠà‘gD3ŽŸŒ³‰f‘œ‰»‚ÌŒ¤‹†h‘æ23‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï “Œ‹ž‘ÛƒtƒH[ƒ‰ƒ€ 2015”N7ŒŽ2“ú`4“ú@´˜^, DP-1-46-05 (2015) p.375.

 

i100j–Ø‘ºŒšŽŸ˜YA–ì–{˜a½A”ü”n—E‹PA–Ø‘ºŒ›–¾

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h

2015ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[i‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WjƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU@i“Œ‹žƒrƒbƒOƒTƒCƒgj2015”N‚UŒŽ‚R“ú`‚T“ú

 

i101j”ü”n—E‹PE–Ø‘ºŒ›–¾E–Ø‘ºŒšŽŸ˜Y

g“dŽq‚âƒCƒIƒ“‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’u‚ÌŠJ”­h

“ú–{‰»Šw‰ïH‹GŽ–‹Æ@‘æ‚T‰ñCSJ‰»ŠwƒtƒFƒXƒ^2015@“Œ‹žiƒ^ƒ[ƒz[ƒ‹M–xj‚Q‚O‚P‚T”N‚P‚OŒŽ‚P‚R“ú`‚P‚T“ú

 

i102j[85] ›”ü”n —E‹P, –ì–{ ˜a½,–Ø‘º Œ›–¾, –Ø‘º ŒšŽŸ˜Y@i\žŽž”­•\ŽÒ‚Í”ü”nŒN‚ÅŽÀÛ”­•\‚µ‚½‚Ì‚Í–Ø‘ºæ¶‚Å‚·B–{l“o’d‚Ì[85]‚É‹LÚj

g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŒž‰ñŒ^’~“d’r‚ւ̉ž—ph

‘æ56‰ñ“d’r“¢˜_‰ï@3E25iˆ¤’mŒ§ŽY‹Æ˜J“­ƒZƒ“ƒ^[@ƒEƒCƒ“ƒN‚ ‚¢‚¿j2015”N11ŒŽ13“ú

 

i103j•Ð‰ª@Š°KC–Ø‘º@ŒšŽŸ˜YC’ƒ’J@ŠG—C‘“c@—T‹PCŽR‰º@˜al

gŽü”g”•Ï’²ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ƒAƒ~ƒƒCƒhüˆÛ‚̉t’†‚•ª‰ð”\ŠÏŽ@h

“ú–{‰»Šw‰ï ‘æ96t‹G”N‰ï (2016)@1B3-49 i“¯ŽuŽÐ‘åŠwj2016”N3ŒŽ24“ú`27“ú

 

i104j‰Í–ì ½”VC“c’† —DŽqCŽR‰º —SŽiC–Ø‘º Œ’ŽŸ˜YC–Ø‘º Œ›–¾C‚”ö M‘¾˜Y

gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ð—p‚¢‚Ä“¾‚ç‚ꂽ‰æ‘œ‚Æ‹@Ší‚̈À‘S«‚ÉŠÖ‚·‚錟“¢h

‘æ25‰ñ“ú–{“ûŠà‰æ‘œŒ¤‹†‰ïi–¼ŒÃ‰®‘Û‰ï‹cêj2016”N2ŒŽ20“ú`2ŒŽ21“ú@

 

i105j–ì–{ ˜a½,@¼“c ¹Ž÷,@ˆîŠ_ –¾—¢,@”ü”n —E‹P,@–Ø‘º Œ›–¾,@–Ø‘º ŒšŽŸ˜Y

gƒTƒuƒT[ƒtƒFƒXŽ¥‹CƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚É‚æ‚鑽‘w’~“d’r“à‚Ì”ñ”j‰ó“d—¬–§“x•ª•zŒv‘ª‚ÉŠÖ‚·‚錤‹†h

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï21a-S322-11i“Œ‹žH‹Æ‘åŠw@‘剪ŽRƒLƒƒƒ“ƒpƒXj2016”N3ŒŽ19“ú`3ŒŽ22“ú

 

i106j•Ð‰ªŠ°KA–Ø‘ºŒšŽŸ˜YA’ƒ’JŠG—A‘“c—T‹PAŽR‰º˜al

gFM-AFM‚ð—p‚¢‚½ƒAƒ~ƒƒCƒhüˆÛ‚̉t’†\‘¢‰ðÍh

’`”’Œ¤ƒZƒ~ƒi[u\‘¢‚ðŠî”Õ‚Æ‚·‚é’`”’Ž¿‰ÈŠw‚É‚¨‚¯‚é–¢‰ðŒˆ–â‘èv

2016”N3ŒŽ1“ú`3ŒŽ2“úi“Œ‹ž‘åŠw@æ’[‰ÈŠw‹ZpŒ¤‹†ƒZƒ“ƒ^[j

http://www.protein.rcast.u-tokyo.ac.jp/tanpakuken2016/program.html

 

 

i107j‰Í–ì½”V, ŽR‰º—SŽi, “c’†—DŽq, “c‘º¹ˆ», –Ø‘ºŒšŽŸ˜Y, –Ø‘ºŒ›–¾, ŽO–Ø–œ—RŽq, ‚”öM‘¾˜Y,

gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ð—p‚¢‚Ä“¾‚ç‚ꂽ‰æ‘œ‚Æ’´‰¹”gƒGƒR[‰æ‘œ‚Ì”äŠrŒŸ“¢h

‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï@i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú

‰‰‘è”Ô†:DP-2-47-4@ƒZƒbƒVƒ‡ƒ“–¼F ƒ|ƒXƒ^[“¢‹c47@“úŽžF 2016”N6ŒŽ17“úi‹àj

 

i108j“c’†—DŽqC–Ø‘ºŒšŽŸ˜YC“c‘º¹ˆ», ŽR‰º—SŽiC‰Í–ì½”VC‚”öM‘¾˜YCŽO–Ø–œ—RŽqC–Ø‘ºŒ›–¾

gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚É‚æ‚é“û‘B—Ç«•a•Ï‚ÌŒŸ“¢h

@‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï@i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú

‰‰‘è”Ô†: GP-2-17-27 ƒZƒbƒVƒ‡ƒ“–¼F ƒ|ƒXƒ^[ŒfŽ¦17@‰æ‘œf’f2

“úŽžF 2016”N6ŒŽ17“úi‹àj@19:30-20:00

 

i109j‚”öM‘¾˜YC¼”ö—eŽq, ŽO–Ø–œ—RŽq, “cªD, L—˜_ˆêC–Ø‘ºŒšŽŸ˜YC“c‘º¹ˆ»,@²‹vŠÔ˜æŽqC‹´–{’m‹vC“c’†—DŽqC‰Í–ì½”VCŽR‰º—SŽiC–Ø‘ºŒ›–¾C

gƒ}ƒCƒNƒ”gƒ}ƒ“ƒ‚ƒOƒ‰ƒtƒBŠJ”­—Õ°ŽŽŒ±\‘æ“ñ•ñ\h

‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï@i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú

‰‰‘è”Ô†: DP-2-47-3

 

i110jŽO–Ø–œ—RŽqC–Ø‘ºŒšŽŸ˜YC“c‘º¹ˆ»C‚”öM‘¾˜YCL—˜_ˆêC‹´–{’m‹vC²‹vŠÔ˜æŽqCŽR‰º—SŽiC‰Í–ì½”VC“c’†—DŽqC–Ø‘ºŒ›–¾

gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚É‚¨‚¯‚é“ûŠà‘gD‰æ‘œ‚ÉŠÖ‚·‚錤‹†h

‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï@i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú

‰‰‘è”Ô†: GP-2-17-30@@ƒZƒbƒVƒ‡ƒ“–¼Fƒ|ƒXƒ^[ŒfŽ¦17@‰æ‘œf’f2@2016”N6ŒŽ17“úi‹àj

 

i111j–Ø‘ºŒšŽŸ˜Y, ˆîŠ_–¾—¢, —é–ØÍŒá, ¼“c¹Ž÷, ”ü”n—E‹P, –Ø‘ºŒ›–¾

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