_ŒË‘åŠw ”—ƒf[ƒ^ƒTƒCƒGƒ“ƒXƒZƒ“ƒ^[
‘åŠw‰@—ŠwŒ¤‹†‰È –Ø‘ºŒšŽŸ˜Y Œ¤‹†Žº
Basic Concept of
Dr. K.Kimura Group Research
* Research
1, Noninvasive breast imaging
Advertisement for human subjects about
next-generation scattering field
mammography (2016 fall~) (Japanese version)
2, Nondestructive subsurface electric current imaging
NEDO
article pressed on May 29
*Electric
current distribution imaging inside rechargeable battery.
*High-speed
imaging for observing time-dependance phenomeana.
3, Nondestructive subsurface imaging for Concrete
Infrastructure Sustainability
*‘—§Œ¤‹†ŠJ”–@l‰ÈŠw‹ZpU‹»‹@\‚ÌŽæÞ
Catalog and paper of magntici field imaging (in
Japanese) (pass)
Catalog and paper of magntici field imaging (in
English) (pass)
* Core member of K. Kimura Group
Kenjiro Kimura (PI)
Akari Inagaki
Seijyu Matsuda
Shogo Suzuki
Yoshinobu Yasui
Yoshiki Hidaka
Mai Ishida
Ryuichi Taguchi
Shiori Maezawa
*Cooperation company for measurement and analysis system
research
Integral Geometry Science inc.: JST & AMED member
Noriaki Kimura
Kyoji Doi
Akane Uoi
Yuki Mima
Miho samejima
*Member of cooperation company
Takeshi Inao
Kazuki Hoshijima
Ex-member of Kimura research group
Baku Kohden
Hiroyuiki kataoka
Kazuya Nishikawa
Kazunori Nomoto
Keiko Kobata
Akari Masuda
Tomoko Suzuki
Rina Nishioka
Satoshi Seike
Tomoki Sugihara
Ryusuke Ban
Yuichi Higashi
Yusuke Ikeda
Moyuko Hosokawa
Œ¤‹†‹ÆÑ
˜_•¶
[1] K. Kimura, K. Kobayashi, H.
Yamada, and K. Matsushige
"Two-dimensional dopant profiling by
scanning capacitance force microscopy"
Applied Surface Science 2003”N 210Šª
93-98.
[2] T.
Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige,
"Dynamic
force microscopy at high cantilever resonance frequencies using heterodyne
optical beam deflection method"
Applied
Physics Letter 2004”N 25Šª
6287-6289.
[3] K. Kimura, K. Kobayashi,
H. Yamada, K. Usuda and K. Matsushige
"Scanning capacitance force
microscopy imaging of metal-oxide-semiconductor field effect transistors"
Journal
of Vacuum Science and Technology B 2005”N 23Šª
1454-1458.
[4 ]
T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada, and K. Matsushige
gFrequency-modulation
atomic force microscopy at high cantilever resonance frequencies using the
heterodyne optical beam deflection methodh
Review of Scientific Instruments 2005”N76Šª
126110(1-3).
[5] K. Kimura, K. Kobayashi,
H. Yamada, K. Usuda and K. Matsushige
" TWO-DIMENSIONAL CARRIER PROFILING ON
OPERATING SIMOSFET BY SCANNING CAPACITANCE MICROSCOPY"
Proceedings of the 8th International Workshop on the
Fabrication, Characterization and Modeling of Ultra Shallow Junctions in
Semiconductors 2005”N 127.
[6] K.
Kimura, K. Kobayashi, H. Yamada, K. Usuda and K. Matsushige
"Two-dimensional
carrier profiling on operating Si-MOSFET by scanning capacitance microscopy"
Journal of Vacuum Science and Technology B
2006”N 24Šª 1371-1376.
[7] K. Kimura, K. Kobayashi,
H. Yamada, and K. Matsushige
"Improving sensitivity in electrostatic force
detection utilizing cantilever with tailored resonance modes"
Applied
Physics Letter 2007”N 90Šª
053113(1-3).
[8] K. Kimura, K. Kobayashi,
H. Yamada, K. Usuda and K. Matsushige
"Noncontact-mode scanning capacitance force
microscopy towards quantitative tow-dimensional carrier profiling on
semiconductor devices"
Applied
Physics Letter 2007”N 90Šª
083101(1-3).
[9] T. Hiasa, K. Kimura, H.
Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada,
gSolution-TiO2 Interface Probed by
Frequency-Modulation Atomic Force Microscopyh
Japanese Journal of Applied Physics 2009”N 48Šª, 08JB19 (1-3).
[10] K. Kimura, S. Ido, N. Oyabu, K.
Kobayashi, Y. Hirata, T. Imai, H. Yamada
gVisualizing
water molecule distribution by atomic force microscopy"
Journal of Chemical Physics 2010”N 132Šª,
194705(1-5).
[11] T. Hiasa, K. Kimura, H.
Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada
gAqueous Solution Structure over
ƒ¿-Al2O3(01-12) Probed by Frequency-Modulation Atomic Force Microscopyh@Journal of Physical Chemistry C 2010”N 114Šª, 21423-21426.
[12]
K. Fujio, K. Kimura, N. Koide, H. Katayama, H. Onishi.
gBlack-Dye-Adsorbed
TiO2 (110) Electrodes Studied by Frequency-Modulation Atomic Force Microscopyh
Japanese Journal of Applied Physics 2010”N49Šª, 08LB06(1-3).
[13] Y. Ando, T. Sugihara, K. Kimura, A. Tsuda.
A Self-Assembled Helical Anthracene Nanofibre Whose
P- and M-Isomers Show Unequal Linear Dichroism in a Vortex, Chemical
Communications 47 (2011) 11748-11750,
[14]
Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.
"Hydration
of hydrophilic thiolate monolayers visualized by atomic force
microscopy"
Phys. Chem. Chem. Phys. 14(2012)8419-8424
[15]
Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi
"Two-dimensional
distribution of liquid hydrocarbons facing alkanethiol monolayers visualized by
frequency modulation atomic force microscopy" , Colloids Surf.
A 396 (2012) 203-207.
[16]
Takumi Hiasa, Tomoki Sugihara, Kenjiro Kimura, Hiroshi Onishi
"FM-AFM
imaging of a commercial polyethylene film immersed in n-dodecane"
J. Phys.; Condens. Matter 24 (2012) 084011 (4 pages).
[17]
Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi
"Minitips in Frequency-Modulation
Atomic Force Microscopy at Solid-Liquid Interface"
Jpn.
J. Appl. Phys. 51 (2012) 025703 (4 pages).
[18]@–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”ͺ, ˆî’jŒ’,
g“dŽ¥êÄ\¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”‚Æ“dŽq•”•iŒÌá‰ð͂ւ̉ž—ph, ƒGƒŒƒNƒgƒƒjƒNƒXŽÀ‘•‹Zp 28, 16 (2012).(Invited)
[19] Takumi
Hiasa, Kenjiro Kimura, Hiroshi Onishi
gCross-Sectional
Structure of Liquid 1-Decanol over Graphiteh
Journal
of Physical Chemistry C 116 (2012) 26475–26479
[20]
Shinichiro Ido, Kenjiro Kimura, Noriaki Oyabu, Kei Kobayashi, Masaru
Tsukuda, Kazumi Matushige, Hirofumi Yamada
gBeyond the Helix Pitch: Direct Visualization of
Native DNA in Aqueous Solutionh
ACS Nano 2013 7(2)
1817-1822
[21] Sugihara Tomoki,
ituho Hyashi, Hiroshi Onishi, Kenjiro Kimura, Atsuo Tamura
gSub-nanometer-resolution imaging of peptide nanotubes
in water using frequency modulation atomic force microscopyh
Chemical
Physics 419(2013)74-77
[22] Takumi
Hiasa, Kenjiro Kimura, Hiroshi Onishi.
gInterfacial
Structure of Primary and Tertiary Alcohol Liquids over Hhydrophilic Thiolate
Monolayersh
Journal
of Physical Chemistry C 117 (2013) 5730-5735
[23] Rina
Nishioka, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi.
gSpecific
Hydration on p-Nitroaniline Crystal Studied by Atomic Force Microscopyh
Journal
of Physical Chemistry C 117 (2013) 2939-2943
[24]
Kei Kobayashi, Noriaki Oyabu, Kenjiro Kimura, Shinichiro Ido, Kazuhiro
Suzuki, Takashi Imai, Katsunori
Tagami, Masaru Tsukada, and Hirofumi Yamada
gVisualization
of hydration layers on muscovite mica in aqueous solution by frequency-modulation
atomic force microscopyh
Journal of Chemical Physics 138 (2013) 184704.
[25] H. Imada, K.
Kimura, H. Onishi.
gWater and 2-Propanol
Structured on Calcite (104) Probed by Frequency-Modulation Atomic Force
Microscopyh, Langmuir 29 (2013) 10744-10751,
[26] H. Imada, K. Kimura, H. Onishi.
gAtom-Resolved AFM Imaging of Calcite Nanoparticles in
Waterh, Chemical Physics 419 (2013) 193-195,
[27]–Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA‘ååM”ͺAˆî’jŒ’A–Ø‘ºŒ›–¾
g‚Š´“xŽ¥‹C’ïRŒø‰Ê‘fŽq‚É‚æ‚鎥ê‚ÌŒv‘ª‚Æ“dŽ¥êÄ\¬–@‚ð—p‚¢‚½‚•ª‰ð”\ƒRƒ“ƒNƒŠ[ƒg“à•”“S‹ØŒŸ¸‹Zp‚ÉŠÖ‚·‚錤‹†h, ”ñ”j‰óŒŸ¸Vol.62 (2013) No.10
Oct.527-528. (Invited)
[28] ”ü”n—E‹PA‘ååM”ͺCˆî’jŒ’A–Ø‘ºŒ›–¾A–Ø‘ºŒšŽŸ˜Y
g“d—¬Œo˜H‚Ì”ñ”j‰ó‰f‘œ‰»‘•’u‚ÌŽÀ—p‰»]“dŽq•”•iAƒvƒŠƒ“ƒgŠî”ÂA“d’r‚Ì•s—ljð͂ւ̉ž—p]h‘æ43‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-34(2013).
[29] Y. Mima, N. Oyabu, T. Inao, N.
Kimura, K. Kimura
"Failure analysis of electric circuit board by high
resolution magnetic field microscopy"
Proceedings of IEEE CPMT Symposium Japan (2013) 257-260.
[30] –Ø‘º ŒšŽŸ˜YA–ì–{ ˜a½A¬”¨ ŒbŽqA—é–Ø ’qŽqA”ü”n —E‹P, ‘ååM”ͺCˆî’jŒ’A–Ø‘ºŒ›–¾ g•¨Ž¿ŠE–Ê‚Ì\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”]h‘æ44‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU ,AP-17(2014). (ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUÜ)
[31] –Ø‘ºŒšŽŸ˜Y, –ì–{˜a½, ”ü”n—E‹P, –Ø‘ºŒ›–¾,
g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h
‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU, AP-18(2015).
”–¾
[1] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü
“ÁŠè 2004-036389 Œ´ŽqŠÔ—ÍŒ°”÷‹¾—pƒJƒ“ƒ`ƒŒƒo[@
[2] ŒÃì‹M‘å, –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü
“ÁŠè 2004-253258, ƒJƒ“ƒ`ƒŒƒo[‚¨‚æ‚Ñ‚»‚̉ž—p@
[3] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ‰P“cGŽ¡, ¼d˜a”ü
“ÁŠè2005-056724 •]‰¿—p”¼“±‘̃fƒoƒCƒXA•]‰¿—p”¼“±‘̃fƒoƒCƒX‚Ì컕û–@A”¼“±‘̃fƒoƒCƒX‚Ì•]‰¿•û–@,.
[4] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü
“ÁŠè2005-337824 “dŽqŒ°”÷‹¾§Œä‘•’uA“dŽqŒ°”÷‹¾§Œä•û–@A§ŒäƒvƒƒOƒ‰ƒ€,
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[5] –Ø‘ºŒšŽŸ˜Y, –x“à‹ª, ’†ˆäÍ•¶, ²“¡é•v, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü
“ÁŠè2007-91856 ‚RŽŸŒ³êŽæ“¾‘•’uA•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€AŽ¥‹C—ÍŒ°”÷‹¾Aî•ñ“Ç Žæ‘•’uA“d—¬•ª•z‘ª’è‘•’uA¶‘ÌŽ¥ê‘ª’è‘•’uA”ñ”j‰óŒŸ¸‘•’uA•À‚Ñ‚ÉA‚ŽŽŸŒ³êŽæ“¾‘•’u
[6] –Ø‘ºŒšŽŸ˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü
“ÁŠè2007-208209 “®Œa‘½‹ÉŽqŒ^”z’uƒŒƒ“ƒY‹y‚Ñ‚»‚ê‚ð—p‚¢‚½‰×“d—±ŽqŒõŠwŒn‘•’u
[7]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA’†ˆäÍ•¶A²“¡é•vA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü
“ÁŠèF2009-509223@‘ª’è‚É‚æ‚èê‚ðŽæ“¾‚·‚é‘•’u‚¨‚æ‚Ñ•û–@
“Á‹– 4878063†(2011/12/9)“ú–{
“Á‹–‘æ10-1127682†i2012/3/9jŠØ‘
[8] ‘ååM”ͺ, ‘å“c¹O, –Ø‘ºŒšŽŸ˜Y, ˆäŒËTˆê˜Y, ¬—ÑŒ\, ŽR“cŒ[•¶, ¼d˜a”ü
“ÁŠè2008-002057‘–¸‘•’u
[9] –Ø‘ºŒšŽŸ˜Y, ´‰Æ’qŽj, ‘å¼—m
“ÁŠè2009-164676‰×“d—±ŽqüÆŽË‘•’uA•`‰æ‘•’uA•ªÍŒ°”÷‹¾A‰×“d—±ŽqüoŽË‘•’u‚¨‚æ‚щדd—±Žqü—p‚̃Œƒ“ƒY‘•’u
[10] ‘ååM”ͺA–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA—é–؈ꔎA¬—ÑŒ\AŽR“cŒ[•¶
“ÁŠè2009-180137@§Œä‘•’uAŒ´ŽqŠÔ—ÍŒ°”÷‹¾A§Œä•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€
[11] ‘ååM”ͺA–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶
“ÁŠè2009-193606@U“®‘Ì‚ÌŽü”g”ŒŸo‘•’uAŒ´ŽqŠÔ—ÍŒ°”÷‹¾AU“®‘Ì‚ÌŽü”g”ŒŸo•û–@‚¨‚æ‚уvƒƒOƒ‰ƒ€
[12]–Ø‘ºŒšŽŸ˜YA“úóIA‘å¼—mA‘ååM”ͺ
“ÁŠè2009-297601@ƒJƒ“ƒ`ƒŒƒo[Œ^ƒZƒ“ƒTCƒoƒCƒIƒZƒ“ƒT‚¨‚æ‚уvƒ[ƒuŒ°”÷‹¾
[13]–Ø‘ºŒšŽŸ˜Y
“ÁŠè2010-44218@ƒ|ƒeƒ“ƒVƒƒƒ‹Žæ“¾‘•’uAŽ¥êŒ°”÷‹¾AŒŸ¸‘•’u‚¨‚æ‚у|ƒeƒ“ƒVƒƒƒ‹Žæ“¾•û–@
[14] ¬”¨ŒbŽq, –Ø‘ºŒšŽŸ˜Y
“ÁŠè:2010-214453 Ž¥êƒZƒ“ƒT‹y‚ÑŽ¥êƒZƒ“ƒT‚Ì»‘¢•û–@
[15] –Ø‘ºŒšŽŸ˜Y
“ÁŠèF2010-261016 Ž¥ê•ª•zŽæ“¾‘•’u
[16]
K.Kimura, K.Kobayashi, H.Yamada, K.Matsushige
United
States Patent: US 7,829,863 B2, Nov.9,2010
ELECTRON
BEAM IRRADIATION DEVICE
‘¼14Œ
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[1]K.
Kimura, T. Horiuchi, N. Oyabu, K. Kobayashi, Y. Hirata, M. Abe, K. Matsushige,
S. Morita, H. Yamada,
gLocal
Solvation Force Measurement by Frequency Modulation Atomic Froce Microscopyh
Ext.Abstr.10h
Int.Conf.Non-Contact Atomic Force Microscopy, 2007”NAp.83.
[2] K.
Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, and H. Yamada
"Molecular-scale
Hydration Structures Investigated by Frequency ModulationAtomic Force
Microscopy"
Ext.
Abstr. 11th Int. Conf. Non-contact Atomic Force Microscopy, 2008, p. 62.
[3]
Collaboration with Integral Geometry Instruments, LLC
g“dŽ¥êÄ\¬
– ‘–¸Œ^ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾h,
‰ÈŠwE•ªÍ‹@Ší‘—— p. 711 (2012).
[4]
–Ø‘ºŒšŽŸ˜Y
g‚±‚±‚Ü‚Å—ˆ‚½Œ´ŽqŠÔ—ÍŒ°”÷‹¾@ƒCƒIƒ“‰t‘Ì’†‚Ōő̕¨Ž¿•\–Ê‚ÌŒ´Žq‚ðŠÏŽ@h
ŒŽŠ§‰»Šw
68Šª
p.63(2012)
[5]
“úóI,
¼‰ª—˜“Þ,
–Ø‘ºŒšŽŸ˜Y,
‘å¼—m
gFM-AFM‚ÅŠÏ‚éŠE–ʉt‘Ì\‘¢‚̉»Šwh@
•\–ʉȊwiŒ¤‹†Ð‰îj
34 (2013) 352-357,
[6]
–Ø‘ºŒšŽŸ˜Y
g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŒ¤‹†h
‚‚³‚¾‚æ‚è25†
12ŒŽ25“ú
[7]@–Ø‘ºŒšŽŸ˜Y,
”ü”n—E‹P,
–Ø‘ºŒ›–¾,
‹|ˆäF‰À,
XN¬,
¯“‡ˆê‹P,
’†“c¬K,
“yˆä‹±“ñ
"”ñ”j‰óƒ‚ƒjƒ^ƒŠƒ“ƒO‚Ì‚½‚ß‚Ì3ŽŸŒ³ƒf[ƒ^‰ðÍ‹Zp‚¨‚æ‚Ñ‘•’u‹Zp",
‹‘å\‘¢•¨ƒwƒ‹ƒXƒ‚ƒjƒ^ƒŠƒ“ƒO,
NTS (2015).
[8]
––Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA–Ø‘ºŒ›–¾
g“d—¬Œo˜H‰ÂŽ‹‰»‹Zp\’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—p\h“d‹CŠw‰ïŽ@135Šª7†@i2015j437-440
.(Invited)
[9]”ü”n—E‹PA–Ø‘ºŒ›–¾A–Ø‘ºŒšŽŸ˜Y
gƒTƒuƒT[ƒtƒFƒXŽ¥‹CƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ÌŠJ”‚Æ”¼“±‘̃`ƒbƒv“à•”‚Ì“d—¬Œo˜H‰f‘œ‰»‚ւ̉ž—ph
ƒPƒ~ƒJƒ‹ƒGƒ“ƒWƒjƒ„ƒŠƒ“ƒO@60Šª10†@772-778i2015j
[10]
–Ø‘ºŒšŽŸ˜Y
gŒ¤‹†Žº–K–â@_ŒË‘åŠw‘åŠw‰@—ŠwŒ¤‹†‰È–Ø‘ºŒ¤‹†Žºh
ƒGƒŒƒNƒgƒƒjƒNƒXŽÀ‘•Šw‰ïŽVol.18@No.7@P511@ i2015”N11ŒŽ1“ú”sj
[11]
Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@Œ¤‹†¬‰ÊÅ“K“WŠJŽx‰‡ƒvƒƒOƒ‰ƒ€@
gŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u
FOCUS001‚ð¤•i‰»@_ŒË‘åŠw”ƒxƒ“ƒ`ƒƒ[Šé‹Æ
Integral Geometry InstrumentsŽÐ‚ð‘n—§h
A-STEP¬‰ÊW@2014@P57
i2014”N9ŒŽj
[12]
Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@Œ¤‹†¬‰ÊÅ“K“WŠJŽx‰‡ƒvƒƒOƒ‰ƒ€@
g‘åŠw”ƒxƒ“ƒ`ƒƒ[Šé‹ÆuIntegral
Geometry Science ŽÐv‚ðÝ—§h
A-STEP¬‰ÊW@2016@P30i2016”N1ŒŽ‰ü’ùj
[13]–Ø‘ºŒšŽŸ˜Y
g“d’r—p\‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”h
JSTæ’[Œv‘ª—v——2016@Œ¤‹†¬‰Ê“WŠJŽ–‹Æ@æ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”ƒvƒƒOƒ‰ƒ€@P24@i2016”N4ŒŽj
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[4] •½¬17”N11ŒŽ23“ú
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ƒiƒmŠw‰ï ‘æ‚S‰ñ‘å‰ï Best Young Presenter Award
[6] •½¬18”N6ŒŽ23“ú
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[7] •½¬19”N3ŒŽ5“ú
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scanning capacitance force microscopy towards quantitative two-dimensional
carrier profiling on semiconductor devicesh
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letter for Virtual Journal of Nanoscale Science & Technology.
[8] •½¬19”N6ŒŽ23“ú
g—n”}˜a\‘¢‰ÂŽ‹‰»‘•’uh
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[9] •½¬20”N11ŒŽ13“ú
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[10] •½¬21”N
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[11] •½¬26”N
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[12] •½¬26”N6ŒŽ4“ú
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2014
JPCA ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUÜ
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2010”N11ŒŽ23“ú@ƒeƒNƒmˆ¤2010@‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ@
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http://www.kyoto-u.ac.jp/static/ja/news_data/h/h1/news7/2010/101123_1.htm
2011”N9ŒŽ21“ú@‰»ŠwH‹Æ“ú•ñV•·ˆê–Ê
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2011”N9ŒŽ22“ú@ƒ}ƒCƒiƒrƒjƒ…[ƒX
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2011”N9ŒŽ22“ú@“úŒoƒvƒŒƒXƒŠƒŠ[ƒX
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2012”N6ŒŽ28“ú@ƒ}ƒCƒiƒrƒjƒ…[ƒX
g“d‹C‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’uh
http://news.mynavi.jp/news/2012/06/28/043/index.html
2012”N6ŒŽ28“ú@DIGINFO TV
g“d‹C‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’uh
http://jp.diginfo.tv/v/12-0124-n-jp.php
2012”N6ŒŽ28“ú@DIGINFO TV(ENGLISH)
gMaking
Electric Currents Visibleh
http://www.diginfo.tv/v/12-0124-n-en.php
2012”N9ŒŽ7“ú@@ELECTRONIC JOURNAL
_ŒË‘åA“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ðЉî
http://www.electronicjournal.co.jp/news/2012/09/07.html
2012”N11ŒŽ30“ú _ŒËŽs@(–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜A)
_ŒËˆã—ÃŽY‹Æ“sŽs‚É‚¨‚¢‚ÄAIntegral Geometry Instruments‡“¯‰ïŽÐ‚Ìio
http://www.city.kobe.lg.jp/information/press/2012/11/20121130141001.html
http://www.kobe-lsc.jp/news/index.html
2012”N12ŒŽ12“ú ‰»ŠwH‹Æ“ú•ñ@(–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜A)
_ŒË‘唂̂h‚f‚h “d—¬Œo˜H‚ð‰ÂŽ‹‰»
http://www.kagakukogyonippo.com/headline/2012/12/12-9364.html
2013”N1ŒŽ7“ú “ú–{ŒoÏV•·11–Êi–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj
ŒÌá‰ÓŠ@Ž¥ê‚Å’T’m@–ƒ\ƒtƒgƒEƒFƒAŠJ”IGI-
2013”N1ŒŽ7“ú “ú–{ŒoÏV•·@“dŽq”Åi–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj
ŒÌá‰ÓŠ@Ž¥ê‚Å’T’m@–ƒ\ƒtƒgƒEƒFƒAŠJ”IGI-
http://www.nikkei.com/article/DGXNZO50300920V00C13A1TJE000/
2013”N4ŒŽ3“ú JST
A-STEP ƒz[ƒ€ƒy[ƒW Œ¤‹†ŠJ”¬‰Ê —“
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http://www.jst.go.jp/a-step/seika/
2014”N02ŒŽ27“ú “Œ—mŒoÏ@ò’J ’˜g¢ŠE‚ª‹Á‚ƒjƒbƒ|ƒ“‚̈ã—ÃŽY‹Æ—Íh i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj
Integral
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2014”N4ŒŽ22“ú “úŠ§H‹Æ@
g‚•ª‰ð”\‚Å”ñ”j‰óŒŸ¸‰æ‘œh
“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B
http://j-net21.smrj.go.jp/watch/news_tyus/entry/20140424-02.html
i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj
2014”N4ŒŽ29“ú “úŠ§H‹Æ ˆê–Ê
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“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B
http://www.nikkan.co.jp/news/nkx0920140429aaav.html
i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj
2015”N2ŒŽ1“ú ‘åŠw•]‰¿‹@\
_ŒË‘åŠw‚Ì•]‰¿u—D‚ꂽ“_v‚T“_‚Ì’†‚ÅAŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ª‘I’肳‚ê‚Ü‚µ‚½B
uŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÉŠÖ‚·‚錤‹†¬‰Ê‚É‚æ‚èA‰¢•ÄA“ú–{‚É‚¨‚¢‚Ä“Á‹–‚ª¬—§‚µ‚Ä‚¨‚èA“¯¬‰Ê‚ÉŠÖ‚í‚é“Á‹–oŠè‚ð’Ê‚¶‚ă\ƒtƒgƒEƒFƒAƒpƒbƒP[ƒW‚̔̔„‚ÉŒq‚ª‚Á‚Ä‚¢‚éBv
http://www.kobe-u.ac.jp/info/project/evaluation/attestation.html
2015”N3ŒŽ20“ú _ŒË‘åŠwƒz[ƒ€ƒy[ƒWu_‘ål‚Ì–{vƒR[ƒi[‚ÉŒfÚB
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http://www.kobe-u.ac.jp/info/public-relations/book/1503_20_1.html
_‘ål‚Ì–{
http://www.kobe-u.ac.jp/info/public-relations/book/index.html
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i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj
2015”N4ŒŽ10“ú yî•ñ’ñ‹ŸF‚µ‚Ü‚à‚悤z‚R‚X‚P†i‚Q‚O‚P‚T”N‚SŒŽ‚P‚O“új
gioŠé‹ÆƒCƒ“ƒ^ƒrƒ…[‚ðXV‚µ‚Ü‚µ‚½iIntegral Geometry Instruments, LLCj
@@áŒv‘ª‚⌟¸A‰æ‘œˆ—‚Ì•ª–ì‚É‚¨‚¢‚ÄA¢ŠEÅæ’[‚Ì‹Zp‚ð’ñ‹Ÿ‚µ‚Ä‚¢‚«‚Ü‚·âh
“–Œ¤‹†Žº‚©‚ç‹ZpˆÚ“]‚ª‚È‚³‚ꂽIntegral Geometry InstrumentsŽÐ‚ªÐ‰î‚³‚ê‚Ü‚µ‚½B
i–Ø‘ºŒ¤‹†Žº‹ZpˆÚ“]ŠÖ˜Aj
2015”N4ŒŽ _ŒË‘åŠw—ŠwŒ¤‹†‰È Œ¤‹†ƒgƒsƒbƒNƒXЉî
ƒTƒuƒT[ƒtƒFƒX‰f‘œ‰»–@‚ÉŠÖ‚·‚錤‹†
http://www.sci.kobe-u.ac.jp/topics/2014chem2.htm
2015”N7ŒŽ16“ú XV
w“§Ž‹‚̉Ȋwx
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http://douhiro.com/video/?cd_video=98
2015”N‚XŒŽ‚P‚T“ú ‚R–Ê
—nÚƒjƒ…[ƒXiŽY•ño”ÅŠ”Ž®‰ïŽÐj2015”N9ŒŽ15“ú@‘æ3115†
2015”N‚XŒŽ‚Q‚O“ú ‚T–Ê
ŒŸ¸‹@Šíƒjƒ…[ƒXiŽY•ño”ÅŠ”Ž®‰ïŽÐj2015”N9ŒŽ20“ú@‘æ1314†
2015”N10ŒŽ29“ú@AMEDƒvƒŒƒXƒŠƒŠ[ƒX
“ú–{‚̈ã—ÂɊvV‚ð‚à‚½‚ç‚·Œv‘ªE•ªÍ‹Zp‚ÌŠJ”,
•½¬27”N“xuæ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”ƒvƒƒOƒ‰ƒ€v‚ÉÌ‘ð
ŠÖ˜AHPFhttp://www.amed.go.jp/news/press.html
http://www.hosp.kobe-u.ac.jp/topic/2015/amed_151106.html
http://www.kobe-u.ac.jp/NEWS/research/2015_10_30_01.html
http://www.kobe-u.ac.jp/kuirc/
http://www.sci.kobe-u.ac.jp/news/2015/151029.htm
2015”N11ŒŽ05“ú@“úŠ§H‹Æ
gƒI[ƒ‹ƒWƒƒƒpƒ“‚ňã—Ë@ŠíŠJ”|‚`‚l‚d‚cA_ŒË‘å‚Ì“û‚ª‚ñf’f‚È‚Ç‚Uƒe[ƒ}‚ðŽx‰‡Ì‘ðh
http://www.nikkan.co.jp/news/nkx1020151105ccad.html
2015”N11ŒŽ13“ú
‘æ 5 ‰ñ CSJ ‰»ŠwƒtƒFƒXƒ^ 2015@‰ï@ŠúF2015”N10ŒŽ13“ú(‰Î)`15“ú(–Ø)
P6-015 ”ü⾺ —E‹Pu“d⼦‚âƒCƒIƒ“‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’u‚ÌŠJ”v—DGƒ|ƒXƒ^[”•\Ü
http://www1.csj.jp/festa/2015/document/poster_award.pdf
2015”N11ŒŽ23“ú@ƒeƒNƒmˆ¤2015@‘åŠw‚Ì•” €ƒOƒ‰ƒ“ƒvƒŠ@
–Ø‘ºŒ¤‹†Žº‚Ì”ü⾺ —E‹PŒN‚ª‘åŠw‚Ì•”ƒOƒ‰ƒ“ƒvƒŠ‚ðŽóÜ
http://www.kobe-u.ac.jp/NEWS/research/2015_12_01_02.html
2016”N3ŒŽ15“ú@_ŒË‘åŠw@•½¬‚Q‚V”N“xŠw¶•\²
–Ø‘ºŒ¤‹†Žº‚Ì”ü”n—E‹PŒN‚ªŠw’·‚æ‚è•\²‚³‚ꂽ
http://www.chem.sci.kobe-u.ac.jp/
http://www.sci.kobe-u.ac.jp/news/2015/160324.htm
2016”N3ŒŽ30“ú@JSTƒTƒCƒGƒ“ƒXƒjƒ…[ƒX‚ÉŒfÚ
uŽ–ŒÌ‚𖢑R‚É–h‚®I ŠJ”i‚ÞƒCƒ“ƒtƒ‰ŒŸ¸‹Zpi2016”N3ŒŽ30“ú”zMjv
https://sciencechannel.jst.go.jp/M160001/detail/M150001021.html
ŠÖ˜AHPFhttp://www.kobe-u.ac.jp/NEWS/research/2016_04_01_02.html
http://www.chem.sci.kobe-u.ac.jp/
http://www.sci.kobe-u.ac.jp/news/2015/160330.htm
Šw‰ï”•\i–Ø‘º“o’d•ªj
[1]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\A–x“àrŽõCŽR“cŒ[•¶A¼d˜a”üA™‘º”Ž”V
gƒPƒ‹ƒrƒ“ƒvƒ[ƒuŒ°”÷‹¾‚É‚æ‚é•\–Ê“dˆÊ/—e—Ê“¯Žž‘ª’èh
HŠú‘æ62‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAˆ¤’mH‹Æ‘åŠw 2001”N9ŒŽ
[2]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”üA‰«–ì—Tä
g—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹—U“d‘ÌÞ—¿•]‰¿h
t‹G‘æ49‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“ŒŠC‘åŠw 2002”N3ŒŽ
[3] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
" Scanning Capacitance Force Microscopy"
The 5th International Conference on
Noncontact Atomic Force Microscopy, Montreal, 2002”N8ŒŽ
[4]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\A–x“àrŽõAŽR“cŒ[•¶A¼d˜a”ü
g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-pnÚ‡‚Ì•]‰¿h
HŠú‘æ63‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAVŠƒ‘åŠw 2002”N9ŒŽ
[5]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü
g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•zŒv‘ªh
t‹G‘æ50‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA_“Þì‘åŠw 2003”N3ŒŽ
[6] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
gMetal-Oxide-Semiconductor Field
Effect Transistors Investigated by Scanning Capacitance Force Microscopy g
12th International Conference on
Scanning Tunneling Microscopy/Spectroscopy and Related Techniques,
Eindhoven,the Netherlands, 2003”N7ŒŽ
[7]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü
g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•z•]‰¿h
HŠú‘æ64‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC•Ÿ‰ª‘åŠw 2003”N8ŒŽ
[8]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü
g“ÁŽê‹¤U\‘¢‚ð—L‚·‚éƒJƒ“ƒ`ƒŒƒo[‚ð—p‚¢‚½Ã“d‹C—ÍŒŸo‚Ì‚Š´“x‰»h
HŠú‘æ64‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC•Ÿ‰ª‘åŠw 2003”N8ŒŽ
[9] K. Kimura, K. Kobayashi, H. Yamada,
K. Usuda and K. Matsushige
gScanning Capacitance Force
Microscopy imaging of Metal –Oxide-Semiconductor Field Effect Transistorsh
AVS 50th International Symposium & Exhibition, Baltimore,
2003”N11ŒŽ
[10] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
gScanning Capacitance Force
Microscopy imaging of Metal-Oxide-Semiconductor Field Effect Transistorsh
7th International Conference on
Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, 2003”N11ŒŽ
[11]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A¼d˜a”ü
g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾(SCFM)‚É‚æ‚锼“±‘Ì•sƒ•¨”Z“x•]‰¿h
t‹G‘æ51‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“Œ‹žH‰È‘åŠw 2004”N3ŒŽ
[12]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü
g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éSi-MOSFET‚Ì2ŽŸŒ³•sƒ•¨•ª•z•]‰¿h
HŠú‘æ65‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC“Œ–kŠw‰@‘åŠw 2004”N9ŒŽ
[13] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
gDesigning Resonance Modes of AFM
Cantilevers and its Application for Probing of Electric Properties and
Operation with Ultrasmall Oscillation Amplitudeh
2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ
[14] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
gTwo-dimensional Carrier Profiling on
Operating Si-MOSFET by Scanning Capacitance Force Microscopyh
2004 MRS Fall Meeting, Boston, MA, 2004”N12ŒŽ
[15]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü
g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—͉ƌ°”÷‹¾‹y‚Ñ‘–¸Œ^—e—ÊŒ°”÷‹¾‚É‚æ‚铮쒆Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh
t‹G‘æ52‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAé‹Ê‘åŠw 2005”N3ŒŽ
[16] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
gTwo-dimensional Carrier Profiling on
Operating Si-MOSFET by Scanning Capacitance Force Microscopyh
The 8th International Workshop on the
Fabrication, Characterization and Modeling of Ultra Shallow Junctions in
Semiconductors, Florida, USA, 2005”N6ŒŽ
[17] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
gDesigning Resonance Modes of AFM
Cantilevers for the Versatile Applications to High-Sensitive Force Detectorsh
13th International Colloquium on
Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ
[18] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
gTwo-dimensional Carrier Profiling on
Operating Si-MOSFET by Scanning Capacitance Force Microscopy and SCMh
13th International Colloquium on
Scanning Probe Microscopy (ICSPM13), Sapporo, Japan, 2005”N7ŒŽ
[19]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶A‰P“cGŽ¡A¼d˜a”ü
g‘–¸Œ^—e—ÊŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚铮쒆Si-MOSFET‚Ì2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh
HŠú‘æ66‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“¿“‡‘åŠw 2005”N9ŒŽ
[20]–Ø‘ºŒšŽŸ˜YA¬—ÑŒ\AŽR“cŒ[•¶AŽ›”ö—C¶A¼d˜a”ü
g‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾‚É‚æ‚é—L‹@ELƒfƒoƒCƒXŠE–Ê‚É‚¨‚¯‚é2ŽŸŒ³ƒLƒƒƒŠƒA–§“x•ª•zŒv‘ªh
HŠú‘æ66‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA“¿“‡‘åŠw 2005”N9ŒŽ
[21] K. Kimura, K. Kobayashi, H.
Yamada and K. Matsushige
gDesigning Resonance Modes of AFM
Cantilevers and its Application for Probing of Electric Properties and
Operation with Ultrasmall Oscillation Amplitudeh
2005 International Symposium on
Nonlinear Theory and its Applications, Bruges, Belgium, 2005”N10ŒŽ
[22] K. Kimura, K. Kobayashi, H.
Yamada, K. Usuda and K. Matsushige
g2D carrier profiling on operating
Si-MOSFET by SCFM and SCMh
9th International Conference on
Non-Contact Atomic Force Microscopy, 2006”N7ŒŽ
[23]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ª
HŠú‘æ67‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA—§–½ŠÙ‘åŠwA2006”N9ŒŽ
[24] K. Kimura, T. Horiuchi, K.
Kobayashi, K. Matsushige and H.Yamada
gHydration Force Measurements by Frequency
Modulation Dynamic Force Microscopyh
14th International Colloquium on
Scanning Probe Microscopy, 2006”N12ŒŽ
[25] –Ø‘ºŒšŽŸ˜YA–x“à‹ªA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ªh
t‹G‘æ53‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïAÂŽRŠw‰@‘åŠw 2007”N3ŒŽ
[26]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”ͺA¬—ÑŒ\A•½˜a–FŽ÷AŽR“cŒ[•¶A¼d˜a”ü
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n”}˜a—ÍŒv‘ªh
“ú–{Œ°”÷‹¾Šw‰ï63‰ñŠwpu‰‰‰ïAŽé냃bƒZVŠƒƒRƒ“ƒxƒ“ƒVƒ‡ƒ“ƒZƒ“ƒ^[ 2007”N5ŒŽ
[27]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”ͺA¬—ÑŒ\A•½˜a–FŽ÷A¼d˜a”üCŽR“cŒ[•¶
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ…˜a\‘¢Œv‘ªh
HŠú‘æ68‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïiƒvƒ[ƒuŒ°”÷‹¾6.6j–kŠC“¹H‘å 2007”N9ŒŽ
[28]–Ø‘ºŒšŽŸ˜YA–x“à‹ªA‘ååM”ͺA¬—ÑŒ\A•½˜a–FŽ÷A¼d˜a”üAŽR“cŒ[•¶
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ…˜a\‘¢Œv‘ªh
HŠú‘æ68‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïi“Á’èƒe[ƒ}B:¶‘Ì•ªŽqŒv‘ªEƒoƒCƒIƒeƒNƒmƒƒW[10.1j–kŠC“¹H‘å 2007”N9ŒŽ
[29] K. Kimura, T. Horiuchi, N.Oyabu,
K. Kobayashi, Y.Hirata, M.Abe, K. Matsushige, S. Morita and H.Yamada
gLocal Solvation Force Measurements
by Frequenscy Modulation Atomic Force Microscopyh
The 10th International NC-AFM Conference, Antalya, 2007”N9ŒŽ
[30]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üAŽR“cŒ[•¶
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢‚ÌŠÏŽ@h
ƒ\ƒtƒgƒiƒmƒeƒNƒmƒƒW[Œ¤‹†•”‰ï@‘æ3‰ñŒ¤‹†‰ï@“Œ‹žH‘å 2008”N1ŒŽ
[31] –Ø‘ºŒšŽŸ˜Y, ˆäŒËTˆê˜Y, ‘ååM”ͺ, ¬—ÑŒ\, ¡ˆä—²Žu, “c㟋K, ’Ë“c·, ¼d˜a”ü, ŽR“cŒ[•¶
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢Œv‘ªh
t‹G‘æ54‰ñ‰ž—p•¨—Šw‰ïŠÖŒW˜A‡u‰‰‰ï,@ “ú‘å, 2008”N3ŒŽ
[32]–Ø‘ºŒ’ŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üAŽR“cŒ[•¶C‘å¼—m
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a\‘¢‚ÌŠÏŽ@h
“Á’è—̈æu‚ŽŸ•ªŽq‰ÈŠwv‘æ3‰ñ‡“¯”ljï‹cAVŠƒ 2008”N5ŒŽ
[33]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA¼d˜a”üA‘å¼—mAŽR“cŒ[•¶
gƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鶑̂•ªŽq‚¨‚æ‚ÑŽü•Ó—n”}˜a‚Ì\‘¢‰ðÍh
_ŒË‘åŠw—ŠwŒ¤‹†‰È¶•¨ŠwêUŠwpu‰‰‰ïA_ŒË‘åŠw 2008”N7ŒŽ(Invited)
[34]–Ø‘ºŒšŽŸ˜YAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA‘å¼—mAŽR“cŒ[•¶
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚Ì\‘¢‰ðÍh
‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwŠÖŒW˜A‡u‰‰‰ïC’†•”‘åŠw 2008”N9ŒŽ
[35] K. Kimura, S.Ido, N.Oyabu,
K.Kobayashi, T.Imai, and H.Yamada
gMolecule-Scale Hydration Structures
Investigated by Frequency Modulation Atomic Force Microscopyh
11th International Conference on
Non-Contact Atomic Force Microscopy (NCAFM2008), Madrid 2008”N9ŒŽ
[36] K. Kimura, S.Ido, N.Oyabu,
K.Kobayashi, T.Imai, and H.Yamada
gMolecule-Scale Hydration Structures
Investigated by Frequency modulation atomic force microscopyh
2008 MRS Fall Meeting, Boston 2008”N12ŒŽ
[37] K. Kimura, T.Hiasa, H.Onishi
gDevelopment of Scanning Probe
Tomography and its Application for Visualizing Internal Nanomagnetic
Structuresh
2008 MRS Fall Meeting, Boson 2008”N12ŒŽ
[38] K. Kimura, T.Hiasa, H.Onishi
gScanning Probe Tomography Developed
for Visualising Buried Magnetic Structuresh
2008 MRS Fall Meeting, Boston 2008”N12ŒŽ
[39] K. Kimura, S.Kataoka, T.Hiasa,
A.Sasahara, H.Onishi, N.Oyabu, M.Ohta, K.Watanabe, R.Kokawa, K.Kobayashi and
H.Yamada
FM-AFM Study of Buried Metal Oxide Interfaces
The Sixth International Workshop on
Oxide Surface (IWOX-E) 2009”N1ŒŽ
[40]–Ø‘ºŒšŽŸ˜Y
g–„‚à‚ꂽ•¨Ž¿ŠE–Ê‚É‚¨‚¯‚é\‘¢‰ðÍ‚Ì‚½‚ß‚ÌV‹K‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾–@‚ÌŠJ‘ñh(invited)
ˆ¢“ìH‹Æ‚“™ê–åŠwZ‘æ7‰ñŠñ•uÀƒZƒ~ƒi[Aˆ¢“ì2009”N2ŒŽ
[41] K. Kimura, T.Hiasa, H.Onishi,
M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayashi, T.Imai and H.Yamada
gLocal Hydration Structures
Investigated by Frequency Modulation Atomic Force Microscopyh (invited)
“ñ‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi[ Reent Progress in Spectroscopy and Theory in Chemistry,
Kolkata,Rep.of India 2009”N3ŒŽ
[42]–Ø‘ºŒšŽŸ˜YA “úóIAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuA‘å¼—mAŽR“cŒ[•¶
g‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹ÇŠ—n”}˜a‚Ì\‘¢‰ðÍh
•ªŽq‰ÈŠw“¢˜_‰ï2009A–¼ŒÃ‰®‘åŠw 2009”N9ŒŽ
[43] K. Kimura, T.Hiasa, H.Onishi,
T.Imai, S.Ido, N.Oyabu, K.Kobayashi, H.Yamada
gHydration Structures Studied by
Frequency Modulation Atomic Force Microscopy and 3D Referential Interaction
Site Model Theoryh
The 7th International Workshop on
Oxide Surfaces (IWOX-E) 2010, VŠƒ 2010”N‚PŒŽ
[44]–Ø‘ºŒšŽŸ˜YA“úóIAˆäŒËTˆê˜YA‘ååM”ͺC¬—ÑŒ\A¡ˆä—²ŽuAŽR“cŒ[•¶A‘å¼—m
gAFM‚Å’T‚é‹à‘®Ž_‰»•¨ŠE–Ê‚Ì—n‰t\‘¢hiˆË—Šu‰‰j
“ú–{‰»Šw‰ï‘æ90t‹G”N‰ï“Á•ÊŠé‰æuŒÅ‰tŠE–Ê‚Ì—n‰t\‘¢v‹ß‹E‘åŠw 2010”N3ŒŽ
[45]–Ø‘ºŒšŽŸ˜Y
gŒ©‚¦‚È‚¢‚à‚Ì‚ðf‚éFŒ°”÷‹¾‚ÌŒ´—h
‚‘å˜AŒg“Á•Êu‹`A_ŒË‘åŠw 2010”N8ŒŽ
[46]–Ø‘ºŒšŽŸ˜YA‹{‰ºˆ¤ŽqA–Ø‘ºŒ›–¾
g“dŽ¥ê‹t‰ðÍ–@‚ÌŠJ”‚ÆŽ¥êŒ°”÷‹¾‚ւ̉ž—ph
‘æ71‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïC’·è‘åŠw 2010”N9ŒŽ
[47] K. Kimura, T.Hiasa, H.Onishi,
M.Ohta, K.Watanabe, R.Kokawa, S.Ido, N.Oyabu, K.Kobayahi, T.Imai, H.Yamada
gLiquid Structure on Solid Surface
Investigated by Atomic Force Microscopyh (invited)
“úˆó“ñ‘ŠÔŒð—¬Ž–‹ÆƒZƒ~ƒi[A_ŒË 2010”N9ŒŽ
[48]–Ø‘ºŒšŽŸ˜Y
gŽŸ¢‘㔼“±‘̃fƒoƒCƒXŒŸ¸‹ZpA»‘¢‹Zp‚ÉŠÖ‚·‚錤‹†hiˆË—Šu‰‰j
Šé‹Æ‚Å‚Ìu‰‰ 2010”N10ŒŽ
[49]K.kimura
gMaskless Electron Beam Stepperh
‘ÛƒiƒmƒeƒNƒmƒƒW[‘‡“WA“Œ‹ž 2011”N2ŒŽ
[50]–Ø‘ºŒšŽŸ˜Y
g“dŽq•”•iEƒvƒŠƒ“ƒgŠî”‚̔ñ”j‰óŒŸ¸‘•’uh
ƒCƒmƒx[ƒVƒ‡ƒ“ƒWƒƒƒpƒ“2011‘åŠwŒ©–{ŽsA“Œ‹ž 2011”N9ŒŽ
[51]@–Ø‘ºŒšŽŸ˜Y
gŽŸ¢‘㎥‹CƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”h (Invited)
Šé‹Æ‚Å‚Ìu‰‰ 2011”N11ŒŽ14“ú
[52]–Ø‘ºŒšŽŸ˜Y
gŽŸ¢‘㎥‹CƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”‚Æ“dŽq•”•i‚Ì”ñ”j‰óŒŸ¸‚ւ̉ž—ph
semicon japan ŽŸ¢‘ã‹ZpƒpƒrƒŠƒIƒ“o“WŽÒƒvƒŒƒ[ƒ“ƒe[ƒVƒ‡ƒ“ 2011”N12ŒŽ9“ú
[53]–Ø‘ºŒšŽŸ˜Y
g•¨Ž¿“à•”‚ðf‚錰”÷‹¾–@‚ÌŠJ”h (Invited)
‰ÈŒ¤”ï“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ6‰ñ‡“¯”ljï‹c 2011”N12ŒŽ10“ú
[54]–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –Ø‘ºŒ›–¾, ‘ååM”ͺ, ˆî’jŒ’
g“dŽ¥êÄ\¬‹@”\‚ð”õ‚¦‚½Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”‚Æ“dŽq•”•iŒÌá‰ð͂ւ̉ž—ph (Invited)
‚‰·ƒGƒŒƒNƒgƒƒjƒNƒXŒ¤‹†‰ï, _“Þ쌧 2012”N3ŒŽ‚Q‚P“ú
[55]–Ø‘ºŒšŽŸ˜Y
gŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚Ì‚«”\‰»‚Æ“dŽqŽY‹Æ‰ï‚Ö‚Ì•‹yh
ƒCƒmƒx[ƒVƒ‡ƒ“„iŽ–‹Æ¬‰Ê•ñ‰ï, _ŒË 2012”N3ŒŽ‚Q‚Q“ú
[56]–Ø‘ºŒšŽŸ˜YA”ü”n—E‹PA‘ååM”ͺAˆî’jŒ’A–Ø‘ºŒ›–¾
gƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰Ê‘fŽq‚ð—p‚¢‚½‚•ª‰ð”\ƒRƒ“ƒNƒŠ[ƒg“à•”“S‹ØŒŸ¸‹Zp‚ÉŠÖ‚·‚錤‹†h
“ú–{”ñ”j‰óŒŸ¸‹¦‰ï•½¬24”N“xt‹Gu‰‰‘å‰ïu‰‰ŠT—vWp.89-p92@“Œ‹ž 2012”N4ŒŽ22“ú
[57]–Ø‘ºŒšŽŸ˜Y
g•¨Ž¿ŠE–Ê‚É‚¨‚¯‚é\‘¢‚Æ“d‰×ˆÚ“®‚ð‰ÂŽ‹‰»‚·‚é‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾–@‚ÌŠJ”g
‘æ50‰ñ“ú–{¶•¨•¨—Šw‰ï”N‰ïA–¼ŒÃ‰®@2012”N9ŒŽ(Invited)
[58] K. Kimura, Y. Mima, N. Oyabu, N.
Kimura, T. Inao
gDevelopment of magnetic field
microscopy for interconnection testing inside passivation layerh
SSDM2012‘Û‰ï‹cA‹ž“s@2012”N9ŒŽ
[59] Yuki Mima, Noriaki Oyabu, Takeshi Inao, Noriaki Kimura,
Kenjiro Kimura
gDevelopment
of Tunneling Magnetoresistance Microscope with Electro-Magnetic Field
Reconstructionh
International Conference of the
Asian Union of Magnetics Societies (ICAUMS2012), “Þ—Ç@2012”N10ŒŽ
[60]–Ø‘ºŒšŽŸ˜Y
gƒiƒmƒVƒXƒeƒ€‚Ì‘å‹K–ÍWω»‚ÉŒü‚¯‚½‚‘¬“dŽqü˜IŒõ–@‚ÌŠJ”g
‚³‚«‚ª‚¯uƒiƒmƒVƒXƒeƒ€‚Æ‹@”\‘n”v‘æ2Šú¶Œ¤‹†¬‰Ê•ñ‰ïA“Œ‹ž 2012”N12ŒŽ
@
[61]–Ø‘ºŒšŽŸ˜Y
gƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚Æ“dŽ¥êÄ\¬–@‚ÌŠJ”hiˆË—Šu‰‰j
ƒiƒmƒvƒ[ƒuƒeƒNƒmƒƒW[‘æ167ˆÏˆõ‰ï@‘æ69‰ñŒ¤‹†‰ï@“Œ‹ž@2013”N1ŒŽ
[62]–Ø‘ºŒšŽŸ˜Y
g“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‹Zpš“O’ê‰ðà
`LiƒCƒIƒ““d’r‚ÌŒŸ¸‚â“dŽq•”•i‚ÌŒÌá‰ðÍ‚É‚¨‚¯‚éŠvV“I‹Zp‚ðÚ‰ð`iˆË—Šu‰‰j
Electronic Journal ‘æ1564‰ñTechnical Seminar, “Œ‹ž 2013”N1ŒŽ
[63]–Ø‘ºŒšŽŸ˜Y
gŒ¤‹†ƒV[ƒYEƒxƒ“ƒ`ƒƒ[—§‚¿ã‚°hiˆË—Šu‰‰j
_ŒËˆã—ÃŽY‹Æ“sŽs@ƒNƒ‰ƒXƒ^[Œð—¬‰ïA_ŒË 2013”N2ŒŽ
[64]–Ø‘ºŒšŽŸ˜Y
gŽü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì\‘¢‰ðÍhiˆË—Šu‰‰j
“ú–{•ªÍ‰»Šw‰ï‘æ62”N‰ï@—n‰tŠE–ÊŒ¤‹†§’k‰ïA‘åã 2013”N9ŒŽ
[65]–Ø‘ºŒšŽŸ˜Y
g‚•ª‰ð”\Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u |“dŽq•”•iA“d’r“à•”‚Ì“d‹C‚Ì—¬‚ê‚ð‰f‘œ‰»”ñ”j‰óŒÌá‰ðÍ|h
Ceatec Japan 2013 o“WŽÒƒZƒ~ƒi[Aç—t@2013”N10ŒŽ
m66n–Ø‘ºŒšŽŸ˜Y
g“d—¬Œo˜H‰f‘œ‰»‘•’u‚ÌŠJ”‚Æ“d’r“à•”‚Ì”ñ”j‰ó‰æ‘œf’f‚ւ̉ž—ph
FC EXPO2014ƒAƒJƒfƒ~ƒbƒNƒtƒH[ƒ‰ƒ€A“Œ‹ž,
2014”N2ŒŽ
m67n–Ø‘ºŒšŽŸ˜Y
g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”h
@‹ž“sSMIƒZƒ~ƒi[@2014”N2ŒŽ@“Œ‹žiŽó܎҈˗Šu‰‰j
m68n–Ø‘ºŒšŽŸ˜Y
g“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚鎥‹CƒCƒ[ƒWƒ“ƒO‹Zpš“O’ê‰ðà `LiƒCƒIƒ““d’r‚â“dŽq•”•i‚ÌŒÌá‰ðÍ‚É‚¨‚¯‚éŠvV“I‹Zp‚ðÚ‰ð`g
Electronic Journal ‘æ2077‰ñ Technical Seminar 2014”N4ŒŽ@“Œ‹žiˆË—Šu‰‰j
m69n–Ø‘ºŒšŽŸ˜Y
g“dŽ¥êÄ\¬Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”‚Æ“d’r“à•””ñ”j‰óŒŸ¸‚ւ̉ž—ph“d‹C‰»Šw‰ï@‘æ81‰ñ‘å‰ï@‘åã@2014”N3ŒŽ
m70n–Ø‘ºŒšŽŸ˜Y
Šé‹Æ‚Å‚Ìu‰‰ g“dŽ¥êÄ\¬Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”‚Æ“d’r“à•””ñ”j‰óŒŸ¸‚ւ̉ž—ph
2014”N4ŒŽ@iˆË—Šu‰‰j
m71n–Ø‘ºŒšŽŸ˜Y
“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”
‰ž—p•¨—Šw ‰ïŠÖ¼Žx•” •½¬‚Q‚U”N“x‘æ‚P‰ñu‰‰‰ï
uƒvƒ[ƒuŒ°”÷‹¾‚Æ—L‹@ƒGƒŒƒNƒgƒƒjƒNƒX `ŠÖ¼ŽáŽèŒ¤‹†ŽÒ‚©‚ç‚Ìî•ñ”M`v‹ž“s‘åŠw@2014”N6ŒŽiˆË—Šu‰‰j
m72n–Ø‘ºŒšŽŸ˜Y
g•¨Ž¿ŠE–Ê‚Ì\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”h
JPCA|show 2014 ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUA“Œ‹ž@2014”N6ŒŽ
m73n–Ø‘ºŒšŽŸ˜Y
“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”
‰ž—p•¨—Šw ‰ïŠÖ¼Žx•” •½¬‚Q‚U”N“x‘æ‚P‰ñu‰‰‰ï
uƒvƒ[ƒuŒ°”÷‹¾‚Æ—L‹@ƒGƒŒƒNƒgƒƒjƒNƒX `ŠÖ¼ŽáŽèŒ¤‹†ŽÒ‚©‚ç‚Ìî•ñ”M`vg“d’r“à•”‚Ì“d—¬Œo˜H‚ð‰f‘œ‰»‚·‚é”ñ”j‰óŒŸ¸ƒVƒXƒeƒ€‚ÌŠJ”h‹ž“s‘åŠw@2014”N6ŒŽ26“úiˆË—Šu‰‰j
m74n–Ø‘ºŒšŽŸ˜Y
g•¨Ž¿ŠE–Ê‚Ì\‘¢‚ð‰f‘œ‰»‚·‚éƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”h
2014ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[(‘æ28‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“W)
ƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒUA“Œ‹žƒrƒbƒOƒTƒCƒg@2014”N6ŒŽ 4“ú|6“úA
m75n–Ø‘ºŒšŽŸ˜Y
gNondestructive electric current density
imaging inside
rechargeable battery
cellg
NC-AFM 2014@@2014”N8ŒŽ4“ú-8“úAç—tŒ§‚‚‚Αۉï‹cêiˆË—Šu‰‰j
17th International
Conference on non-contact Atomic Force Microscopyi‘æ17‰ñ@”ñÚGŒ´ŽqŠÔ—ÍŒ°”÷‹¾‘Û‰ï‹cj
[76] –Ø‘ºŒšŽŸ˜Y
g‚•ª‰ð”\ƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”h
í—ª–Ú•WuƒvƒƒZƒXƒCƒ“ƒeƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚鎟¢‘ãƒiƒmƒVƒXƒeƒ€‚Ì‘n»v‚RŒ¤‹†—̈æ‘æ‚Q‰ñ‡“¯ŒöŠJƒVƒ“ƒ|ƒWƒEƒ€A“Œ‹žA2014”N10ŒŽ1“ú
m77n–Ø‘ºŒšŽŸ˜Y, ”ü”n—EŽ÷, –ì–{˜a½, ‘ååM”ͺ, –Ø‘ºŒ›–¾
g“dŽ¥êÄ\¬ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ÌŠJ”‚Æ“d’r“à•”‚Ì“d—¬Œo˜H‰f‘œ‰»‚ւ̉ž—ph“d’r“¢˜_‰ï@‘æ81‰ñ‘å‰ï@‘—§‹ž“s‘Û‰ïŠÙ@2014”N‚P‚PŒŽ‚P‚X“ú
–Ø‘ºŒšŽŸ˜Y, ”ü”n—E‹P, –ì–{˜a½, ‘ååM”ͺ, –Ø‘ºŒ›–¾, ‘æ55 ‰ñ“d’r“¢˜_‰ï u‰‰—vŽ|W p.348 (2014).
[78] –Ø‘ºŒšŽŸ˜Y
gŽ¥‹C‰f‘œ‰»‚É‚æ‚é”ñ”j‰ó‰æ‘œŒŸ¸@-
“dŽq•”•i,ƒŠƒ`ƒEƒ€’~“d’r“à•”‚ÌŒÌáŒÂŠ‚ð“Á’è -h
ƒOƒŠ[ƒ“ƒCƒmƒx[ƒVƒ‡ƒ“V‹Zpà–¾‰ïC‚i‚r‚s“Œ‹ž–{•”•ÊŠÙƒz[ƒ‹i“Œ‹žEŽsƒ–’Jj 2015”N‚PŒŽ16“ú
[79] –Ø‘ºŒšŽŸ˜YCŒü“a”žC–Ø‘ºŒ›–¾CŽO–Ø–œ—RŽqC‚”öM‘¾˜Y
gƒŠƒAƒ‹ƒ^ƒCƒ€ƒ}ƒCƒNƒ”gƒ}ƒ“ƒ‚ƒOƒ‰ƒtƒB‚ÌŠJ”h‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï@“ŒŠC‘åŠw ÓìƒLƒƒƒ“ƒpƒX@2015”N3ŒŽ11“ú`14“ú
[80] –Ø‘ºŒšŽŸ˜Y@
g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”‚Æ“dŽq•”•i,’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—ph
æ’[Œv‘ª•ªÍ‹ZpE‹@ŠíŠJ”ƒvƒƒOƒ‰ƒ€@V‹Zpà–¾‰ïC ‚i‚r‚s“Œ‹ž–{•”•ÊŠÙƒz[ƒ‹i“Œ‹žEŽsƒ–’JjC2015”N3ŒŽ23“ú
[81] –Ø‘ºŒšŽŸ˜Y@
g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŠJ”‚Æ’~“d’r”ñ”j‰óŒŸ¸‚ւ̉ž—ph
’~“d’rƒ[ƒJ‚Å‚Ìu‰‰iˆ¤’mŒ§jC2015”N4ŒŽ20“ú(Invited)
[82]–Ø‘ºŒšŽŸ˜Y@–ì–{˜a½A”ü”n—E‹PA–Ø‘ºŒ›–¾
g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h
2015ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[i‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WjƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU@“Œ‹žƒrƒbƒOƒTƒCƒg@2015”N6ŒŽ3“ú`‚T“ú
[83] –Ø‘ºŒšŽŸ˜Y
‘æ‚T‰ñŠÖ¼’nˆæ‘åŠwŒ¤‹†Žx‰‡ƒXƒ^ƒbƒtƒ~[ƒeƒBƒ“ƒO,h–Ø‘ºŒ¤‹†Žº‚ÌŠˆ“®, Šú‘Ò‚·‚錤‹†¬‰Ê‚̃AƒEƒgƒŠ[ƒ`Žx‰‡h, _ŒË‘åŠw 2015”N8ŒŽ2“ú(Invited).
[84] –Ø‘ºŒšŽŸ˜Y
gƒTƒuƒT[ƒtƒFƒXƒCƒ[ƒWƒ“ƒO–@‚ÌŠJ”‚ƶ‘ÌA’~“d’r,ƒCƒ“ƒtƒ‰‰æ‘œŒŸ¸‚ւ̉ž—ph
ƒCƒmƒx[ƒVƒ‡ƒ“EƒWƒƒƒpƒ“2015i“Œ‹žƒrƒbƒOƒTƒCƒgj2015”N‚WŒŽ‚Q‚V“ú
[85] –Ø‘ºŒšŽŸ˜Y
gÅæ’[‰æ‘œŒv‘ª‘•’u‚ÌŠJ”‚ÆŽÀ—p‰»@-ˆÀ‘S,ˆÀS‚ȎЉï‚ð–ÚŽw‚µ‚Ä-h
í—ª–Ú•WuƒvƒƒZƒXƒCƒ“ƒeƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚鎟¢‘ãƒiƒmƒVƒXƒeƒ€‚Ì‘n»v
‚RŒ¤‹†—̈æ‘æ‚R‰ñ‡“¯ŒöŠJƒVƒ“ƒ|ƒWƒEƒ€@“Œ‹žiƒRƒNƒˆƒz[ƒ‹j‚Q‚O‚P‚T”N‚XŒŽ‚Q‚X“ú
[86] –Ø‘º ŒšŽŸ˜YC–Ø‘º Œ›–¾CL—˜ _ˆêC‹´–{ ’m‹vC²‹vŠÔ iŽqCŽO–Ø –œ—RŽqC‚”ö M‘¾˜Y
g”÷Žã“d”g‚ð—p‚¢‚½”ñNP“ûŠà‰æ‘œf’f–@‚ÌŠJ” \‚Š´“x“ûŠàŒŸo‚ð–ÚŽw‚µ‚Ä\h
‘æ‚Q‚T‰ñ@“ú–{“ûŠàŒŸfŠw‰ïŠwp‘‰ï@i‚‚‚Αۉï‹cêj2015”N‚P‚OŒŽ‚R‚O“ú`‚R‚P“ú
[87] ›”ü”n —E‹P, –ì–{ ˜a½,–Ø‘º Œ›–¾, –Ø‘º ŒšŽŸ˜Y
g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŒž‰ñŒ^’~“d’r‚ւ̉ž—ph
‘æ56‰ñ“d’r“¢˜_‰ï@3E25iˆ¤’mŒ§ŽY‹Æ˜J“ƒZƒ“ƒ^[@ƒEƒCƒ“ƒN‚ ‚¢‚¿j2015”N11ŒŽ13“ú
[88] ›–Ø‘ºŒšŽŸ˜Y, “c‘º¹ˆ», –Ø‘ºŒ›–¾, ŽR‰º—SŽi, ‰Í–ì½”VC“c’†—DŽqCŽO–Ø–œ—RŽqCL—˜_ˆê,
‹´–{’m‹v, ²‹vŠÔ˜æŽq, ‚”öM‘¾˜Y, gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ÌŠJ”- ŽB‘œ‘¬“x‚ÌŒüã‚ÉŠÖ‚·‚錟“¢ -h, ‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï, i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú
‰‰‘è”Ô†: DP-2-47-5@ƒZƒbƒVƒ‡ƒ“–¼F ƒ|ƒXƒ^[“¢‹c47@“úŽžF 2016”N6ŒŽ17“úi‹àj
Šw‰ï”•\i‹¤’˜j
(1) S. Ido, K. Kimura, N. Oyabu, K.
Kobayashi, Y. Hirata & H. Yamada,
High-resolution Imaging of Biomolecules
in Liquids by FM-AFM.
11th International Conference on
Non-contact Atomic Force Microscopy, We-1450, Madrid, Spain (2008). Ξһӥ\
(2) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”ͺC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C•½“c –FŽ÷C¯ Ž¡C‹–Ø ’C’j,
u‰t’†“®ìŽü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½¶‘Ì‚•ªŽq‚Ì‚•ª‰ð”\ŠÏŽ@v
“ú–{Œ°”÷‹¾Šw‰ï‘æ64‰ñŠwpu‰‰‰ï, P-082, ‘—§‹ž“s‘Û‰ïŠÙ (2008”N). ƒ|ƒXƒ^[”•\
(3) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”ͺC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C¯ Ž¡C‹–Ø ’C’j,
uŽü”g”•Ï’²•ûŽ®AFM‚ð—p‚¢‚½ƒvƒ‰ƒXƒ~ƒhDNA‚̉t’†‚•ª‰ð”\ŠÏŽ@v
2008”Nt‹G ‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 29p-Q-6, “ú–{‘åŠw (2008”N). Œû“ª”•\
(4) ˆäŒË Tˆê˜YC–x“à ‹ªC‘ååM ”ͺC–Ø‘º ŒšŽŸ˜YC¬—Ñ Œ\C¼d ˜a”üCŽR“c Œ[•¶C•½“c –FŽ÷C¯ Ž¡C‹–Ø ’C’j,
uŽü”g”•Ï’²ŒŸo•ûŽ®AFM‚ð—p‚¢‚½¶‘Ì‚•ªŽq‚̉t’†‚•ª‰ð”\ŠÏŽ@v
2008”NH‹G ‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 4a-L-3, ’†•”‘åŠw (2008”N). Œû“ª”•\
i5j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m
Œõ“d’…–@‚ð—p‚¢‚Ä”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚ÌŒ¤‹†, “Á’è—̈挤‹†u‚ŽŸ•ªŽqŒn‰ÈŠwv‘æ3‰ñ‡“¯”Á‰ï‹c, 2008,
i6j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“ƒ‚ƒfƒ‹G”}‚ÌAFMŠÏŽ@, ‘æ102‰ñG”}“¢˜_‰ï, 2008,
i7j
K. Kimura, S. Ido, N. Oyabu, K. Kobayashi, T. Imai, H. Yamada.
Molecular-scale Hydration Structures Investigated
by Frequency Modulation Atomic Force Microscopy,
11th International Conference on
Non-contact Atomic Force Microscopy (NCAFM2008), 2008,
i8j •Ð‰ª—Á”ü, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Œõ“d’…–@‚É‚æ‚è”’‹à‚ð’SŽ‚µ‚½“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚ÌSPMŠÏŽ@,
‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2008,
i9j Kenjiro Kimura, Takumi Hiasa,
Hiroshi Onishi.
Development of scanning probe
tomography and its application for visualizing internal nanomagnetic
structures,
2008 MRS Fall Meeting, 2008,
i10jTakumi Hiasa, Suzumi Kataoka, Kenjiro
Kimura, Hiroshi Onishi.
Scanning probe study of TiO2 surfaces
placed in reactive environments,
2008 MRS Fall Meeting, 2008,
i11j Suzumi Kataoka, Takumi Hiasa,
Kenjiro Kimura, Hiroshi Onishi.
SPM Observation of Pt Nanoparticles
Photodeposited on TiO2(110),
2008 MRS Fall Meeting, 2008,
i12j •Ð‰ª—Á”ü, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, •²ì—Ç•½, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Œõ“d’…–@‚Å쬂µ‚½”’‹à’SŽŽ_‰»ƒ`ƒ^ƒ“G”}‚̃vƒ[ƒuŒ°”÷‹¾ŠÏŽ@,
G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[[ƒVƒ‡ƒ“uK‰ï, 2008,
i13j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, •²ì—Ç•½, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–Ê‚ÌŠÏŽ@,
G”}Šw‰ï‘æ18‰ñƒLƒƒƒ‰ƒNƒ^ƒŠƒ[[ƒVƒ‡ƒ“uK‰ï, 2008,
i14jSuzumi Kataoka, Takumi Hiasa, Kenjiro
Kimura, Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe,
Noriyuki Oyabu, Kei Kobayashi, Hirofumi Yamada.
AFM study of Pt Nanoparticles on
TiO2(110) Deposited in Solutions,
The 16th International Colloquim on
Scanning Probe Microscopy, 2008,
i15j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Noriyuki
Oyabu, Kei Kobayashi, Hirofumi Yamada.
Solvation Structures at a
Solution-TiO2 Interface Studied by Frequency-Modulation Atomic Force
Miscroscopy,
The 16th International Colloquim on
Scanning Probe Microscopy, 2008,
i16j Keita Fujio, Kenjiro Kimura, Naoki
Koide, Hiroshi Onishi.
FM-AFM Study of Dye-Adsorbed TiO2(110)
Electrodes,
The 16th International Colloquim on
Scanning Probe Microscopy, 2008,
i17j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
ŒõG”}”½‰žê‚É‚¨‚¯‚é‹ÇŠ…˜a\‘¢Œv‘ª,
_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï2008,
i18j
•Ð‰ª—Á”ü, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
”’‹à’SŽ“ñŽ_‰»ƒ`ƒ^ƒ“•\–Ê‚Ì‘g¬E\‘¢•ªÍ,
_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï2008, 2008,
i19j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Ž_‰»ƒ`ƒ^ƒ“-…—n‰tŠE–Ê‚É‚¨‚¯‚é‹ÇŠ…˜a\‘¢‚ÌFM-AFM‰ðÍ,
“ú–{‰»Šw‰ï‘æ89t‹G”N‰ï, 2009,
i20j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é…—n‰t-“ñŽ_‰»ƒ`ƒ^ƒ“ŠE–Ê‚Ì‹ÇŠ—n”}˜a\‘¢‰ðÍ,
t‹G‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2009,
i21j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‹à‘®Ž_‰»•¨‚Ì‹ÇŠ…˜a\‘¢‰ðÍ,
‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2009,
i22j A“c^s, –Ø‘ºŒ’ŽŸ˜Y, ‘å¼—m.
TiO2(110)•\–Ê‚É‹z’…‚µ‚½Ž_‘fŒ´Žq‚Ì‹zŠj”½‰ž«,
‘æ104‰ñG”}“¢˜_‰ï, 2009,
i23j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†“®ìŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨-…—n‰tŠE–ʂ̉ðÍ,
‘æ29‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2009,
i24j “¡”öŒc‘¾, ¬o’¼é, •ÐŽR”Ž”V, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éF‘f‘Š´“d‹Éƒ‚ƒfƒ‹‚ÌŠÏŽ@,
‘æ29‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2009,
i25jT. Hiasa, K. Kimura, H. Onishi, R.
Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
Local Hydration Structures on Metal
Oxides Investigated by Frequency-Modulation Atomic Force Microscopy,
The 7th International Workshop on
Oxide Surfaces (IWOX-VII), 2010,
i26j M. Ueda, M. Yasuo, K. Kimura, H.
Onishi.
Nucleophilic Reactivity of Oxygen Adatoms
on a TiO2(110) Surface,
The 7th International Workshop on
Oxide Surfaces (IWOX-VII), 2010,
i27j Keita Fujio, Naoki Koide, Hiroyuki
Katayama, Kenjiro Kimura, Hiroshi Onishi.
FM-AFM Observation of Dye-Sensitized TiO2
Electrodes,
The 7th International Workshop on Oxide
Surfaces (IWOX-VII), 2010,
i28j Keita Fujio, Kenjiro Kimura, Naoki
Koide, Hiroyuki Katayama, Hiroshi Onishi.
Dye-Adsorbed TiO2(110) Electrodes Studied
with FM-AFM,
The 17th International Colloquim on
Scanning Probe Microscopy (ICSPM-17), 2009,
i29j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ŒÅ‰tŠE–Ê‚Ì—n”}˜a\‘¢‰ðÍ,
“ú–{‰»Šw‰ï‘æ90t‹G”N‰ï, 2010,
i30j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
‰t’†ƒ_ƒCƒiƒ~ƒbƒNƒ‚[ƒhŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚鎩ŒÈ‘gD‰»’P•ªŽq–Œ‚Ì”ñ…—n”}’†ŠÏŽ@,
t‹G‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2010,
i31jT. Hiasa, K. Kimura, H. Onishi, R.
Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
Force Spectroscopy at Liquid-Oxide
Interfaces,
The 12th International Scanning Probe
Microscopy Conference, 2010,
i32j T. Sugihara, T. Hiasa, H. Onishi, K.
Kimura, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobayashi, H. Yamada, T.
Iwasaki, Y. Fukami.
FM-AFM Study of Proteins on Lipid Rafts,
The 12th International Scanning Probe
Microscopy Conference, 2010,
i33j¡“c”Žä, “úóI, –Ø‘ºŒšŽŸ˜Y, ]ŒûŒ’ˆê˜Y, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶, ‘å¼—m.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éCaCO3”÷—±Žq‚̉t’†‚•ª‰ð”\ŠÏŽ@,
“ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠwpu‰‰‰ï, 2010,
i34j ¡“c”Žä, “úóI, –Ø‘ºŒšŽŸ˜Y, ]ŒûŒ’ˆê˜Y, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶, ‘å¼—m.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é”÷—±Žq‚Ì‚•ª‰ð”\ŠÏŽ@,
“ú–{Œ°”÷‹¾Šw‰ï‘æ66‰ñŠwpu‰‰‰ï, 2010,
i35j T. Hiasa, K. Kimura, H.
Onishi, R. Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi,
H. Yamada.
FM-AFM study of thiol-modified gold
films immersed in organic solvents,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
i36j Keita Fujio, Naoki Koide, Hiroyuki
Katayama, Kenjiro Kimura, Hiroshi Onishi.
NC-AFM study of dye-sensitized TiO2
electrodes,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
i37j T. Hiasa, K. Kimura, H. Onishi, R.
Kokawa, M. Ohta, K. Watanabe, M. Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
FM-AFM Study on Hydrophilic and
Hydrophobic Metal Oxides,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
i38j M. Yamazaki, T. Hiasa, M. Ohta, K.
Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada, T. Hiasa, K.
Kimura, H. Onishi.
Solution-Polyethylene Interface Studied
by FM-AFM,
13th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2010), 2010,
i39j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi
Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
FM-AFM Study of Hydration at
Water-Metal Oxides Interfaces,
The International Chemical Congress
of Pacific Basin Societies (PACIFICHEM 2010), 2010,
i40j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi
Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
Kelvin Probe Force Microscope Study
of Impregnated Pt/ TiO2 Catalyst Models,
The International Chemical Congress of
Pacific Basin Societies (PACIFICHEM 2010), 2010,
i41j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi, Ryohei Kokawa, Masahiro Ohta, Kazuyuki Watanabe, Masashi
Yamazaki, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
FM-AFM Study of Organic Solvents
Interfaced with a Thiol-Modified Gold Surface,
The International Chemical Congress
of Pacific Basin Societies (PACIFICHEM 2010), 2010,
i42j M. Yamazaki, T. Hiasa,
M. Ohta, K. Watanabe, R. Kokawa, K. Kimura, N. Oyabu, K. Kobayashi, H. Yamada,
T. Hiasa, K. Kimura, H. Onishi.
FM-AFM Study of Solution-Soft Matter
Interfaces,
17th International Microscopy
Congress (IMC-17), 2010,
i43j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì—n”}˜a\‘¢Œv‘ª,
“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ5‰ñ‡“¯”ljï‹c, 2010,
i44j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, •²ì—Ç•½, ‘å“c¹O, “n糈ê”V, ŽRè«Žk, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŒÅ‰tŠE–Ê‚Ì—n‰t\‘¢‚ÌŒŸ“¢,
•ªŽq‰ÈŠw“¢˜_‰ï2010, 2010,
i45j “Œ—Yˆê, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶
Ód‹C—ÍŒ°”÷‹¾‚ð—p‚¢‚½‹à‘®Ž_‰»•¨‚Ì•\–Ê“dˆÊ•ª•zŒv‘ª,
‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2010,
i46j
T. Hiasa, K. Kimura, H. Onishi, R. Kokawa, M. Ohta, K. Watanabe, M.
Yamazaki, N. Oyabu, K. Kobayashi, H. Yamada.
Force Spectroscopy at Liquid-Solid
Interfaces,
The 6th International Workshop on
Nano-scale Spectroscopy and Nanotechnology (NSS6), 2010,
i47j¬”¨ŒbŽq, ‘å¼—m, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y.
“dŽ¥ê‹t‰ðÍ–@‚É‚æ‚鎥‹C‹L˜^”}‘Ì‚ÌŽOŽŸŒ³Ž¥ê•ª•zŒv‘ª,
‘æ30‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2010,
i48j ™Œ´’m‹I, —шí•à, “úóI, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘å¼—m, ‘å“c¹O, “n粈ê”V, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒyƒvƒ`ƒhƒiƒmƒ`ƒ…[ƒu‚ÌŠÏŽ@,
“Á’è—̈挤‹†u‚ŽŸŒn•ªŽq‰ÈŠwv‘æ4‰ñŒöŠJƒVƒ“ƒ|ƒWƒEƒ€, 2010,
i49j Masashi Yamazaki, Ryohei Kokawa,
Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi,
Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
FM-AFM Study of Polyethylene-Adsorbed
Graphite Immersed in Water,
The 18th International Colloquim on
Scanning Probe Microscopy, 2010,
i50j Tomoki Sugihara, I. Hayashi, Takumi
Hiasa, Kenjiro Kimura, A. Tamura, Hiroshi Onishi, Masahiro Ohta, Kazuyuki
Watanabe, Ryohei Kokawa, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada.
Peptide Nanotubes Observed by
Frequency-Modulation Atomic Force Microscopy,
The 18th International Colloquim on
Scanning Probe Microscopy, 2010,
i51j —é–Ø’qŽq, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œ‚ÌŠÏŽ@,
“ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,
i52j“úóI, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œã‚Ì…—n‰t\‘¢‚ÌŒŸ“¢,
“ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,
i53j¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒƒAƒjƒŠƒ“Œ‹»‚Ì•\–ÊŠÏŽ@,
“ú–{‰»Šw‰ï‘æ91t‹G”N‰ï, 2011,
i54jŽRè«Žk, •²ì—Ç•½, ‘å“c¹O, “n糈ê”V, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
ƒOƒ‰ƒtƒ@ƒCƒgã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚̃…’†FM-AFMŠÏŽ@,
t‹G‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2011,
i55j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
ˆÙ‚È‚éæ’[Œa‚ð‚à‚Â’Tj‚ð—p‚¢‚½‰t’†FM-AFMŒv‘ª,
t‹G‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ï, 2011,
i56j¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ép-ƒjƒgƒƒAƒjƒŠƒ“Œ‹»‚Ì•\–ÊŠÏŽ@,
Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,
i57j “úóI, —é–Ø’qŽq, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m, ‘å“c¹O, “n粈ê”V, ŽRè«Žk, •²ì—Ç•½, ‘ååM”ͺ, ¬—ÑŒ\, ŽR“cŒ[•¶.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹Ž©ŒÈ‘gD‰»’P•ªŽq–Œã‚Ì…—n‰t\‘¢‚ÌŒŸ“¢,
Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,
i58j •²ì—Ç•½, ŽRè«Žk, ‘å“c¹O, “n糈ê”V, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
ƒOƒ‰ƒtƒ@ƒCƒgã‚É‹z’…‚µ‚½ƒ|ƒŠƒGƒ`ƒŒƒ“‚̃…’†FM-AFMŠÏŽ@,
Œ¤‹†‰ïu•¨—‰»Šw“IŽè–@‚É‚æ‚éV‹K•\–Ê•]‰¿v, 2011,
i59j â—´“T, ‘å¼—m, –Ø‘ºŒšŽŸ˜Y.
’ቷŽŽ—¿ƒzƒ‹ƒ_[‚ÌŠJ”‚Ɖt’†“®ìŽü”g”•Ï’²•ûŽ®AFM‚ւ̉ž—p,
‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2011,
i60j“úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
FM-AFM‚É‚æ‚ée…«’P•ªŽq–Œã‚Ì…—n‰t\‘¢‚̉ðÍ,
‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2011,
i61j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi.
Hydration to Hydrophilic Monolayers
Visualized by FM-AFM,
14th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,
i62j —é–Ø’qŽq, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
ƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹’P•ªŽq–Œ‚ÉÚ‚·‚éƒwƒLƒTƒfƒJƒ“‰t‘Ì‚Ì\‘¢,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
i63j¡“c”Žä, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’YŽ_ƒJƒ‹ƒVƒEƒ€‚̉t’†ŠÏŽ@,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
i64j ¼‰ª—˜“Þ, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Žü”g”•Ï’²•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½p-ƒjƒgƒƒAƒjƒŠƒ“-‰t‘ÌŠE–Ê‚ÌŠÏŽ@,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
i65j ™Œ´’m‹I, —шí•à, –Ø‘ºŒšŽŸ˜Y, “c‘ºŒú•v, ‘å¼—m.
ƒOƒ‰ƒtƒ@ƒCƒg-‰t‘ÌŠE–Ê‚ÉWÏ‚µ‚½ƒyƒvƒ`ƒhƒiƒmƒ`ƒ…[ƒu‚Ì\‘¢,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
i66j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒAƒ‹ƒJƒ“ƒ`ƒI[ƒ‹’P•ªŽq–Œã‚̉t‘Ì\‘¢‚̉ðÍ,
‘æ5‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2011, 2011,
i67jRyohei Kokawa, Masashi Yamazaki,
Masahiro Ohta, Kazuyuki Watanabe, Takumi Hiasa, Kenjiro Kimura, Hiroshi
Onishi. FM-AFM study of
n-Alkane-Adsorbed Graphite Immersed in Liquids,
14th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2011), 2011,
i68j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
High-Resolution FM-AFM Imaging of
Calcite Particles in Water,
International Symposium on Surface
Science (ISSS6), 2011,
i69jHirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
High-resolution imaging of CaCO3
particles in liquid by FM-AFM,
Japan-Finland Joint Seminar of
Material Science, 2011,
i70j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi.
Interfacial Liquids Visualized by
Frequency-Modulation AFM,
International Association of Colloid and
Interface Scientists, Conference (IACIS2012), 2012,
i71j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚ée…«’P•ªŽq–Œã‚̉t‘Ì\‘¢‚ÌŒŸ“¢,
“ú–{‰»Šw‰ï‘æ92t‹G”N‰ï, 2012,
i72j
Rina Nishioka, Takumi Hiasa, Hiroshi Onishi, Kenjiro Kimura.
Interfacial Water over p-Nitroaniline
(101) Surface,
15th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2012), 2012,
i73j “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
FM-AFM ‚É‚æ‚édecanol/HOPG ŠE–Ê‚Ì\‘¢‰ðÍ,
‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 2012,
i74j “úóI, –Ø‘ºŒ’ŽŸ˜Y, ‘å¼—m.
e…E‘a…Šî‚ð‹¤‘¶‚³‚¹‚½•\–Êã‚Ì…˜a\‘¢ŠÏŽ@,
‘æ6‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2012, 2012,
i75j
¼‰ª—˜“Þ, “úóI, ‘å¼—m, –Ø‘ºŒšŽŸ˜Y.
ƒjƒgƒƒxƒ“ƒ[ƒ“—U“±‘ÌŒ‹»-…ŠE–Ê‚ÌFM-AFM‚ð—p‚¢‚½\‘¢‰ðÍ,
‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,
i76j
¡“c”Žä, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Žü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒJƒ‹ƒTƒCƒg-…—n‰tŠE–Ê‚Ì\‘¢‰ðÍ,
‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,
i77j “c’†—T—S, –Ø‘ºŒšŽŸ˜Y, Ž}˜a’j, ‘å¼—m.
¸‰Ø«Œ‹»‚ÌŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é‘å‹C’†ŠÏŽ@,
‘æ32‰ñ•\–ʉȊwŠwpu‰‰‰ï, 2012,
i78j Yuki Mima, Noriaki Oyabu, Takeshi
Inao, Noriaki Kimura, Kenjiro Kimura.
Development of Tunneling Magnetoresistance
Microscope with Electro-Magnetic Field Reconstruction,
International Conference of the Asian
Union of Magnetics Societies (ICAUMS2012), 2012,
i79j Takumi Hiasa, Kenjiro Kimura,
Hiroshi Onishi.
FM-AFM Observation on Mercaptohexanol
Monolayer in Aqueous Solution,
The 20th International Colloquim on
Scanning Probe Microscopy, 2012,
i80j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
Water and 2-Propanol Structured on
Calcite (104): An Atomic Force Microscopy Study (invited),
Japan-Korea Joint Symposium on
Frontiers in Molecular Science -From Quantum to Life-, 2013,
i81j
…Œõr‰î, “úóI, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é’¼½ƒAƒ‹ƒR[ƒ‹-ƒ}ƒCƒJŠE–Ê‚ÌŠÏŽ@,
“ú–{Œ°”÷‹¾Šw‰ï‘æ69‰ñŠwpu‰‰‰ï, 2013,
i82j
Hirotake Imada, Kenjiro Kimura, Hiroshi Onishi.
Interfacial Water over CaCO3 probed by
FM-AFM,
33rd International Conference on Solution
Chemistry, 2013,
i83j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
Interfacial Water and 2-Propanol over
CaCO3 probed by FM-AFM,
16th International Conference on
Non-Contact Atomic Force Microscopy (NC-AFM2013), 2013,
i84j Hirotake Imada, Kenjiro Kimura,
Hiroshi Onishi.
Water and 2-Propanol Structured on Calcite (104): Imaging by
Frequency-Modulation AFM,
‘æ64‰ñƒRƒƒCƒh‚¨‚æ‚ÑŠE–ʉ»Šw“¢˜_‰ï“ú‹ƒVƒ“ƒ|ƒWƒEƒ€, 2013,
i85j …Œõr‰î, “úóI, –Ø‘ºŒ’ŽŸ˜Y, ‘å¼—m.
Žü”g”•Ï’²Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒ}ƒCƒJã‚Ì’¼½ƒAƒ‹ƒR[ƒ‹‚̉t‘Ì\‘¢‚̉ðÍ,
‘æ7‰ñ•ªŽq‰ÈŠw“¢˜_‰ï2013, 2013,
i86j
“à“cŒö“T, ŽO“cˆêŽ÷, ¼‰ªC, ˆÉ茒°, –Ø‘ºŒšŽŸ˜Y, ‘å¼—m.
ˆêŽ²‰„LƒAƒCƒ\ƒ^ƒNƒ`ƒbƒNƒ|ƒŠƒvƒƒsƒŒƒ“‚ÌŽü”g”•Ï’²ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éŠÏŽ@,
‘æ63‰ñ‚•ªŽq“¢˜_‰ï, 2014,
(87) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
uƒ‰ƒhƒ“•ÏŠ·‚É‚æ‚鎥‹CƒCƒ[ƒWƒ“ƒO‚Ì‚•ª‰ð”\‰»v,
‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï, 11a-C10-7, ˆ¤•Q, 2012”N9ŒŽ
(88) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
uŽ¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚Ì‚•ª‰ð”\‰»‚ÉŠÖ‚·‚錤‹†v,
_ŒË‘åŠw—Šw•”ƒz[ƒ€ƒJƒ~ƒ“ƒOƒfƒC‘æ3‰ñƒTƒCƒGƒ“ƒXƒtƒƒ“ƒeƒBƒAŒ¤‹†”•\‰ï, _ŒË, 2012”N10ŒŽ
(89) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
u“dŽ¥êÄ\¬ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ð—p‚¢‚½“d’r“à•”‚Ì“d—¬–§“x•ª•zŒv‘ªv,
‘æ53‰ñ“d’r“¢˜_‰ï, 3A16, •Ÿ‰ª, 2012”N11ŒŽ
(90) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
u“dŽ¥êÄ\¬-Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ð—p‚¢‚½“d‰×ˆÚ“®‚̉Ž‹‰»v,
_ŒË‘åŠwŒ¤‹†Šî”ÕƒZƒ“ƒ^[ŽáŽèƒtƒƒ“ƒeƒBƒAŒ¤‹†‰ï 2012, P063, _ŒË, 2012”N12ŒŽ
(91) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
u“dŽ¥êÄ\¬ƒgƒ“ƒlƒ‹Ž¥‹C’ïRŒø‰ÊŒ°”÷‹¾‚ÌŠJ”‚Æ“d’r“à•”‚É‚¨‚¯‚é“d‰×ˆÚ“®‰ÂŽ‹‰»‚ւ̉ž—pv,‘æ54‰ñ“d’r“¢˜_EE 3F17, ‘åã, 2013”N10ŒŽ
”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y, ‘æ54 ‰ñ“d’r“¢˜_‰ï u‰‰—vŽ|W p.423 (2013)
(92) Y. Mima, N. Oyabu, K. Inao, N.
Kimura, and K. Kenjiro:
gDevelopment of
tunnelingmagnetoresistance microscope with electromagnetic field
reconstructionh
International Conference of the Asian Union
of Magnetics Societies 2012, 2pPS-114, Japan, Oct. 2012.
(93) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
u“d’r“à•”‚Ì“d—¬•ª•z‚̉f‘œ‰» - ‚•ª‰ð”\Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ” -v,
FC EXPO 2013 `‘æ9‰ñ [‘Û] …‘fE”R—¿“d’r“W`, “Œ‹ž, 2013”N2ŒŽ
(94) ”ü”n—E‹P, ‘ååM”ͺ, ˆî’jŒ’, –Ø‘ºŒ›–¾, –Ø‘ºŒšŽŸ˜Y
u“d—¬Œo˜H‚Ì”ñ”j‰ó‰f‘œ‰»‘•’u‚ÌŽÀ—p‰»]“dŽq•”•i, ƒvƒŠƒ“ƒgŠî”Â, “d’r‚Ì•s—ljð͂ւ̉ž—p]v
JPCA2013]‘æ43‰ñ‘Û“dŽq‰ñ˜HŽY‹Æ“W],“Œ‹ž,2013”N6ŒŽ
(95) Yuki Mima, Noriaki Oyabu,
Takeshi Inao, Noriaki Kimura, Kenjiro Kimura:
Failure analysis of electric circuit
board@by high resolution magnetic field
microscopy
IEEE CPMT Symposium Japan (Formerly VLSI
Packaging Workshop of Japan)2013,Session19:Reliability2,Japan,Nov.2013.
(96) ”ü”n —E‹P,–ì–{ ˜a½,‘ååM ”ÍÐ,–Ø‘º Œ›–¾,–Ø‘º ŒšŽŸ˜Y
gƒŠƒAƒ‹ƒ^ƒCƒ€Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚ÌŠJ”‚Æ’~“d’r“à“d—¬‚Ì‚‘¬‰f‘œ‰»‚ւ̉ž—ph “d‹C‰»Šw‰ï‘æ82‰ñ‘å‰ï@‰¡•lŒö—§‘åŠw@2015”N3ŒŽ15“ú`17“ú
(97) –ì–{ ˜a½,”ü”n —E‹P,‘ååM ”ͺ,–Ø‘º Œ›–¾,–Ø‘º ŒšŽŸ˜Y
g“dŽ¥êÄ\¬-Ž¥‹CƒCƒ[ƒWƒ“ƒO‘•’u‚É‚æ‚鑽‘w’~“d’r“à•”‚Ì”ñ”j‰ó“d—¬Œo˜H‰f‘œ‰»h “d‹C‰»Šw‰ï‘æ82‰ñ‘å‰ï@‰¡•lŒö—§‘åŠw@2015”N3ŒŽ15“ú`17“ú
(98) •Ð‰ªŠ°KC‘“c—T‹PC–Ø‘ºŒšŽŸ˜YC’ƒ’JŠG—
gŽü”g”ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚é—n‰t’†ƒAƒ~ƒƒCƒhüˆÛ‚Ì\‘¢‰ðÍh_ŒË‘åŠwæ’[—Z‡‰ÈŠwƒVƒ“ƒ|ƒWƒEƒ€w¶‘Ì•ªŽq‚̃_ƒCƒiƒ~ƒNƒX‚ð’‚ß‚éx_ŒË‘åŠw@2015”N1ŒŽ19“ú`20“ú
(99) ‚”öM‘¾˜Y, –Ø‘ºŒšŽŸ˜Y, ŽO–Ø–œ—RŽq, L—˜_ˆê, ‹´–{’m‹v, ²‹vŠÔiŽq, –Ø‘ºŒ›–¾
gƒŠƒAƒ‹ƒ^ƒCƒ€ƒ}ƒCƒNƒ”gƒ}ƒ“ƒ‚ƒOƒ‰ƒtƒB‚ÌŠJ”‚Æ“ûŠà‘gD3ŽŸŒ³‰f‘œ‰»‚ÌŒ¤‹†h‘æ23‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï “Œ‹ž‘ÛƒtƒH[ƒ‰ƒ€ 2015”N7ŒŽ2“ú`4“ú@´˜^, DP-1-46-05 (2015)
p.375.
i100j–Ø‘ºŒšŽŸ˜YA–ì–{˜a½A”ü”n—E‹PA–Ø‘ºŒ›–¾
g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚É‚æ‚é’~“d’r‚Ì”ñ”j‰óŒŸ¸h
2015ƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ‡[i‘æ29‰ñÅæ’[ŽÀ‘•‹ZpEƒpƒbƒP[ƒWƒ“ƒO“WjƒAƒJƒfƒ~ƒbƒNƒvƒ‰ƒU@i“Œ‹žƒrƒbƒOƒTƒCƒgj2015”N‚UŒŽ‚R“ú`‚T“ú
i101j”ü”n—E‹PE–Ø‘ºŒ›–¾E–Ø‘ºŒšŽŸ˜Y
g“dŽq‚âƒCƒIƒ“‚Ì—¬‚ê‚ð‰ÂŽ‹‰»‚·‚é‘•’u‚ÌŠJ”h
“ú–{‰»Šw‰ïH‹GŽ–‹Æ@‘æ‚T‰ñCSJ‰»ŠwƒtƒFƒXƒ^2015@“Œ‹žiƒ^ƒ[ƒz[ƒ‹M–xj‚Q‚O‚P‚T”N‚P‚OŒŽ‚P‚R“ú`‚P‚T“ú
i102j[85] ›”ü”n —E‹P, –ì–{ ˜a½,–Ø‘º Œ›–¾, –Ø‘º ŒšŽŸ˜Y@i\žŽž”•\ŽÒ‚Í”ü”nŒN‚ÅŽÀÛ”•\‚µ‚½‚Ì‚Í–Ø‘ºæ¶‚Å‚·B–{l“o’d‚Ì[85]‚É‹LÚj
g‚•ª‰ð”\“d—¬Œo˜H‰f‘œ‰»ƒVƒXƒeƒ€‚ÌŒž‰ñŒ^’~“d’r‚ւ̉ž—ph
‘æ56‰ñ“d’r“¢˜_‰ï@3E25iˆ¤’mŒ§ŽY‹Æ˜J“ƒZƒ“ƒ^[@ƒEƒCƒ“ƒN‚ ‚¢‚¿j2015”N11ŒŽ13“ú
i103j›•Ð‰ª@Š°KC–Ø‘º@ŒšŽŸ˜YC’ƒ’J@ŠG—C‘“c@—T‹PCŽR‰º@˜al
gŽü”g”•Ï’²ŒŸo•ûŽ®Œ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ƒAƒ~ƒƒCƒhüˆÛ‚̉t’†‚•ª‰ð”\ŠÏŽ@h
“ú–{‰»Šw‰ï ‘æ96t‹G”N‰ï (2016)@1B3-49
i“¯ŽuŽÐ‘åŠwj2016”N3ŒŽ24“ú`27“ú
i104j›‰Í–ì ½”VC“c’† —DŽqCŽR‰º —SŽiC–Ø‘º Œ’ŽŸ˜YC–Ø‘º Œ›–¾C‚”ö M‘¾˜Y
gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ð—p‚¢‚Ä“¾‚ç‚ꂽ‰æ‘œ‚Æ‹@Ší‚̈À‘S«‚ÉŠÖ‚·‚錟“¢h
‘æ25‰ñ“ú–{“ûŠà‰æ‘œŒ¤‹†‰ïi–¼ŒÃ‰®‘Û‰ï‹cêj2016”N2ŒŽ20“ú`2ŒŽ21“ú@
i105j›–ì–{ ˜a½,@¼“c ¹Ž÷,@ˆîŠ_ –¾—¢,@”ü”n —E‹P,@–Ø‘º Œ›–¾,@–Ø‘º ŒšŽŸ˜Y
gƒTƒuƒT[ƒtƒFƒXŽ¥‹CƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚É‚æ‚鑽‘w’~“d’r“à‚Ì”ñ”j‰ó“d—¬–§“x•ª•zŒv‘ª‚ÉŠÖ‚·‚錤‹†h
‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï21a-S322-11i“Œ‹žH‹Æ‘åŠw@‘剪ŽRƒLƒƒƒ“ƒpƒXj2016”N3ŒŽ19“ú`3ŒŽ22“ú
i106j›•Ð‰ªŠ°KA–Ø‘ºŒšŽŸ˜YA’ƒ’JŠG—A‘“c—T‹PAŽR‰º˜al
gFM-AFM‚ð—p‚¢‚½ƒAƒ~ƒƒCƒhüˆÛ‚̉t’†\‘¢‰ðÍh
’`”’Œ¤ƒZƒ~ƒi[u\‘¢‚ðŠî”Õ‚Æ‚·‚é’`”’Ž¿‰ÈŠw‚É‚¨‚¯‚é–¢‰ðŒˆ–â‘èv
2016”N3ŒŽ1“ú`3ŒŽ2“úi“Œ‹ž‘åŠw@æ’[‰ÈŠw‹ZpŒ¤‹†ƒZƒ“ƒ^[j
http://www.protein.rcast.u-tokyo.ac.jp/tanpakuken2016/program.html
i107j›‰Í–ì½”V, ŽR‰º—SŽi, “c’†—DŽq, “c‘º¹ˆ», –Ø‘ºŒšŽŸ˜Y, –Ø‘ºŒ›–¾, ŽO–Ø–œ—RŽq, ‚”öM‘¾˜Y,
gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒCƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚ð—p‚¢‚Ä“¾‚ç‚ꂽ‰æ‘œ‚Æ’´‰¹”gƒGƒR[‰æ‘œ‚Ì”äŠrŒŸ“¢h
‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï@i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú
‰‰‘è”Ô†:DP-2-47-4@ƒZƒbƒVƒ‡ƒ“–¼F ƒ|ƒXƒ^[“¢‹c47@“úŽžF 2016”N6ŒŽ17“úi‹àj
i108j›“c’†—DŽqC–Ø‘ºŒšŽŸ˜YC“c‘º¹ˆ», ŽR‰º—SŽiC‰Í–ì½”VC‚”öM‘¾˜YCŽO–Ø–œ—RŽqC–Ø‘ºŒ›–¾
gƒ}ƒCƒNƒ”gŽU—ê’f‘wƒ[ƒWƒ“ƒOƒVƒXƒeƒ€‚É‚æ‚é“û‘B—Ç«•a•Ï‚ÌŒŸ“¢h
@‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï@i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú
‰‰‘è”Ô†: GP-2-17-27 ƒZƒbƒVƒ‡ƒ“–¼F ƒ|ƒXƒ^[ŒfŽ¦17@‰æ‘œf’f2
“úŽžF 2016”N6ŒŽ17“úi‹àj@19:30-20:00
i109j›‚”öM‘¾˜YC¼”ö—eŽq, ŽO–Ø–œ—RŽq, “cªD, L—˜_ˆêC–Ø‘ºŒšŽŸ˜YC“c‘º¹ˆ»,@²‹vŠÔ˜æŽqC‹´–{’m‹vC“c’†—DŽqC‰Í–ì½”VCŽR‰º—SŽiC–Ø‘ºŒ›–¾C
gƒ}ƒCƒNƒ”gƒ}ƒ“ƒ‚ƒOƒ‰ƒtƒBŠJ”—Õ°ŽŽŒ±\‘æ“ñ•ñ\h
‘æ24‰ñ“ú–{“ûŠàŠw‰ïŠwp‘‰ï@i“Œ‹žƒrƒbƒOƒTƒCƒgj2016”N6ŒŽ16“ú`18“ú
‰‰‘è”Ô†: DP-2-47-3
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‰‰‘è”Ô†: GP-2-17-30@@ƒZƒbƒVƒ‡ƒ“–¼Fƒ|ƒXƒ^[ŒfŽ¦17@‰æ‘œf’f2@2016”N6ŒŽ17“úi‹àj
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